Use of variable XIC widths of TOF-MSMS data for the determination of background interference in SRM assays

Patent metadata

Field	Value
Publication number	US-9583323-B2
Application number	US-201214123185-A
Country	US
Kind code	B2
Filing date	May 30, 2012
Priority date	Jun 3, 2011
Publication date	Feb 28, 2017
Grant date	Feb 28, 2017

Abstract

Systems and methods identify a product ion that does not include an interference. A full product ion spectrum for a mass range of an analyte in a sample is received from a tandem mass spectrometer. A first set of one or more peak parameters is calculated for a product ion in the full product ion spectrum using a first XIC window width. A second set of one or more peak parameters is calculated for the product ion using a second XIC window width. The product ion is identified as not including an interference, if the first set of one or more peak parameters and the second set of one or more peak parameters are substantially the same. The product ion is further confirmed or determined to be from the analyte and not from a matrix of the sample by correlating the product to a precursor ion of the analyte.

First claim

What is claimed is:

1. A system for identifying a product ion that does not include an interference, comprising:
a separation device that separates a first sample that includes an analyte over time;
a tandem mass spectrometer that performs a single precursor ion scan of a mass range of the first sample using two or more precursor ion isolation windows with variable widths and performs fragmentation scans of the two or more precursor ion isolation windows with variable widths each time the first sample is separated producing a full product ion spectrum of each of the two or more precursor ion isolation windows, wherein the tandem mass spectrometer includes a quadrupole mass filter that allows selection of the two or more precursor ion isolation windows with variable widths and wherein the quadrupole mass filter selects the two or more precursor ion isolation windows with variable widths to investigate matrix effects of the first sample and to allow the selection of suitable ions for quantification within a suitable time frame; and
a processor in communication with the tandem mass spectrometer that
independently controls both the radio frequency (RF) and direct current (DC) voltages applied to the quadrupole mass filter to allow the selection of the two or more precursor ion isolation windows with variable widths each time the first sample is separated;
receives a full product ion spectrum for each of the two or more precursor ion isolation windows each time the first sample is separated from the tandem mass spectrometer,
calculates a first set of one or more peak parameters for a product ion in the full product ion spectra of a precursor ion isolation window of the two or more precursor ion isolation windows using a first extracted ion chromatogram window width,
calculates a second set of one or more peak parameters for the product ion in the full product ion spectra of the precursor ion isolation window of the two or more precursor ion isolation windows using a second extracted ion chromatogram window width, and
identifies the product ion as not including an interference, if the first set of one or more peak parameters and the second set of one or more peak parameters are substantially the same.

2. The system of claim 1 , wherein the first sample includes a first matrix in addition to the analyte and the processor
correlates the product ion to a precursor ion of the analyte in the first sample, and
identifies the precursor ion and the product ion as being unique from the first matrix, if the first set of one or more peak parameters and the second set of one or more peak parameters are substantially the same, and if the product ion is from the analyte and not from the first matrix.

3. The system of claim 2 , wherein the product ion is a known product ion of the analyte, the first set of one or more peak parameters and the second set of one or more peak parameters are calculated to determine if the first matrix is interfering with the product ion, and the product ion is correlated with the precursor ion of the analyte to confirm that the product ion is from the analyte and not from the first matrix.

4. The system of claim 2 , wherein the product ion is an unknown product ion, the product ion is correlated with the precursor ion of the analyte to determine that the product ion is from the analyte and not the first matrix, and the first set of one or more peak parameters and the second set of one or more peak parameters are calculated to determine if the first matrix is interfering with the product ion.

5. The system of claim 2 , wherein
the separation device separates a second sample that includes the analyte and a second matrix over time,
the tandem mass spectrometer performs a single precursor scan of a mass range of the second sample using two or more precursor ion isolation windows with variable widths and performs fragmentation scans of the two or more precursor ion isolation windows with variable widths each time the second sample is separated producing a full product ion spectrum of each of the two or more precursor ion isolation windows,
and the processor
independently controls both the radio frequency (RF) and direct current (DC) voltages applied to the quadrupole mass filter to allow the selection of the two or more precursor ion isolation windows with variable widths each time the second sample is separated,
receives a full product ion spectrum for each of the two or more precursor ion isolation windows each time the second sample is separated from the tandem mass spectrometer,
calculates a third set of one or more peak parameters for the product ion in the full product ion spectra of a precursor ion isolation window of the two or more precursor ion isolation windows using the first extracted ion chromatogram window width,
calculates a fourth set of one or more peak parameters for the product ion in the full product ion spectra of the precursor ion isolation window of the two or more precursor ion isolation windows using the second extracted ion chromatogram window width,
correlates the product ion to a precursor ion of the analyte in the second sample, and
identifies the precursor ion and the product ion as being unique from the first matrix and the second matrix, if the third set of one or more peak parameters and the fourth set of one or more peak parameters are substantially the same, and if the product ion is from the analyte not the second matrix.

6. The system of claim 1 , wherein the first extracted ion chromatogram window width is narrower than the second extracted ion chromatogram window width.

7. The system of claim 1 , wherein the processor creates a selected reaction monitoring assay that includes the product ion and the precursor ion.

8. A method for identifying a product ion that does not include an interference, comprising:
separating a first sample that includes an analyte over time using a separation device;
performing a single precursor ion scan of a mass range of the first sample using two or more precursor ion isolation windows with variable widths and performing fragmentation scans of the two or more precursor ion isolation windows with variable widths each time the first sample is separated producing a full product ion spectrum of each of the two or more precursor ion isolation windows using a tandem mass spectrometer, wherein the tandem mass spectrometer includes a quadrupole mass filter that allows selection of the two or more precursor ion isolation windows with variable widths and wherein the quadrupole mass filter selects the two or more precursor ion isolation windows with variable widths to investigate matrix effects of the first sample and to allow the selection of suitable ions for quantification within a suitable time frame;
independently controlling both the radio frequency (RF) and direct current (DC) voltages applied to the quadrupole mass filter to allow the selection of the two or more precursor ion isolation windows with variable widths each time the first sample is separated using a processor;
receiving a full product ion spectrum for each of the two or more precursor ion isolation windows each time the first sample is separated from a tandem mass spectrometer using the processor;
calculating a first set of one or more peak parameters for a product ion in the full product ion spectra of a precursor ion isolation window of the two or more precursor ion isolation windows using a first extracted ion chromatogram window width using the processor;
calculating a second set of one or more peak parameters for the product ion in the full product ion spectra of the precursor ion isolation window of the two or more precursor ion isolation windows using a second extracted ion chromatogram window width u

Assignees

• Tate Stephen A
• Cox David M
• Dh Technologies Dev Pte Ltd

Inventors

• Tate Stephen A
• Cox David M

Classifications

• H01J49/0031 Primary

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• G16C20/20

  Identification of molecular entities, parts thereof or of chemical compositions · CPC title

• H01J49/02 Primary

  Details · CPC title

• G06F19/703

  Physics · mapped topic