Imaging structure emitter calibration

Patent metadata

Field	Value
Publication number	US-9578318-B2
Application number	US-201213420388-A
Country	US
Kind code	B2
Filing date	Mar 14, 2012
Priority date	Mar 14, 2012
Publication date	Feb 21, 2017
Grant date	Feb 21, 2017

Abstract

In embodiments of imaging structure emitter calibration, an imaging unit includes an emitter structure that direct emits light, and optics direct the light along a light path in the imaging unit to illuminate a projection surface. A reflective panel reflects a portion of the light to illuminate a light sensor. An imaging application receives the sensor data from the light sensor, where the sensor data corresponds to emitted light output from the emitter structure. The imaging application can then initiate a calibration input to the emitter structure to adjust the emitted light output from the emitter structure.

First claim

The invention claimed is:

1. An imaging unit, comprising:
an emitter structure configured to direct emit light;
optics configured to direct the light along a light path in the imaging unit;
a projection surface that the optics direct the light along the light path to illuminate, the projection surface being an electrically alterable mirror configured to scan in at least one dimension to reflect the light through an imaging optic that directs the light into a display optic;
a reflective panel configured to reflect a portion of the light directed by the projection surface to illuminate a light sensor, the reflective panel positioned proximal to the imaging optic allowing the portion of the light to be reflected at a beginning position or an end position of the scan in the at least one direction of the projection surface; and
an imaging application configured to receive sensor data from the light sensor, the sensor data corresponding to emitted light output from the emitter structure, and the imaging application further configured to initiate a calibration input to the emitter structure to adjust the emitted light output from the emitter structure.

2. An imaging unit as recited in claim 1 , wherein the emitter structure comprises individual embedded light sources configured to direct emit the light, and wherein the calibration input adjusts the emitted light output from an individual embedded light source of the emitter structure.

3. An imaging unit as recited in claim 2 , wherein the imaging application is configured to compute a correction value for each of the individual embedded light sources of the emitter structure over a time duration.

4. An imaging unit as recited in claim 2 , wherein the individual embedded light sources are configured to cycle to direct emit the light one at a time, and wherein the imaging application is configured to initiate the calibration input for each individual embedded light source.

5. An imaging unit as recited in claim 1 , wherein the calibration input to the emitter structure corrects for operational conditions that affect the emitted light output from the emitter structure.

6. An imaging unit as recited in claim 1 , wherein the light sensor is positioned proximate the projection surface in the imaging unit.

7. An imaging unit as recited in claim 1 , wherein the light sensor comprises a linear array of light detectors, and wherein the imaging application is configured to receive the sensor data from the linear array of light detectors.

8. An imaging structure as recited in claim 1 , wherein the emitter structure comprises a one-dimensional or two-dimensional array of individual embedded light sources formed in inorganic material as one of lasers or LEDs to direct emit the light.

9. A method, comprising:
emitting light from an emitter structure in an imaging unit;
directing the light along a light path with optics to illuminate a projection surface in the imaging unit, the projection surface being an electrically alterable mirror configured to scan in at least one dimension to reflect the light through an imaging optic that directs the light into a display optic;
reflecting a portion of the light directed by the projection surface to illuminate a light sensor using a reflective panel positioned proximal to the imaging optic allowing the portion of the light to be reflected at a beginning position or an end position of the scan in the at least one direction of the projection surface;
receiving sensor data from the light sensor, the sensor data corresponding to emitted light output from the emitter structure; and
initiating a calibration input to the emitter structure to adjust the emitted light output from the emitter structure.

10. A method as recited in claim 9 , further comprising adjusting the emitted light output of each individual embedded light source of the emitter structure.

11. A method as recited in claim 10 , further comprising computing a correction value for each of the individual embedded light sources of the emitter structure over a time duration.

12. A method as recited in claim 10 , wherein the individual embedded light sources of the emitter structure cycle to direct emit the light one at a time, and wherein the calibration input is said initiated for each individual embedded light source.

13. A method as recited in claim 9 , wherein the calibration input corrects for operational conditions that affect the emitted light output from the emitter structure.

14. A method as recited in claim 9 , wherein the light sensor comprises a linear array of light detectors, and wherein the sensor data is said received from the linear array of light detectors.

15. A method, comprising:
generating an augmented reality image with imaging units, each of the imaging units comprising:
optics directing light along a light path to illuminate a projection surface that is an electrically alterable mirror configured to scan in at least one dimension to reflect the light through an imaging optic that directs the light into a display optic;
a reflective panel reflecting a portion of the light directed by the projection surface to illuminate a light sensor that generates sensor data corresponding to emitted light output from an emitter structure, the reflective panel positioned proximal to the imaging optic allowing the portion of the light to be reflected at a beginning position or an end position of the scan in the at least one direction of the projection surface; and

calibrating the emitter structure to adjust the emitted light output from the emitter structure.

16. A method as recited in claim 15 , wherein the light sensor comprises a linear array of light detectors.

17. A method as recited in claim 15 , further comprising:
receiving the sensor data from each light sensor of the respective imaging units; and
generating a calibration input to the emitter structure in each of the respective imaging units to adjust the emitted light output from the emitter structures.

18. A method as recited in claim 17 , wherein the calibration input to the emitter structure corrects for operational conditions that affect the emitted light output from the emitter structure.

19. A method as recited in claim 17 , wherein the emitter structure comprises individual embedded light sources configured to direct emit the light, and wherein the calibration input adjusts the emitted light output from an individual embedded light source of the emitter structure.

20. A method as recited in claim 19 , further comprising:
computing a correction value for each of the individual embedded light sources of the emitter structure over a time duration.

Assignees

• Fleck Rod G
• Bohn David D
• Microsoft Technology Licensing Llc

Inventors

• Fleck Rod G
• Bohn David D

Classifications

• G02B27/0093

  with means for monitoring data relating to the user, e.g. head-tracking, eye-tracking · CPC title

• G02B2027/0178

  Eyeglass type (eyeglass details G02C) · CPC title

• H04N13/044

  Electricity · mapped topic

• H04N13/0484 Primary

  Electricity · mapped topic

• H04N13/383 Primary

  for tracking with gaze detection, i.e. detecting the lines of sight of the viewer's eyes · CPC title