Orthogonal acceleration system for time-of-flight mass spectrometer

Patent metadata

Field	Value
Publication number	US-9576782-B2
Application number	US-201514928793-A
Country	US
Kind code	B2
Filing date	Oct 30, 2015
Priority date	Mar 14, 2013
Publication date	Feb 21, 2017
Grant date	Feb 21, 2017

Abstract

An orthogonal pulse accelerator for a Time-of-Flight mass analyzer includes an electrically-conductive first plate extending in a first plane, and a second plate spaced from the first plate. The second plate includes a grid that defines a plurality of apertures each having a first dimension extending in a first direction and a second dimension orthogonal to the first dimension, the first and second dimensions lying in the second plane and the second dimension begin larger than the first dimension. The first and second plates are positioned in the Time-of-Flight mass analyzer to receive, during operation of the mass analyzer, an ion beam propagating in the first direction in a region between the first and second plates, and the orthogonal pulse accelerator directs ions in the ion beam through the apertures.

First claim

What is claimed is:

1. An orthogonal pulse accelerator for a Time-of-Flight mass analyzer, comprising:
an electrically-conductive first plate extending in a first plane;
a second plate spaced from the first plate, the second plate extending in a second plane parallel to the first plane, the second plate comprising a grid that defines a plurality of apertures each having a first dimension extending in a first direction and a second dimension orthogonal to the first dimension, the first and second dimensions lying in the second plane and the second dimension being larger than the first dimension;
an electrically-conductive third plate spaced from the second plate, the third plate comprising a second grid defining a second plurality of apertures;
an electrically-conductive fourth plate spaced from the third plate, the fourth plate comprising a third grid defining a third plurality of apertures; and
a voltage source configured to apply a constant voltage to the fourth plate during operation of the mass analyzer,
wherein the first and second plates are positioned in the Time-of-Flight mass analyzer to receive, during operation of the mass analyzer, an ion beam propagating in the first direction in a region between the first and second plates while a first electric field between the first and second plates is essentially zero, and the orthogonal pulse accelerator directs ions in the ion beam through the plurality of apertures of the second plate when a second electric field is applied between the first and second plates, where ions passing through the plurality of apertures of the second plate are directed through the second plurality of apertures of the third plate and through the third plurality of apertures of the fourth plate.

2. The orthogonal pulse accelerator of claim 1 , wherein at least some of the plurality of apertures are rectangular apertures, the first dimension corresponds to a width of each rectangle and the second dimension corresponds to a length of the rectangle.

3. The orthogonal pulse accelerator of claim 1 , wherein the first dimension is between 0.05 mm-0.5 mm.

4. The orthogonal pulse accelerator of claim 3 , wherein the second dimension is between 0.3 mm to 2.0 mm.

5. The orthogonal pulse accelerator of claim 1 , wherein a grid density along the first direction is greater than in a direction orthogonal to the first direction.

6. The orthogonal pulse accelerator of claim 1 , wherein the grid comprises electrically-conductive wires.

7. The orthogonal pulse accelerator of claim 1 , wherein the third plate extends in a third plane downstream of the second plate and parallel to the second plane, the second plurality of apertures each having a third dimension extending in the first direction and a fourth dimension orthogonal to the third dimension, the third and fourth dimensions lying in the third plane, the third dimension being larger than the fourth dimension.

8. The orthogonal pulse accelerator of claim 1 , wherein during operation of the mass analyzer, while the second electric field is applied between the first and second plates, an electric field strength in the region between the first and the second plates is essentially identical to an electric field strength in the region between the second and third plates.

9. The orthogonal pulse accelerator of claim 1 , wherein the fourth plate comprises an entrance grid of a flight tube.

10. The orthogonal pulse accelerator of claim 1 , wherein additional electrically-conductive elements are positioned between the third and fourth plates, and voltages applied to the additional electrically-conductive elements, and the voltage applied to the fourth plate, are kept constant.

11. A method, comprising:
directing an ion beam in a first direction within a first region between a first electrically-conductive plate extending in a first plane and a second plate extending in a second plane parallel to the first plane, the second plate comprising a grid that defines a plurality of apertures each having a first dimension extending in the first direction and a second dimension orthogonal to the first dimension, the first and second dimensions lying in the second plane and the second dimension being larger than the first dimension;
while receiving the ion beam propagating in the first direction in the first region between the first and second plates:
(i) applying voltages to the first and second plates to provide a first electric field between the first and second plates;
(ii) applying a first voltage to a third plate positioned in a third plane spaced apart from and parallel to the second plane on an opposite side of the second plane from the first plane; and
(iii) applying a second voltage to a fourth plate positioned in a fourth plane spaced apart from and parallel to the third plane on an opposite side of the third plane from the second plane, the first and second voltages establishing a second electric field between the third and fourth plates;

adjusting the first voltage to minimize field penetration from the second electric field into the first region, such that the first electric field is essentially zero;
applying a third voltage on the first electrically-conductive plate to produce a third electric field between the first and second plates to accelerate at least a portion of ions in the ion beam in the first region through the apertures of the second plate such that a strength of the second electric field in a region between the first and second plates is essentially identical to an electric field strength in a region on the opposite side of the second plate, away from the first plate, while applying a fourth voltage on the third plate essentially simultaneous with the application of the third voltage on the first plate, such that a strength of the third electric field in the first region between the first and second plates is essentially identical to an electric field strength in a region on the opposite side of the second plate, away from the first plate, and
directing the ions which have passed through the apertures of the second plate through apertures of the third plate, and then through apertures of the fourth plate, while maintaining a fourth electric field between the third plate and the fourth plate.

12. The method of claim 11 , further comprising obstructing at least some ions incident on the apertures at a grazing incidence angle with respect to the second plane before the third voltage is applied.

13. The method of claim 11 , wherein a separation distance between the second and third plates is essentially equal to a separation distance between the first and second plates along a direction orthogonal to the first direction.

14. The method of claim 11 , wherein the second plate is arranged to cause a reduction in transmission of ions in the ion beam incident on the apertures at a grazing incidence angle with respect to the second plane while the first electric field between the first and second plates is essentially zero.

15. The method of claim 11 , wherein the third plate extends in a third plane parallel to the second plane, the second plurality of apertures each having a third dimension extending in the first direction and a fourth dimension orthogonal to the third dimension, the third and fourth dimensions lying in the third plane, the third dimension being larger than the fourth dimension, wherein the ions in the ion beam pass through the second plurality of apertures.

16. The method of claim 11 , further comprising reducing artifact signals from registering at a detector.

17. The method of claim 11 , f

Assignees

• Perkinelmer Health Sci Inc

Inventors

• Welkie David G

Classifications

• H05H5/047

  Pulsed generators · CPC title

• H01J49/403

  characterised by the acceleration optics and/or the extraction fields · CPC title

• H01J49/401 Primary

  characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode · CPC title

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H05H5/02

  Details (targets for producing nuclear reactions H05H6/00) · CPC title