Method of dynamically changing stitch density for optimal quilter throughput

US9574292B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9574292-B2
Application numberUS-201514665425-A
CountryUS
Kind codeB2
Filing dateMar 23, 2015
Priority dateMar 24, 2014
Publication dateFeb 21, 2017
Grant dateFeb 21, 2017

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  1. Title

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A method of dynamically changing stitch density of a quilting pattern during sewing is provided. Embodiments of the invention include dynamically changing stitch density along an axis of a sewing pattern based on identifying sewing pattern elements, which may include line segments and arc segments. Each of the line segments and/or arc segments is assigned a dynamically adjusted stitch density based on analysis of each pattern element and/or adjacent element. An adjusted stitch density is assigned to portions of pattern elements that satisfy a threshold measurement for sewing with an adjusted stitch density. In embodiments, a standard stitch density, intermediate stitch density, or an altered stitch density is automatically assigned to each portion of a sewing pattern based on an analysis of threshold length of an element, a threshold angle of a portion of the element with respect to the axis, and/or the stitch density assigned to an adjacent element.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for dynamically changing stitch density along an axis of a sewing pattern, the method comprising: determining a plurality of elements of a sewing pattern, the plurality of elements comprising at least one of one or more line segments and one or more arc segments; analyzing each of the one or more line segments and one or more arc segments, wherein analyzing includes determining whether each of the one or more line segments and one or more arc segments satisfies a threshold length and a threshold angle with respect to an axis; and dynamically adjusting a stitch density corresponding to at least one of the plurality of elements, wherein dynamically adjusting the stitch density comprises assigning an adjusted stitch density to at least one of the plurality of elements that satisfies the threshold length and the threshold angle based on the analysis of each of the one or more line segments and one or more arc segments. 2. The method of claim 1 , wherein analyzing each of the one or more line segments comprises: determining whether at least a portion of each of the one or more line segments satisfies 1) a threshold length between a line segment start point and a line segment stop point of each portion of each of the one or more line segments, and 2) a threshold angle with respect to the axis; and assigning an adjusted stitch density to each portion of each of the one or more line segments that satisfies the threshold length and the threshold angle. 3. The method of claim 1 , wherein analyzing each of the one or more line segments comprises assigning a standard stitch density to each portion of each of the one or more line segments that does not satisfy one or more of a threshold length between a line segment start point and a line segment stop point, and a threshold angle with respect to the axis. 4. The method of claim 1 , wherein the axis is a feed axis or a carriage axis. 5. The method of claim 1 , wherein the analysis of each of the one or more arc segments comprises: interpolating each of the one or more arc segments to provide a plurality of increments for each arc segment; and analyzing a first portion of a first arc segment of the one or more arc segments, wherein the first portion comprises a first increment and a second increment of the plurality of increments, wherein the first increment is adjacent the second increment, and further wherein the analysis of the first portion comprises: analyzing the first increment having a first increment start point and a first increment stop point, wherein analyzing the first increment comprises determining that the first increment satisfies a threshold angle with respect to the axis; analyzing the second increment having a second increment start point and a second increment stop point, wherein analyzing the second increment comprises determining that the second increment satisfies the threshold angle with respect to the axis; and upon determining that both the first increment and the second increment satisfy the threshold angle with respect to the axis, determining that the total length of the first increment and the second increment satisfy a threshold length and assigning an adjusted stitch density to the first portion. 6. The method of claim 5 , wherein the analysis of each of the one or more arc segments further comprises: analyzing a second portion of the first arc segment of the one or more arc segments, wherein the second portion comprises a third increment and a fourth increment of the plurality of increments, wherein the third increment is adjacent the fourth increment, and further wherein the analysis of the second portion comprises: analyzing the third increment having a third increment start point and a third increment stop point, wherein analyzing the third increment comprises determining that the third increment satisfies a threshold angle with respect to the axis; analyzing the fourth increment having a fourth increment start point and a fourth increment stop point, wherein analyzing the fourth increment comprises determining whether the fourth increment satisfies the threshold angle with respect to the axis; and upon determining that the fourth increment does not satisfy the threshold angle with respect to the axis, assigning a standard stitch density to the second portion. 7. The method of claim 1 further comprising: identifying a stitch density of two or more adjacent elements; and assigning an intermediate stitch density to at least a portion of the sewing pattern. 8. A method for automatically adjusting stitch density between elements of a sewing pattern for sewing along an axis, the method comprising: receiving a pattern having a plurality of pattern elements, wherein each of the plurality of pattern elements comprises one or more portions, and wherein the plurality of pattern elements comprises one or more arc segments, each of the one or more arc segments comprising one or more increments; analyzing each of the one or more portions of the plurality of pattern elements to determine whether each of the plurality of pattern elements satisfies a threshold for assigning an altered stitch density to at least one portion of the plurality of pattern elements, wherein analyzing includes: determining whether each increment of each of the one or more arc segments satisfies a threshold angle with respect to an axis; and determining whether each increment of each of the one or more arc segments that satisfies the threshold angle with respect to the axis further satisfies a threshold length; and assigning at least one of a standard stitch density, an altered stitch density, and an intermediate stitch density to each of the one or more portions of the plurality of pattern elements. 9. The method of claim 8 , wherein the plurality of pattern elements comprises one or more line segments. 10. The method of claim 9 , wherein analyzing each of the plurality of pattern elements comprises: determining whether a portion of each of the one or more line segments satisfies a threshold length; and determining whether each portion of each of the one or more line segments that satisfies the threshold length satisfies a threshold angle with respect to the axis. 11. The method of claim 9 , wherein each portion of the one or more line segments comprises a line segment start point and a line segment stop point, wherein the threshold length comprises a sewing distance between the line segment start point and the line segment stop point for each portion of the one or more line segments. 12. The method of claim 9 , wherein assigning either a standard stitch density or an altered stitch density to each of the one or more portions of the plurality of pattern elements comprises assigning an altered stitch density to each portion of the one or more line segments that satisfies the threshold length and the threshold angle with respect to the axis. 13. The method of claim 8 , wherein determining whether each increment of each of the one or more arc segments that satisfies the threshold angle with respect to the axis satisfies a threshold length comprises: determining there is a plurality of adjacent increments that satisfy the threshold angle, each of the plurality of adjacent increments comprising an increment start point and an increment stop point; and determining whether the summed length of the plurality of adjacent increments that satisfy the threshold angle with respect to the axis satisfies a threshold length. 14. A method for automatically assigning variable stitch densities to pattern elements of a sewing pattern, the method comprising: r

Assignees

Inventors

Classifications

  • D05B11/00Primary

    Machines for sewing quilts or mattresses (control of workpiece-holding frames, or of sewing machines, in order to obtain particular seam configuration D05B21/00) · CPC title

  • characterised by control of operation of machine · CPC title

  • Embroidering machines with arrangements for automatic control of a series of individual steps · CPC title

  • D05B19/10Primary

    Arrangements for selecting combinations of stitch or pattern data from memory {; Handling data in order to control stitch format, e.g. size, direction, mirror image} · CPC title

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What does patent US9574292B2 cover?
A method of dynamically changing stitch density of a quilting pattern during sewing is provided. Embodiments of the invention include dynamically changing stitch density along an axis of a sewing pattern based on identifying sewing pattern elements, which may include line segments and arc segments. Each of the line segments and/or arc segments is assigned a dynamically adjusted stitch density b…
Who is the assignee on this patent?
L & P Property Management Co, L&P Property Man Co
What technology area does this patent fall under?
Primary CPC classification D05B11/00. Mapped technology areas include Textiles & Paper.
When was this patent published?
Publication date Tue Feb 21 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).