Method for forming pattern of organic electroluminescent element

Patent metadata

Field	Value
Publication number	US-9570685-B2
Application number	US-201414786995-A
Country	US
Kind code	B2
Filing date	Apr 16, 2014
Priority date	Apr 26, 2013
Publication date	Feb 14, 2017
Grant date	Feb 14, 2017

Abstract

A method includes forming an emission pattern on an organic electroluminescent element including an organic functional layer between two electrodes by light irradiation to the organic electroluminescent element, and controlling at least one of light intensity and exposure time as variable factors during the light irradiation based on reciprocity failure characteristics involving modification of a function of the organic functional layer due to the light irradiation.

First claim

The invention claimed is:

1. A method comprising:
forming an emission pattern on an organic electroluminescent element comprising an organic functional layer between two electrodes by light irradiation to the organic electroluminescent element; and
controlling at least one of a light intensity of the light irradiation and an exposure time of the light irradiation as variable factors based on a reciprocity failure characteristic of the organic functional layer due to the light irradiation,
wherein the reciprocity failure characteristic specifies that a modification of the organic functional layer is not constant for a constant cumulative light irradiation of the organic functional layer based on the light intensity of the light irradiation and the exposure time of the light irradiation.

2. The method according to claim 1 , wherein
the controlling of the at least one of light intensity and exposure time is based on the reciprocity failure characteristics determined through preliminary measurements of a mutual relationship between the level of the modification of the function of the organic functional layer due to the light irradiation and the at least one of light intensity and exposure time.

3. The method according to claim 1 , wherein
the modification of the function of the organic functional layer due to the light irradiation corresponds to a variation in emission luminance of the organic electroluminescent element.

4. The method according to claim 1 , wherein
the controlling comprises keeping the exposure time constant and varying the light intensity.

5. The method according to claim 1 , wherein
the controlling comprises keeping the light intensity constant and varying the exposure time.

6. The method according to claim 1 , wherein
the emission pattern is formed through stippling by the light irradiation.

7. The method according to claim 1 , wherein
the emission pattern is formed by the light irradiation through a patterning mask to adjust the light intensity.

8. The method according to claim 2 , wherein the modification of the function of the organic functional layer due to the light irradiation corresponds to a variation in emission luminance of the organic electroluminescent element.

9. The method according to claim 2 , wherein the controlling comprises keeping the exposure time constant and varying the light intensity.

10. The method according to claim 3 , wherein the controlling comprises keeping the exposure time constant and varying the light intensity.

11. The method according to claim 8 , wherein the controlling comprises keeping the exposure time constant and varying the light intensity.

12. The method according to claim 2 , wherein the controlling comprises keeping the light intensity constant and varying the exposure time.

13. The method according to claim 3 , wherein the controlling comprises keeping the light intensity constant and varying the exposure time.

14. The method according to claim 8 , wherein the controlling comprises keeping the light intensity constant and varying the exposure time.

15. The method according to claim 2 , wherein the emission pattern is formed through stippling by the light irradiation.

16. The method according to claim 3 , wherein the emission pattern is formed through stippling by the light irradiation.

17. The method according to claim 4 , wherein the emission pattern is formed through stippling by the light irradiation.

18. The method according to claim 5 , wherein the emission pattern is formed through stippling by the light irradiation.

19. The method according to claim 8 , wherein the emission pattern is formed through stippling by the light irradiation.

20. The method according to claim 1 , further comprising:
determining a relationship between the light intensity of the light irradiation and the exposure time of the light irradiation for forming the emission pattern, wherein the relationship corresponds to a variation in an emission luminance level of the organic electroluminescent element modified by the light irradiation.

Assignees

• Konica Minolta Inc

Inventors

• Morikawa Masahiro
• Shindo Hiroyuki

Classifications

• H10K71/70

  Testing, e.g. accelerated lifetime tests · CPC title

• H10K71/20 Primary

  Changing the shape of the active layer in the devices, e.g. patterning · CPC title

• H05B33/10

  Apparatus or processes specially adapted to the manufacture of electroluminescent light sources · CPC title

• H01L51/0015

  Electricity · mapped topic

• H01L51/56

  Electricity · mapped topic