Mid-infrared avalanche photodiodes with low dark currents
US-2024170601-A1 · May 23, 2024 · US
US9570647B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9570647-B2 |
| Application number | US-201514642734-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 9, 2015 |
| Priority date | Nov 27, 2006 |
| Publication date | Feb 14, 2017 |
| Grant date | Feb 14, 2017 |
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An avalanche photodiode detector is provided. The avalanche photodiode detector comprises an absorber region having an absorption layer for receiving incident photons and generating charged carriers; and a multiplier region having a multiplication layer; wherein the multiplier region is on a mesa structure separate from the absorber region and is coupled to the absorber region by a bridge for transferring charged carriers between the absorber region and multiplier region.
Opening claim text (preview).
What is claimed is: 1. An avalanche photodiode detector, comprising: an absorber region disposed on a substrate and comprising a first mesa comprising an insulating layer disposed on the substrate, an N-doped contact layer disposed on the insulating layer, a first contact disposed on the N-doped contact layer, and an absorption layer disposed on the N-doped contact layer, the absorption layer configured to receive incident photons and to generate charged carriers; and a multiplier region disposed on the substrate on a second mesa separate from the first mesa, the second mesa comprising an N-doped layer disposed on the substrate, a multiplication layer disposed on the N-doped layer, a quantum well disposed over the multiplication layer opposite the N-doped layer, an N-well disposed over the quantum well opposite the multiplication layer, and a second contact directly disposed on the N-well; and a metal bridge connecting the first contact and the second contact. 2. The avalanche photodiode detector of claim 1 , wherein bias across the absorber region is maintained by an electrical connection between the first contact and a third contact, the third contact on a P-doped layer which is disposed on the N-doped contact layer. 3. The avalanche photodiode detector of claim 1 , wherein the absorption layer has a larger surface area than the multiplication layer.
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