Controlled switching for electrochromic devices
US-2015362819-A1 · Dec 17, 2015 · US
US9568741B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9568741-B2 |
| Application number | US-201113640453-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 13, 2011 |
| Priority date | Apr 13, 2010 |
| Publication date | Feb 14, 2017 |
| Grant date | Feb 14, 2017 |
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A method of optimising at least one measure that is a quadratic function of a wavefunction, such as the spot size of a laser, the method comprising: superimposing a plurality of wavefunctions; determining a relationship between the superimposed wavefunctions and the quadratic measure, and using the determined relationship to identify the superimposed wavefunctions that provide a desired or optimised quadratic measure.
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The invention claimed is: 1. A method of optimizing in an optical system that has a laser, at least one measure of an optical output from the optical system that is a quadratic function of a wavefunction, the method comprising: superimposing a plurality of wavefunctions; determining a relationship between the superimposed wavefunctions and the quadratic measure; identifying, using a computer processor, the superimposed wavefunctions that provide a desired or optimized quadratic optical measure using the determined relationship; and generating, using light from the laser and at least one optical component, the identified superimposed wavefunctions that provide the desired or optimized quadratic optical measure. 2. A method as claimed in claim 1 wherein each superposition of wavefunctions has an amplitude and/or phase, and the method involves using the amplitude and/or phase to determine a relationship or function between superimposed wavefunctions and the quadratic measure. 3. A method as claimed in claim 2 wherein the relationship or function is a linear relationship or function of the wavefunction. 4. A method as claimed in claim 3 , wherein the linear relationship is decomposed or transformed to be represented by a series of eigenvectors/eigenvalues. 5. A method as claimed in claim 4 , wherein the optimized or desired measure is selected by choosing the maximum or minimum magnitude eigenvalue. 6. A method as claimed in claim 3 wherein the linear function is a linear operator of the wavefunction. 7. A method as claimed in claim 6 wherein the linear operator comprises a square matrix where each element is given by the quadratic measure corresponding to all the superpostions of the wavefunctions considered, to form a n by n matrix where n is the number of wavefunctions considered. 8. A method as claimed in claim 1 where constraints and/or symmetries are applied. 9. A method as claimed in claim 8 wherein one parameter is constrained to be constant and another optimized within that constraint. 10. A method as claimed in claim 9 , wherein intensity is constrained to be constant and spot size is minimized within that constraint. 11. A method as claimed in claim 1 comprising defining a region of interest and determining the relationship between the superimposed wavefunctions and the quadratic measure within the region of interest. 12. A method as claimed in claim 11 wherein the region of interest is user defined. 13. A method as claimed in claim 1 wherein the quadratic measure is selected from: spot size; energy; intensity; power; momentum; circular spin. 14. A method as claimed in claim 1 wherein the wavefunctions are orthogonal. 15. A method as claimed in claim 1 wherein the wavefunctions are electromagnetic wavefunctions. 16. A method as claimed in claim 1 wherein the method is carried out computationally to identify the superimposed wavefunctions that provide a desired or optimized quadratic measure. 17. A method as claimed in claim 1 wherein the method is carried out experimentally to identify the superimposed wavefunctions that provide a desired or optimized quadratic measure. 18. A computer program product for optimizing in an optical system that has a laser, at least one measure of an optical output from the optical system that is a quadratic function of a wavefunction, the computer program product located on a non-transitory computer readable medium comprising instructions for operation by a computing device, said instructions comprising: instructions configured for superimposing a plurality of wavefunctions; instructions configured for determining a relationship between the superimposed wavefunctions and the quadratic measure; instructions configured for identifying the superimposed wavefunctions that provide a desired or optimized quadratic optical measure using the determined relationship; and instructions configured for generating, using light from a laser and at least one optical component, the identified superimposed wavefunctions that provide the desired or optimized quadratic optical measure. 19. A device adapted to cause superposition of a plurality of wavefunctions, so as to optimize a quadratic measure, the plurality of wavefunctions being determined using the following operations by said device: superimposing a plurality of wavefunctions; determining a relationship between the superimposed wavefunctions and the quadratic measure; identifying the superimposed wavefunctions that provide a desired or optimized quadratic optical measure using the determined relationship; and generating, using light from a laser, the identified superimposed wavefunctions that provide the desired or optimized quadratic optical measure. 20. A device as claimed in claim 19 comprising a diffractive optical element adapted to create the optimized plurality of wavefunctions. 21. A device as claimed in claim 19 adapted to create a sub-diffraction limit spot size. 22. A method for forming an image in an optical system that has a laser, the method comprising: illuminating a target with a plurality of wavefunctions; capturing light that has interacted with the target; decomposing the captured light into a plurality of wavefunctions that together describe the target; determining a relationship between the superimposed wavefunctions and a quadratic measure; identifying the superimposed wavefunctions that provide a desired or optimized quadratic optical measure using the determined relationship; and using the identified superimposed wavefunctions to create an image of the target. 23. A method as claimed in claim 22 wherein the light captured is transmitted through or reflected from or scattered from the target. 24. A method as claimed in claim 22 , wherein the wavefunctions are electromagnetic wavefunctions. 25. A computer-implemented method of optimizing a spot size of an optical beam, the method comprising: superimposing a plurality of wavefunctions; determining, using a computer processor, a relationship between the superimposed wavefunctions and the spot size; identifying, using a computer processor, the superimposed wavefunctions that provide a desired or optimized spot size using the determined relationship; and generating, using a laser, the identified superimposed wavefunctions that provide the desired or optimized spot size. 26. The computer-implemented method as claimed in claim 25 , wherein the optimized spot size is below a diffraction limit. 27. The computer-implemented method as claimed in claim 25 , wherein the optimized spot size is a focal point spot size and the focal point spot size is below a diffraction limit. 28. A computer-implemented method of optimizing, in an optical trapping system, at least one measure of an optical trap that is a quadratic function of a wavefunction, the method comprising: superimposing a plurality of wavefunctions for forming an optical trap; determining, using a computer processor, a relationship between the superimposed wavefunctions and the optical trap quadratic measure; identifying, using a computer processor, the superimposed wavefunctions that provide a desired or optimized optical trap quadratic measure using the determined relationship; and generating, using a laser, an optical trap for trapping at least one particle, using the identified superimposed wavefunctions that provide
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