Multilayer stack combinations with interleaved overlapping harmonics for wide visible infrared coverage

Patent metadata

Field	Value
Publication number	US-9562996-B2
Application number	US-201313844664-A
Country	US
Kind code	B2
Filing date	Mar 15, 2013
Priority date	Oct 20, 2011
Publication date	Feb 7, 2017
Grant date	Feb 7, 2017

Abstract

A broadband mirror, polarizer, or other reflector includes separate stacks of microlayers. Microlayers in each stack are arranged into optical repeat units, and the stacks are arranged in series. At a design angle of incidence such as normal incidence, the second stack provides a second 1 st order reflection band and a distinct second 2 nd order reflection band with a second spectral pass band therebetween. The first stack provides a first 1 st order reflection band that fills the second spectral pass band such that a single wide reflection band is formed that includes the first 1 st order reflection band, the second 1 st order reflection band, and the second 2 nd order reflection band. In some cases, the single wide reflection band can include a first 2 nd order reflection band of the first stack. In some cases, the first and second stacks may have apodized portions which monotonically deviate from respective baseline portions.

First claim

What is claimed is:

1. An article comprising separate first and second stacks of microlayers, the first and second stacks being arranged in series such that light transmitted by the first stack impinges on the second stack, and/or light transmitted by the second stack impinges on the first stack, the microlayers in each stack being arranged into optical repeat units;
wherein, at a design angle of incidence, the first stack provides a first 1 st order reflection band and the second stack provides a second 1 st order reflection band and a second 2 nd order reflection band;
wherein the second 2 nd order reflection band is spectrally separated from the second 1 st order reflection band to define a second spectral pass band;
wherein the first 1 st order reflection band substantially overlaps both the second 1 st order reflection band and the second 2 nd order reflection band to form a single wide reflection band that includes the first 1 st order reflection band, the second 1 st order reflection band, and the second 2 nd order reflection band;
wherein a substantial overlap is (a) having an actual overlap between a reflection band and another reflection band based on band edge wavelengths or (b) having a band edge wavelength of a reflection band differing by 5% or less than a band edge wavelength of another reflection band; and
wherein a band edge wavelength for determining the substantial overlap is defined by a sufficient coherent reflectivity to achieve a reflection band having only reflectivity values greater than 25% of a peak reflectivity of the reflection band.

2. The article of claim 1 , wherein the first 1 st order reflection band overlaps both the second 1 st order reflection band and the second 2 nd order reflection band, such that the first 1 st order reflection band has a long wavelength band edge that falls within the second 1 st order reflection band, and a short wavelength band edge that falls within the second 2 nd order reflection band.

3. The article of claim 1 , wherein the first 1 st order reflection band has a long wavelength band edge whose wavelength λ L11st differs from a wavelength λ S21st of a short wavelength band edge of the second 1 st order reflection band by no more than 5% of λ S21st .

4. The article of claim 1 , wherein the first 1 st order reflection band has a short wavelength band edge whose wavelength λ S11st differs from a wavelength λ L22nd of a long wavelength band edge of the second 2 nd order reflection band by no more than 5% of λ S11st .

5. The article of claim 1 , wherein the first and second stacks comprise a total number of microlayers, refractive indices defining a refractive index difference between microlayers, and a first optical repeating unit thickness profile defining the single wide reflection band, the first and second stacks providing a total reflective power, the total reflective power defined as a sum of all harmonic orders that reflect in the single wide reflection band, wherein the total reflective power is greater than a reflective power in the single wide reflection band for a stack of microlayers comprising the same total number of microlayers, the same refractive indices, a second optical repeating unit thickness profile defining the same single wide reflection band with only 1 st order reflections, and an f-ratio of 0.5.

6. The article of claim 5 , wherein the second stack of microlayers has an f-ratio that is either (i) greater than 0.25 and less than 0.5 or (ii) greater than 0.5 and less than 0.75.

7. The article of claim 1 , wherein the second 2 nd order reflection band covers at least 100 nm within a range from 380 to 720 nm.

8. The article of claim 1 , wherein the second stack of microlayers includes a baseline portion and an apodized portion, the baseline portion having a second baseline optical repeat unit thickness profile and the apodized portion having a second apodized optical repeat unit thickness profile that monotonically deviates from the second baseline optical repeat unit thickness profile.

9. The article of claim 8 , wherein the first stack of microlayers also includes a baseline portion and an apodized portion, the baseline portion of the first stack having a first baseline optical repeat unit thickness profile and the apodized portion of the first stack having a first apodized optical repeat unit thickness profile that monotonically deviates from the first baseline optical repeat unit thickness profile, and wherein the apodized portion of the second stack and the apodized portion of the first stack are each disposed between the baseline portion of the second stack and the baseline portion of the first stack.

10. The article of claim 1 , wherein the design angle of incidence is normal incidence.

11. The article of claim 1 , wherein, at the design angle of incidence, the first stack provides a first 2 nd order reflection band, the first 2 nd order reflection band being spectrally separated from the first 1 st order reflection band to define a first spectral pass band.

12. The article of claim 11 , wherein the second 2 nd order reflection band substantially overlaps the first 1 st order reflection band and the first 2 nd order reflection band such that the single wide reflection band also includes the first 2 nd order reflection band.

13. The article of claim 12 , wherein the second 2 nd order reflection band overlaps both the first 1 st order reflection band and the first 2 nd order reflection band, such that the second 2 nd order reflection band has a long wavelength band edge that falls within the first 1 st order reflection band, and a short wavelength band edge that falls within the first 2 nd order reflection band.

14. The article of claim 11 , wherein the first 2 nd order reflection band covers at least 100 nm within a range from 380 to 720 nm.

15. The article of claim 11 , wherein the design angle of incidence is normal incidence.

16. The article of claim 1 , wherein the first and second stacks of microlayers are part of a single coextruded polymeric film and are separated by at least a protective boundary layer (PBL).

17. The article of claim 1 , wherein the first stack is part of a first coextruded polymeric film, and the second stack is part of a different second coextruded polymeric film.

18. The article of claim 17 , wherein the first coextruded polymeric film has a major surface bonded to the second coextruded polymeric film.

19. The article of claim 18 , wherein the major surface of the first coextruded polymeric film bonds to the second coextruded polymeric film with a layer of adhesive material.

20. The article of claim 1 , wherein the article comprises a polarizer, and the first 1 st order reflection band, the second 1 st order reflection band, and the second 2 nd order reflection band are all associated with only one of two orthogonal polarization states.

21. The article of claim 1 , wherein the article comprises a mirror, and the first 1 st order reflection band, the second 1 st order reflection band, and the second 2 nd order reflection band are all associated with two orthogonal polarization states.

Assignees

• 3M Innovative Properties Co

Inventors

• Kivel Edward J
• Nevitt Timothy J
• Weber Michael F

Classifications

• G02B5/0841 Primary

  comprising organic materials, e.g. polymers · CPC title

• G02B5/285

  comprising deposited thin solid films (G02B5/281 - G02B5/289 take precedence; multilayered film filters for fibre optic multiplexing G02B6/29361) · CPC title

• G02B5/3041

  comprising multiple thin layers, e.g. multilayer stacks · CPC title

• G02B5/305

  including organic materials, e.g. polymeric layers · CPC title

• G02B5/287

  comprising at least one layer of organic material · CPC title