Automatic analysis device and automatic analysis program

US9562917B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9562917-B2
Application numberUS-201214117717-A
CountryUS
Kind codeB2
Filing dateApr 17, 2012
Priority dateMay 16, 2011
Publication dateFeb 7, 2017
Grant dateFeb 7, 2017

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Abstract

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Accuracy control of an automatic analysis device that mixes a sample and a reagent to measure temporal change of a mixed solution is realized. A plurality of measurement point data is acquired from a reaction process of the sample and the reagent. Parameters and test values of approximate equations for approximating the plurality of measurement point data are accumulated in a storage unit. A distribution map of reference data corresponding to the parameters or the test values is created based on predetermined numbers of the parameters or the test values accumulated in the storage unit. Next, a plurality of screens for individually superimposing, on the distribution map, curved lines corresponding to a plurality of regression function candidates obtained by applying a plurality of regression functions are arranged and presented on a display screen, so as to approximate the data to the distribution map of the reference data.

First claim

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The invention claimed is: 1. An automatic analysis device that mixes a sample and a reagent to measure temporal change of a mixed solution, the automatic analysis device comprising: a measurement point data acquisition unit that acquires a plurality of measurement point data from a reaction process of the sample and the reagent; a first storage unit that accumulates test values and parameters of approximate equations for approximating the plurality of measurement point data; a data processing unit that creates a distribution map of reference data corresponding to the parameters or the test values based on predetermined numbers of the parameters or the test values accumulated in the first storage unit; a second storage unit that stores a threshold for removal determination; an output unit that presents, on a display screen, removal data candidates included in the distribution map of the reference data based on the threshold; and a third storage unit that stores attached information of the reference data, the information including a determination result indicating whether data is to be removed from the distribution map of the reference data. 2. The automatic analysis device according to claim 1 , wherein the output unit displays, on the display screen, a reaction process curve including a plurality of measurement point data corresponding to reference data designated and input on the distribution map. 3. The automatic analysis device according to claim 1 , wherein when the determination result indicates removal, the third storage unit stores information related to a reason for removing the reference data from the distribution map. 4. The automatic analysis device according to claim 1 , wherein the output unit presents a relationship between the threshold and the removal data candidates on the distribution map of the reference data. 5. The automatic analysis device according to claim 1 , further comprising: a deviation determination unit that determines whether newly acquired test data is deviated from the distribution map of the reference data; and a fourth storage unit that stores attached information of the reference data, the information including a determination result indicating whether data is deviated from the distribution map of the reference data, wherein the output unit presents the determination result of the deviation determination unit on the distribution map of the reference data. 6. The automatic analysis device according to claim 5 , wherein when the determination result indicates deviation, the fourth storage unit stores information related to a reason that the reference data is deviated from the distribution map. 7. The automatic analysis device according to claim 5 , further comprising: a second data processing unit that calculates a second regression function indicating a relationship between the parameters and the test values corresponding to the reference data included in the distribution map; and a third data processing unit that calculates an ideal reaction process curve for arbitrary test data based on the second regression function, wherein the output unit superimposes, on the display screen, a reaction process curve corresponding to the test data determined to be deviated by the deviation determination unit and the ideal reaction process. 8. The automatic analysis device according to claim 5 , further comprising: a fourth data processing unit that standardizes a cluster of reference data included in the distribution map of the reference data; a fifth data processing unit that standardizes the data removed from the distribution map of the reference data; and a sixth data processing unit that creates a standardized distribution map by merging a distribution of normal data created by the fourth data processing unit and a distribution of abnormal data created by the fifth data processing unit, in a way that allows identifying the distributions, wherein the output unit displays the standardized distribution map on the display screen. 9. The automatic analysis device according to claim 5 , further comprising a fourth data processing unit that standardizes a cluster of reference data included in the distribution map of the reference data; a seventh data processing unit that standardizes the test data determined to be deviated by the deviation determination unit among the newly acquired test data; and an eighth data processing unit that creates a standardized distribution map by merging a distribution of normal data created by the fourth data processing unit and a distribution of abnormal data created by the seventh data processing unit, in a way that allows identifying the distributions, wherein the output unit displays the standardized distribution map on the display screen. 10. The automatic analysis device according to claim 9 , further comprising a ninth data processing unit that applies data processing opposite the standardization to the standardized distribution map to create a distribution map that can identify the normal data and the abnormal data, wherein the output unit superimposes the newly acquired test data on the distribution map created by the ninth data processing unit. 11. An automatic analysis program causing a computer mounted on an automatic analysis device, which mixes a sample and a reagent to measure temporal change of a mixed solution, to execute: a process of acquiring a plurality of measurement point data from a reaction process of the sample and the reagent; a process of accumulating, in a first storage unit, test values parameters of approximate equations for approximating the plurality of measurement point data; a process of creating a distribution map of reference data corresponding to the parameters or the test values based on predetermined numbers of the parameters or the test values accumulated in the first storage unit; a process of presenting, on a display screen, removal data candidates included in the distribution map of the reference data based on a threshold for removal determination; and a processing of storing, in a second storage unit, attached information of the reference data, the information including a determination result indicating whether data is to be removed from the distribution map of the reference data.

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What does patent US9562917B2 cover?
Accuracy control of an automatic analysis device that mixes a sample and a reagent to measure temporal change of a mixed solution is realized. A plurality of measurement point data is acquired from a reaction process of the sample and the reagent. Parameters and test values of approximate equations for approximating the plurality of measurement point data are accumulated in a storage unit. A di…
Who is the assignee on this patent?
Manri Chihiro, Mitsuyama Satoshi, Mimura Tomonori, and 2 more
What technology area does this patent fall under?
Primary CPC classification G01N35/00584. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 07 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).