Compound, resin, resist composition and method for producing resist pattern

US9562122B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9562122-B2
Application numberUS-201514835054-A
CountryUS
Kind codeB2
Filing dateAug 25, 2015
Priority dateAug 25, 2014
Publication dateFeb 7, 2017
Grant dateFeb 7, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A resist composition has a resin (A1) including a structural unit having an acid-labile group, a resin (A2) including a structural unit having a group represented by formula (Ia), and an acid generator. wherein R 1 in each occurrence independently represents a fluorine atom or a C 1 to C 6 fluorinated alkyl group, ring W represents a C 5 to C 18 alicyclic hydrocarbon group, n represents an integer of 1 to 6, and * represents a binding site.

First claim

Opening claim text (preview).

What is claimed is: 1. A resist composition comprising a resin (A1) which comprises a structural unit having an acid-labile group, a resin (A2) which comprises a structural unit having a group represented by formula (Ia) and having no acid-labile group, and an acid generator: wherein R 1 in each occurrence independently represents a fluorine atom or a C 1 to C 6 fluorinated alkyl group, ring W represents a C 5 to C 18 alicyclic hydrocarbon group, n represents an integer of 1 to 6, and * represents a binding site. 2. The resist composition according to claim 1 , wherein the structural unit having the group represented by the formula (Ia) is a structural unit derived from a compound represented by formula (Ia1): wherein R 1 , ring W and n are as defined in claim 1 , R 2 represents a hydrogen atom, a halogen atom or a C 1 to C 6 alkyl group that may have a halogen atom, R 3 represents a single bond or a C 1 to C 6 alkanediyl group where a methylene group may be replaced by an oxygen atom or a carbonyl group, and A 3 represents an oxygen atom or an NH group. 3. The resist composition according to claim 1 , wherein the ring W is a cyclohexane ring, a cyclopentane ring or a norbornane group. 4. The resist composition according to claim 1 , wherein the structural unit having the group represented by the formula (Ia) is a structural unit derived from a compound represented by formula (I0): wherein R 1 and n are as defined in claim 1 , R 2 represents a hydrogen atom, a halogen atom or a C 1 to C 6 alkyl group that may have a halogen atom, A 3 represents an oxygen atom or an NH group, and s represents an integer of 1 to 4. 5. The resist composition according to claim 1 , wherein the structural unit having the group represented by the formula (Ia) is a structural unit derived from a monomer represented by formula (I): wherein R 1 and n are as defined in claim 1 , R 2 represents a hydrogen atom, a halogen atom or a C 1 to C 6 alkyl group that may have a halogen atom, and s represents an integer of 1 to 4. 6. The resist composition according to claim 1 , wherein the resin (A2) comprises 50% by mole or more of the structural unit having the group represented by the formula (Ia). 7. The resist composition according to claim 1 , wherein the resin (A2) consists of the structural units having the group represented by the formula (Ia). 8. A method for producing a resist pattern comprising steps (1) to (5); (1) applying the resist composition according to claim 1 onto a substrate; (2) drying the applied composition to form a composition layer; (3) exposing the composition layer; (4) heating the exposed composition layer, and (5) developing the heated composition layer. 9. A compound represented by formula (Ia1): wherein R 1 in each occurrence independently represents a fluorine atom or a C 1 to C 6 fluorinated alkyl group, ring W represents a C 5 to C 18 alicyclic hydrocarbon group, n represents an integer of 1 to 6, R 2 represents a hydrogen atom, a halogen atom, or a C 1 to C 6 alkyl group that may have a halogen atom, R 3 represents a single bond or a C 1 to C 6 alkanediyl group where a methylene group may be replaced by an oxygen atom or a carbonyl group, and A 3 represents an oxygen atom or an NH group, and the compound represented by formula (Ia1) has no acid-labile group. 10. The compound according to claim 9 , which is a compound represented by formula (I0): wherein R 1 , A 3 , R 2 and n are as defined in claim 9 , and s represents an integer of 1 to 4. 11. The compound according to claim 9 , which is a compound represented by formula (I): wherein R 1 , R 2 and n are as defined in claim 9 , and s represents an integer of 1 to 4. 12. The compound according to claim 9 , which is a compound represented by formula (I-1): wherein R 2 is as defined in claim 9 . 13. A resin having a structural unit derived from the compound of claim 9 .

Assignees

Inventors

Classifications

  • Treatment before imagewise removal, e.g. prebaking {(G03F7/265 takes precedence)} · CPC title

  • the ring being saturated · CPC title

  • the macromolecular compound having an alicyclic moiety in a side chain · CPC title

  • with perfluoro compounds, e.g. for dry lithography (G03F7/0048 takes precedence) · CPC title

  • Esters of carboxylic acids having an esterified carboxyl group bound to a carbon atom of a ring other than a six-membered aromatic ring · CPC title

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What does patent US9562122B2 cover?
A resist composition has a resin (A1) including a structural unit having an acid-labile group, a resin (A2) including a structural unit having a group represented by formula (Ia), and an acid generator. wherein R 1 in each occurrence independently represents a fluorine …
Who is the assignee on this patent?
Sumitomo Chemical Co
What technology area does this patent fall under?
Primary CPC classification C08F220/24. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Feb 07 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).