Determination of strain components for different deformation modes using a filter

US9557239B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9557239-B2
Application numberUS-96011910-A
CountryUS
Kind codeB2
Filing dateDec 3, 2010
Priority dateDec 3, 2010
Publication dateJan 31, 2017
Grant dateJan 31, 2017

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  5. First independent claim

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Abstract

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A method, apparatus and computer-readable medium for determining a strain component for a deformation mode of a member is disclosed. A plurality of measurements is obtained, wherein each of the plurality of measurements relates to a strain at a location of the member. A deformation mode is selected and an adjustable filter is applied to the plurality of strain measurements to determine the strain component for the selected deformation mode.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of determining a strain component for a selected deformation mode of a member, comprising: propagating a light through a fiber optic cable wrapped around the member, the fiber optic cable having a plurality of sensors therein; receiving light reflected at the plurality of sensors to determine a wavelength shift of the propagated light at each of the plurality of sensors, wherein each wavelength shift indicates a strain on the member at a location of a related sensor; and using a processor to: form a dataset that relates each wavelength shift for the plurality of sensors to locations of the plurality of sensors at the member, perform a transform on the dataset to obtain a spatial frequency spectrum, wherein a peak of the spatial frequency spectrum corresponds to the selected deformation mode of the member, apply an adjustable filter to the spatial frequency spectrum to select a peak of the spatial frequency spectrum that corresponds to the selected deformation mode, wherein a frequency response of the adjustable filter includes a parameter defining frequency attenuation and a cut-off frequency i c (k) given by: j c ⁡ ( k ) = M N ⁢ ( 2 ⁢ k + 1 ) where M is a total number of strain measurements, N is a total number of sensors in a single wrap of the member, and k is an index for selecting the deformation mode, and perform an inverse transform on the selected peak to determine the strain components for the selected deformation mode. 2. The method of claim 1 , wherein the adjustable filter is one of a lowpass filter and a bandpass filter. 3. The method of claim 1 , wherein applying the adjustable filter selects a spatial frequency of the selected deformation mode. 4. The method of claim 1 , wherein the attenuation parameter is selected to remove a phase noise. 5. The method of claim 1 , wherein the frequency response is convolved with the plurality of measurements. 6. The method of claim 1 , wherein the member is one of: (1) a casing; (2) a sand screen; (3) a subsea riser; (4) an umbilical; (5) a tubing; (6) a pipeline; (7) a cylindrical structure bearing a load. 7. The method of claim 1 , wherein the selected deformation mode is one of: (1) a compression/tensile mode; (2) a bending mode; (3) an ovalization mode; (4) a triangularization mode; (5) a rectangularization mode; and (6) a deformation mode having a spatial frequency that is an integer multiple of a spatial frequency of a bending deformation. 8. The method of claim 1 , wherein the plurality of measurements include at least one of: (1) a measurement of wavelength shift; (2) a measurement of frequency change; and (3) a measurement of a change in impedance. 9. An apparatus for determining a strain component for a selected deformation mode of a member, comprising: a fiber optic cable wrapped around the member and including a plurality of sensors; an interrogation unit configured to read the plurality of sensors and obtain a measurement from the plurality of sensors to determine a wavelength shift of light propagated in the fiber optic cable at each of the plurality of sensors, wherein each wavelength shift indicates a strain on the member at a location of a related sensor; and a processor configured to: form a dataset that relates each wavelength shift for the plurality of sensors to locations of the plurality of sensors at the member, obtain a spatial frequency spectrum, wherein a peak of the spatial frequency spectrum corresponds to the selected deformation mode of the member, apply an adjustable filter to the spatial frequency spectrum to select a peak of the spatial frequency spectrum that corresponds to the selected deformation mode, wherein a frequency response of the filter includes a parameter defining frequency attenuation and a cut-off frequency given by: j c ⁡ ( k ) = M N ⁢ ( 2 ⁢ k + 1 ) where M is a total number of measurements, N is a total number of sensors in a single wrap of the member, and k is an index for selecting the deformation mode, and perform an inverse transform on the selected peak to determine the strain components for the selected deformation mode. 10. The apparatus of claim 9 , wherein the adjustable filter is one of a lowpass filter and a bandpass filter. 11. The apparatus of claim 9 , wherein the processor is configured to adjust the filter to select a spatial frequency related to the selected deformation mode. 12. The apparatus of claim 9 , wherein the attenuation parameter is selected to remove a phase noise. 13. The apparatus of claim 9 , wherein the frequency response is convolved with the plurality of measurements. 14. The apparatus of claim 9 , wherein the member is one of: (1) a casing; (2) a sand screen; (3) a subsea riser; (4) an umbilical; (5) a tubing; (6) a pipeline; (7) a cylindrical structure bearing a load. 15. The apparatus of claim 9 , wherein the selected deformation mode is one of: (1) a compression/tensile mode; (2) a bending mode; (3) an ovalization mode; (4) a triangularization mode; (5) a rectangularization mode; and (6) a deformation mode having a spatial frequency that is an integer multiple of a spatial frequency of a bending deformation. 16. The apparatus of claim 9 , wherein the plurality of measurements include at least one of: (1) a measurement of wavelength shift; (2) a measurement of frequency change; and (3) a measurement of a change in impedance. 17. A non-transitory computer-readable medium having stored thereon instructions that when read by a processor enable the processor to perform a method, the method comprising: propagating a light through a fiber optic cable wrapped around a member, the fiber optic cable having a plurality of sensors therein; receiving light reflected at the plurality of sensors to determine a wavelength shift of the propagated light at each of the plurality of sensors, wherein each wavelength shift indicates a strain on the member at a location of a related sensor; forming a dataset that relates each wavelength shift for the plurality of sensors to locations of the plurality of sensors at the member; performing a transform on the datase

Assignees

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Classifications

  • using light waves, e.g. infrared or ultraviolet waves · CPC title

  • Measuring stresses in a pipe string or casing (for locating blocked portions of pipes E21B47/09) · CPC title

  • G01L25/00Primary

    Testing or calibrating of apparatus for measuring force, torque, work, mechanical power, or mechanical efficiency · CPC title

  • using integrated gratings, e.g. Bragg gratings · CPC title

  • using a Bragg gratings · CPC title

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What does patent US9557239B2 cover?
A method, apparatus and computer-readable medium for determining a strain component for a deformation mode of a member is disclosed. A plurality of measurements is obtained, wherein each of the plurality of measurements relates to a strain at a location of the member. A deformation mode is selected and an adjustable filter is applied to the plurality of strain measurements to determine the stra…
Who is the assignee on this patent?
Chen Jianfeng, Yang Xudong, Thigpen Brian L, and 2 more
What technology area does this patent fall under?
Primary CPC classification G01L25/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 31 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).