Three-dimensional-shape measurement apparatus, three-dimensional-shape measurement method, and non-transitory computer-readable storage medium

Patent metadata

Field	Value
Publication number	US-9557167-B2
Application number	US-201514593341-A
Country	US
Kind code	B2
Filing date	Jan 9, 2015
Priority date	Jan 17, 2014
Publication date	Jan 31, 2017
Grant date	Jan 31, 2017

Abstract

A first image of a space onto which a first light pattern formed from bright and dark portions and a coordinate-detection pattern projected onto each region of the space divided by the first pattern have been projected is acquired. A second image is acquired of the space onto which a second light pattern having a boundary position between bright and dark portions that is different from that of the first pattern, and a coordinate-detection pattern projected onto each region of the space divided by the second pattern have been projected. One of the first image and the second image is selected to perform three-dimensional shape measurement of an object included in the space based on the selection image.

First claim

What is claimed is:

1. A three-dimensional-shape measurement apparatus comprising:
one or more processors; and
one or more memories coupled to the one or more processors and having instructions stored thereon which, when executed by the one or more processors, cause the three-dimensional-shape measurement apparatus to:
acquire first captured images of a space onto which a first pattern formed from a bright portion and a dark portion has been projected;
acquire second captured images of the space onto which has been projected a second pattern formed from a bright portion and a dark portion and having a boundary position between the bright portion and the dark portion that is different from a boundary position between the bright portion and the dark portion of the first pattern;
select, for each of at least one predetermined region of the first captured images or the second captured images, based on a luminance value in the first captured images and a luminance value in the second captured images, one of the first captured images and the second captured images containing the at least one predetermined region as a selection image to be used for three-dimensional-shape measurement; and

perform three-dimensional-shape measurement of an object included in the space based on the selection image,
wherein the first captured images include a first non-inverted image as a captured image of the space onto which the first pattern has been projected and a first inverted image as a captured image of the space onto which a first reversed pattern obtained by inverting the bright portion and the dark portion of the first pattern has been projected, and
wherein the second captured images include a second non-inverted image as a captured image of the space onto which the second pattern has been projected and a second inverted image as a captured image of the space onto which a second reversed pattern obtained by inverting the bright portion and the dark portion of the second pattern has been projected.

2. The apparatus according to claim 1 , wherein the instructions, when executed by the one or more processors, further cause the three-dimensional-shape measurement apparatus to perform three-dimensional-shape measurement of the object using a pixel value located in the predetermined region in the selection image.

3. The apparatus according to claim 1 , wherein the instructions, when executed by the one or more processors, further cause the three-dimensional-shape measurement apparatus to:
for each predetermined region, acquire, as a first difference, a difference between a luminance value in the predetermined region within the first non-inverted image and a luminance value in the predetermined region within the first inverted image, and acquire, as a second difference, a difference between a luminance value in the predetermined region within the second non-inverted image and a luminance value in the predetermined region within the second inverted image, and
select one of the first captured images and the second captured images as the selection image based on the first difference and the second difference.

4. The apparatus according to claim 3 , wherein the instructions, when executed by the one or more processors, further cause the three-dimensional-shape measurement apparatus to select one of the first captured images as the selection image for the predetermined region where the first difference is larger than the second difference, and to select one of the second captured images as the selection image for the predetermined region where the first difference is smaller than the second difference.

5. The apparatus according to claim 1 , wherein the first captured images include an image of the space where a coordinate-detection pattern is projected onto each region of the space divided by projecting the first pattern, and
wherein the second captured images include an image of the space where the coordinate-detection pattern is projected onto each region of the space divided by projecting the second pattern.

6. The apparatus according to claim 5 , wherein the instructions, when executed by the one or more processors, further cause the three-dimensional-shape measurement apparatus to specify, among the respective regions of the space divided by projecting the first or the second pattern in the selection image, a region onto which the coordinate-detection pattern in the selection image has been projected, and to perform the three-dimensional-shape measurement using a correspondence between the coordinate-detection pattern in the selection image and the coordinate-detection pattern projected onto the specified region among coordinate-detection patterns projected for the selection image.

7. The apparatus according to claim 5 , wherein the coordinate-detection patterns are broken-line patterns in which luminance values are discontinuous.

8. The apparatus according to claim 5 , wherein the coordinate-detection patterns are a plurality of patterns generated by sequentially shifting broken lines in a longitudinal direction with respect to the broken lines.

9. The apparatus according to claim 1 , wherein the first pattern and the second pattern are patterns in which a boundary portion between a bright portion and a dark portion is masked.

10. The apparatus according to claim 1 , wherein the instructions, when executed by the one or more processors, further cause the three-dimensional-shape measurement apparatus to:
generate an image of a reflected light component by removing from the selection image an influence of subsurface scattering occurring in the object, and
perform the three-dimensional-shape measurement using the image of the reflected light component as the selection image.

11. The apparatus according to claim 1 , wherein the first pattern and the second pattern are patterns based on Gray codes.

12. The apparatus according to claim 1 , wherein the object is a translucent object.

13. The apparatus according to claim 1 , further comprising:
a projection unit configured to project each of the first pattern and the second pattern; and
an image capturing unit configured to capture the first captured images of the space onto which the first pattern has been projected, and the second captured images of the space onto which the second pattern has been projected.

14. A three-dimensional-shape measurement apparatus comprising:
one or more processors; and
one or more memories coupled to the one or more processors and having instructions stored thereon which, when executed by the one or more processors, cause the three-dimensional-shape measurement apparatus to:
acquire first captured images of a space onto which a first pattern formed from a bright portion and a dark portion has been projected;
acquire second captured images of the space onto which has been projected a second pattern formed from a bright portion and a dark portion and having a boundary position between the bright portion and the dark portion that is different from a boundary position between the bright portion and the dark portion of the first pattern;
select, for each of at least one predetermined region of the first captured images or the second captured images, based on a luminance value in the first captured images and a luminance value in the second captured images, one of the first captured images and the second captured images containing the at least one predetermined region as a selection image to be used for three-dimensional-shape measurement; and
perform three-dimensional-shape measurement of an object included in the space based on the selection image,

wherein:
the first

Assignees

• Canon Kk

Inventors

• Kobayashi Toshihiro
• Higo Tomoaki
• Yamasaki Masayoshi

Classifications

• G01B11/25 Primary

  by projecting a pattern, e.g. {one or more lines,} moiré fringes on the object (G01B11/255 takes precedence {; image analysis for depth or shape recovery G06T7/50}) · CPC title

• G01B11/2513 Primary

  with several lines being projected in more than one direction, e.g. grids, patterns · CPC title

• G06T7/50

  Depth or shape recovery · CPC title

• G06T7/60

  Analysis of geometric attributes · CPC title

• G01B11/2531

  using several gratings, projected with variable angle of incidence on the object, and one detection device · CPC title