Dimensioning system with multipath interference mitigation

Patent metadata

Field	Value
Publication number	US-9557166-B2
Application number	US-201414519179-A
Country	US
Kind code	B2
Filing date	Oct 21, 2014
Priority date	Oct 21, 2014
Publication date	Jan 31, 2017
Grant date	Jan 31, 2017

Abstract

A system and method for measuring an item's dimensions using a time-of-flight dimensioning system is disclosed. The system and method mitigate multipath distortion and improve the accuracy of the measurements, especially in a mobile environment. To mitigate the multipath distortion, an imager captures an image of an item of interest. This image is processed to determine an illumination region corresponding item-of-interest's size, shape, and position. Using this information, an adjustable aperture's size, shape, and position are controlled so the light beam used in the time-of-flight analysis substantially illuminates the illumination region without first being reflected.

First claim

The invention claimed is:

1. A time-of-flight (TOF) dimensioning system, comprising:
an illumination subsystem configured to generate and project a light beam along an optical axis toward an item of interest, the light beam's spatial extent in a plane transverse to the optical axis being limited by an adjustable aperture;
an imager positioned and configured for capturing images of the item of interest;
a TOF sensor subsystem positioned and configured for capturing range images from the light beam as reflected from the item of interest; and
a control subsystem communicatively coupled to the adjustable aperture, the imager, and the TOF sensor subsystem, the control subsystem configured (i) to determine, from the captured images, an illumination region corresponding to the size, shape, and/or position of the item of interest, (ii) to control the adjustable aperture's size, shape, and/or position to limit the light beam's spatial extent to conform with the illumination region, and (iii) to determine from the range images an at least approximate dimension measurement of the item of interest.

2. The time-of-flight (TOF) dimensioning system according to claim 1 , wherein the light beam (i) substantially illuminates the illumination region and (ii) substantially reaches the item of interest without first being reflected.

3. The time-of-flight (TOF) dimensioning system according to claim 1 , wherein the TOF dimensioning system is handheld.

4. The time-of-flight (TOF) dimensioning system according to claim 1 , wherein the illumination subsystem comprises a diffractive optical element (DOE).

5. The time-of-flight (TOF) dimensioning system according to claim 1 , wherein the adjustable aperture comprises an electrically addressed spatial light modulator (EASLM).

6. The time-of-flight (TOF) dimensioning system according to claim 1 , wherein the dimension measurement is a volume.

7. A time-of-flight (TOF) dimensioning system, comprising:
a light source to generate light;
an optical subassembly positioned in front of the light source and configured to project a light beam along an optical axis toward an item of interest;
an adjustable aperture positioned along the optical axis between the optical subassembly and the item of interest, the adjustable aperture comprising a blocking region for blocking at least a portion of the light beam, the blocking region having a controllable size, shape, and position;
an imager positioned and configured for capturing images of the item of interest; and
a control subsystem communicatively coupled to the adjustable aperture and the imager, the control subsystem configured (i) to determine from the captured images an illumination region corresponding to the item of interest's size, shape, and position and (ii) to control the adjustable aperture's blocking region to limit illumination to the illumination region so that light from the light source substantially reaches the item of interest without first being reflected.

8. The time-of-flight (TOF) dimensioning system according to claim 7 , wherein the light source comprises a laser.

9. The time-of-flight (TOF) dimensioning system according to claim 7 , wherein the light source comprises a light emitting diode (LED).

10. The time-of-flight (TOF) dimensioning system according to claim 7 , wherein the optical subassembly comprises a lens.

11. The time-of-flight (TOF) dimensioning system according to claim 7 , wherein the optical subassembly comprises a diffractive optical element (DOE).

12. The time-of-flight (TOF) dimensioning system according to claim 7 , wherein the adjustable aperture comprises a liquid crystal display (LCD) screen.

13. The time-of-flight (TOF) dimensioning system according to claim 7 , wherein the adjustable aperture comprises a liquid-crystal-on-silicon (LCoS) projector.

14. The time-of-flight (TOF) dimensioning system according to claim 7 , wherein the adjustable aperture comprises a digital micro-mirror device (DMD).

15. The time-of-flight (TOF) dimensioning system according to claim 7 , wherein the imager comprises a charge-coupled device (CCD) image sensor and a lens.

16. The time-of-flight (TOF) dimensioning system according to claim 7 , wherein the imager comprises a complementary metal-oxide-semiconductor (CMOS) image sensor and a lens.

17. A method for reducing multipath distortion in a time-of-flight (TOF) dimensioning system, the method comprising:
capturing an image of an item of interest;
determining from the image an illumination region corresponding to the size, shape, and/or position of the item of interest; and
adjusting an adjustable aperture positioned in front of a light source to limit a spatial extent of a light beam directed at the item of interest (i) to substantially limit illumination to the illumination region and (ii) to substantially reach the item of interest without first being reflected.

18. The method according to claim 17 , wherein the image is a color image representing visible light.

19. The method according to claim 17 , wherein the determining step comprises identifying in the image's pixel values discontinuities comprising the edges of the item of interest.

20. The method according to claim 17 , wherein the determining step comprises prompting a user to select the illumination region from the image.

Assignees

• Hand Held Prod Inc

Inventors

• Thuries Serge
• Gillet Alain
• Laffargue Franck

Classifications

• G01B11/2513

  with several lines being projected in more than one direction, e.g. grids, patterns · CPC title

• G01B11/25

  by projecting a pattern, e.g. {one or more lines,} moiré fringes on the object (G01B11/255 takes precedence {; image analysis for depth or shape recovery G06T7/50}) · CPC title

• G01B11/2518

  Projection by scanning of the object · CPC title

• G01B11/24 Primary

  for measuring contours or curvatures · CPC title

• G01B11/255

  for measuring radius of curvature {(measuring diameter G01B11/08)} · CPC title