Detecting early failures in printed wiring boards

Patent metadata

Field	Value
Publication number	US-9551744-B2
Application number	US-201313886927-A
Country	US
Kind code	B2
Filing date	May 3, 2013
Priority date	Feb 4, 2013
Publication date	Jan 24, 2017
Grant date	Jan 24, 2017

Abstract

A method includes characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data, using the test data to determine a dielectric life curve of the first set of PWBs, and based on the dielectric life curve, defining a screening time and a screening voltage to screen for premature failures in a second set of PWBs due to electric fields.

First claim

The invention claimed is:

1. A method, comprising:
characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data, the PWBs each comprising laminated layers of copper traces separated by dielectric material, wherein the testing comprises applying a voltage to the first set of PWBs until dielectric breakdown failures of the dielectric material of the PWBs occurs;
using the test data to determine a dielectric life curve of the first set of PWBs; and
based on the dielectric life curve of the first set of PWBs, defining a screening time and a screening voltage to screen for premature dielectric breakdown failures in a second set of PWBs due to electric fields.

2. The method of claim 1 , wherein characterizing the effects of the electric field on the first set of PWBs includes applying a voltage to the first set of PWBs that is a multiple of an operating voltage of the first set of PWBs to simulate a life duration of the first set of PWBs in a compacted period of time.

3. The method of claim 1 , wherein the screening time and screening voltage are selected based on a screening curve generated by fitting the dielectric life curve onto a data point corresponding to a prematurely failed PWB.

4. The method of claim 1 , wherein characterizing the effects of the electric field on the first set of PWBs includes applying different voltages to the conductive traces of the first set of PWBs, and
generating the test data includes detecting failure times of the first set of PWBs.

5. The method of claim 4 , wherein defining the screening time and the screening voltage includes fitting the test data from the first set of PWBs to a generic curve defining polymers to generate the dielectric life curve, and
generating a screening curve by transposing the dielectric life curve.

6. The method of claim 5 , wherein defining the screening time and the screening voltage includes selecting the screening voltage and the screening time from the screening curve to test the second set of PWBs.

7. The method of claim 6 , wherein selecting the screening voltage and the screening time comprises:
generating a failure rate curve based on the test data; and
determining a first time corresponding to a duration of test time at which a threshold percentage of PWBs has failed among the first set of PWBs,
wherein the screening voltage and the screening time are selected based on the first time.

8. The method of claim 7 , wherein the first time is determined based on identifying an inflection point of the failure rate curve.

9. The method of claim 1 , further comprising:
performing an electrical field test on the second set of PWBs by applying the screening voltage to the second set of PWBs for the screening time.

10. A system for testing printed wiring boards (PWBs), comprising:
a test development unit configured to generate electric fields in a first set of PWBs, the PWBs each comprising laminated layers of copper traces separated by dielectric material, to detect dielectric breakdown failures in the first set of PWBs based on the generated electric fields, to generate a dielectric life curve of the first set of PWBs, and, based on the dielectric life curve, to define a screening time and a screening voltage to screen for premature dielectric breakdown failures in a second set of PWBs.

11. The system of claim 10 , further comprising a screening unit configured to test the second set of PWBs for a duration corresponding to the screening time at the screening voltage.

12. The system of claim 10 , wherein the test development unit is configured to characterize the effects of the electric field on the first set of PWBs by applying a voltage to the first set of PWBs that is a multiple of an operating voltage of the first set of PWBs to simulate a life duration of the first set of PWBs in a compacted period of time.

13. The system of claim 10 , wherein the test development unit is configured to select the screening time and screening voltage based on a screening curve generated by fitting the dielectric life curve onto a data point corresponding to a prematurely failed PWB.

14. The system of claim 10 , wherein the test development unit is configured to characterize the effects of the electric field on the first set of PWBs by applying a same voltage level to the conductive traces of the first set of PWBs, and to generate the test data by detecting failure times of the first set of PWBs.

15. The system of claim 14 , wherein the test development unit is configured to define the screening voltage and the screening time by fitting the test data from the first set of PWBs to a PWB life duration curve, and to generate a screening curve by transposing the dielectric life curve.

16. The system of claim 15 , wherein the test development unit is configured to select the screening voltage and the screening time from a data point on the screening curve to test the second set of PWBs.

17. The system of claim 16 , wherein the test development unit is configured to select the screening voltage and the screening time by generating a failure rate curve based on the test data and determining a first time corresponding to a duration of test time at which a threshold percentage of PWBs has failed among the first set of PWBs, and
wherein the test development unit is configured to select the screening voltage and the screening time based on the first time.

18. The system of claim 17 , wherein the first time is determined based on identifying an inflection point of the failure rate curve.

Assignees

• Hamilton Sundstrand Corp

Inventors

• Said Waleed M
• Hansen Harold J
• Kozlu Hamdi
• Desantis Charles V

Classifications

• G01R31/2817 Primary

  Environmental-, stress-, or burn-in tests (of IC's G01R31/2855; of individual semiconductors G01R31/2642; of other circuits G01R31/2849) · CPC title

• G01R31/2801

  Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] (G01R31/318508 takes precedence; contactless testing G01R31/302; testing contacts or connections G01R31/66) · CPC title

• G01R31/12 Primary

  Testing dielectric strength or breakdown voltage {; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing (G01R31/08, G01R31/327 and G01R31/72 take precedence; measuring in plasmas G01R19/0061; measuring dielectric constants G01R27/2617; ESD, EMC or EMP testing of circuits G01R31/002)} · CPC title