Inspecting device and inspecting method

Patent metadata

Field	Value
Publication number	US-9546939-B2
Application number	US-201314441556-A
Country	US
Kind code	B2
Filing date	Nov 25, 2013
Priority date	Dec 11, 2012
Publication date	Jan 17, 2017
Grant date	Jan 17, 2017

Abstract

In a force waveform of an assembled body having an elastic component assembled thereto, in order to specify a deformation start point or a deformation end point of the elastic component as easily as possible, an inspecting device includes: a force-waveform detection system that applies a load to a workpiece having an elastic component in the direction of action of the elastic component and acquires a force waveform; an inspection-parameter designation unit that acts as reception unit in order to receive an input of an arbitrary designated point during a process of deformation; and an inspection unit that calculates a local slope of the force waveform at the designated point, thereby specifying, on the basis of the local slope at the calculated designated point, a physical characteristic change point including the deformation start point or the deformation end point.

First claim

The invention claimed is:

1. An inspecting device comprising:
a force-waveform detection system that
applies a load to an assembled body having an elastic component assembled thereto in a direction of action of the elastic component and
acquires a force waveform describing a relation between the load and an amount of displacement;

a reception unit that receives an input of a designated point during a process of deformation of the elastic component in the force waveform acquired by the force-waveform detection system; and
an inspection unit that
calculates a local slope of the force waveform at the designated point,
calculates a local slope at a focus point different from the designated point, and
determines, on the basis of a comparison between the local slope at the focus point and the local slope at the designated point, whether the focus point is a change point of the force waveform, wherein

the inspection unit
searches for a first focus point that first satisfies, on the basis of the local slope at the designated point and a first parameter, a first condition at least stating that the local slope at the first focus point reaches a first threshold, while moving the first focus point in a direction away from the designated point by using the designated point as a point of the starting,
specifies the first focus point first satisfying the first condition as a first change point,
searches for a second focus point that first satisfies, on the basis of a second parameter, a second condition at least stating that the local slope at the second focus point reaches the local slope at the designated point or is inside of a range between the local slope at the designated point and the slope, while moving the second focus point in a direction approaching the designated point by using the first change point as a point of the starting, and
specifies the second focus point first satisfying the second condition as a second change point.

2. The inspecting device according to claim 1 , wherein
the first condition further states that a difference of loads, which are pieces of data at opposite ends in the force waveform in a preset range that includes the first focus point, exceeds a third parameter.

3. The inspecting device according to claim 1 , wherein
the first threshold is a value obtained by multiplying the local slope at the designated point with the first parameter.

4. The inspecting device according to claim 1 , wherein
the range of the slope, on the basis of the local slope at the designated point and the second parameter, is
from a value obtained by multiplying the local slope at the designated point by a value obtained by subtracting the second parameter from 1
to a value obtained by multiplying the local slope at the designated point with a value obtained by adding the second parameter to 1.

5. The inspecting device according to claim 1 , wherein
the inspection unit
specifies two second change points having the designated point sandwiched therebetween, and
calculates an elastic force of the elastic component at an arbitrary position on the basis of a force waveform between the two second change points.

6. The inspecting device according to claim 1 , wherein
the inspection unit
specifies two second change points having the designated point sandwiched therebetween, and
calculates a modulus of elasticity of the elastic component on the basis of a force waveform between the two second change points.

7. An inspecting method executed by an inspecting device including a force-waveform detection system, a reception unit, and an inspection unit, the inspecting method comprising:
a first step at which the force-waveform detection system
applies a load to an assembled body having an elastic component assembled thereto in a direction of action of the elastic component, and
acquires a force waveform describing a relation between the load and an amount of displacement;

a second step at which the reception unit receives an input of a designated point during a process of deformation of the elastic component in the force waveform acquired by the force-waveform detection system; and
a third step at which the inspection unit
calculates a local slope of the force waveform at the designated point,
calculates a local slope at a focus point different from the designated point, and
determines, on the basis of a comparison between the local slope at the focus point and the local slope at the designated point, whether the focus point is a change point of the force waveform, wherein

the third step includes
a step of searching for a first focus point that first satisfies, on the basis of the local slope at the designated point and a first parameter, a first condition that at least states that the local slope at the first focus point reaches a first threshold, while moving the first focus point in a direction away from the designated point by using the designated point as a point of the starting, thereby specifying the first focus point first satisfying the first condition as a first change point, and
a step of searching for a second focus point that first satisfies, on the basis of a second parameter, a second condition that at least states that the local slope at the second focus point reaches the local slope at the designated point or is inside of a range between the local slope at the designated point and the slope, while moving the second focus point in a direction approaching the designated point by using the first change point as a point of the starting, thereby specifying the second focus point first satisfying the second condition as a second change point.

Assignees

• Mitsubishi Electric Corp

Inventors

• Liu Zhengyong
• Shiratsuchi Koji
• Nagaoka Rintaro

Classifications

• H01H50/00 Primary

  Details of electromagnetic relays ({H01H51/28 takes precedence;} electric circuit arrangements H01H47/00; details of electrically-operated selector switches H01H63/00) · CPC title

• G01N3/00

  Investigating strength properties of solid materials by application of mechanical stress · CPC title

• G01N2203/0288

  Springs · CPC title

• G01M5/0075

  by means of external apparatus, e.g. test benches or portable test systems (G01M5/005 takes precedence) · CPC title

• G01N2203/0208

  Specific programs of loading, e.g. incremental loading or pre-loading · CPC title