Method of inspecting a light source module for defects, method of manufacturing a light source module, and apparatus for inspecting a light source module

Patent metadata

Field	Value
Publication number	US-9546926-B2
Application number	US-201414581147-A
Country	US
Kind code	B2
Filing date	Dec 23, 2014
Priority date	Jun 9, 2014
Publication date	Jan 17, 2017
Grant date	Jan 17, 2017

Abstract

A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided.

First claim

What is claimed is:

1. A method of inspecting a light source module for defects, the method comprising:
preparing a board having thereon a light emitting device and a lens covering the light emitting device;
applying a current to the light emitting device to turn on the light emitting device;
imaging the lens with the light emitting device turned on to obtain an image of the lens;
calculating central symmetry denoting a symmetry of light emission distribution from the center of the lens based on the obtained image;
comparing the calculated central symmetry with a reference value to determine whether unsymmetrical light emission distribution has occurred;
determining central coordinates of the light emitting device mounted on the board;
determining central coordinates of the lens from the obtained image of the lens;
comparing the central coordinates of the light emitting device and the central coordinates of the lens to calculate an offset value; and
comparing the offset value with a reference value to determine whether lens misalignment has occurred.

2. The method of claim 1 , wherein the calculating of central symmetry comprises:
setting an inspection region in the obtained image;
dividing the inspection region into a plurality of sub-regions; and
calculating central symmetry based on luminance of each of the divided sub-regions.

3. The method of claim 2 , wherein, in the setting of the inspection region, a region including areas located at a predetermined distance from a center of the lens is set as the inspection region.

4. The method of claim 2 , wherein the dividing of the inspection region into the plurality of sub-regions comprises first dividing the inspection region into a plurality of tracks each including areas located within a predetermined range of distances from the center of the lens, and secondly dividing each of the plurality of tracks radially into the plurality of sub-regions.

5. The method of claim 1 , wherein the current applied in the operation of turning on the light emitting device is a current equal to or more than 50% of a rated current for driving the light emitting device.

6. The method of claim 1 , wherein the determining of central coordinates of the lens comprises:
recognizing fiducial markers formed on the board and the position of the lens from the obtained image;
determining the central coordinates of the lens based on identifying edges of the lens in the obtained image; and
converting the central coordinates of the lens into actual coordinates based on the fiducial markers.

7. The method of claim 1 , wherein the determining of central coordinates of the light emitting device is performed after the light emitting device is mounted on the board and before the lens is installed to cover the light emitting device.

8. The method of claim 1 , wherein the light emitting device mounted on the board is a plurality of light emitting devices, the plurality of light emitting devices are arranged in a longitudinal direction of the board, and the imaging, calculating, and comparing steps are performed individually for each light emitting device of the plurality of light emitting devices.

9. The method of claim 1 , wherein the light emitting device is a light emitting diode (LED) chip or an LED package including an LED chip.

10. A method of inspecting a light source module for defects, the method comprising:
preparing a board having thereon a light emitting device and a lens covering the light emitting device;
applying a current to the light emitting device to turn on the light emitting device;
imaging the lens with the light emitting device turned on to obtain an image of the lens;
determining central coordinates of the lens from the obtained image of the lens;
comparing central coordinates of the light emitting device with the determined central coordinates of the lens to calculate an offset value between the central coordinates; and
comparing the offset value with a reference value to determine whether lens misalignment has occurred.

11. The method of claim 10 , further comprising determining the central coordinates of the light emitting device mounted on the board,
wherein the step for determining the central coordinates of the light emitting device is performed after the light emitting device is mounted on the board and before the lens is installed to cover the light emitting device.

12. A method of manufacturing a light source module, the method comprising:
determining central coordinates of a light emitting device mounted on a board;
installing a lens to cover the light emitting device;
applying a current to the light emitting device to turn on the light emitting device;
imaging the lens covering the light emitting device with the light emitting device turned on to obtain an image of the lens;
determining central coordinates of the lens from the obtained image of the lens;
comparing the central coordinates of the light emitting device with the central coordinates of the lens to calculate an offset value between the central coordinates; and
comparing the offset value with a reference value to determine whether a lens is misaligned.

13. The method of claim 12 , wherein the determining of central coordinates of the light emitting device is performed using automatic optical inspection (AOI).

14. The method of claim 12 , wherein the determining of central coordinates of the lens comprises:
recognizing fiducial markers formed on the board and the position of the lens from the obtained image;
determining the central coordinates of the lens based on identifying edges of the lens in the obtained image; and
converting the central coordinates of the lens into actual coordinates based on the fiducial markers.

15. The method of claim 12 , further comprising determining whether unsymmetrical light emission distribution has occurred from the light emitting device,
wherein the determining whether unsymmetrical light emission distribution has occurred comprises:
calculating central symmetry denoting a symmetry of light emission distribution from the center of the lens based on the obtained image; and
comparing the calculated central symmetry with a reference value to determine whether unsymmetrical light emission distribution has occurred.

16. The method of claim 15 , wherein the determining whether unsymmetrical light emission distribution has occurred in the light emitting device and the determining whether lens misalignment has occurred are performed based on the same obtained image.

17. The method of claim 12 , wherein the installing of the lens comprises attaching the lens to the board using an adhesive.

18. The method of claim 12 , wherein the light emitting device mounted on the board includes a plurality of light emitting devices, and the plurality of light emitting devices are arranged in a longitudinal direction of the board.

19. The method of claim 18 , wherein the steps for determining central coordinates, for installing a lens, for imaging the lens, and for calculating central symmetry are performed individually for each light emitting device of the plurality of light emitting devices.

Assignees

• Samsung Electronics Co Ltd

Inventors

• Ji Won Soo
• Kwon Oh Seok
• Park Dae Seo
• Lee Ka Ram

Classifications

• G01J2001/4252

  for testing LED's · CPC title

• G01J1/42 Primary

  using electric radiation detectors (optical or mechanical part G01J1/04; by comparison with a reference light or electric value G01J1/10) · CPC title

• G01M11/0278 Primary

  Detecting defects of the object to be tested, e.g. scratches or dust (investigating the presence of flaws or contamination on materials by optical means G01N21/88) · CPC title

• G01M11/0257

  by analyzing the image formed by the object to be tested · CPC title