Method for recalibrating coordinate positioning apparatus

US9542355B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9542355-B2
Application numberUS-201113704861-A
CountryUS
Kind codeB2
Filing dateJul 5, 2011
Priority dateJul 7, 2010
Publication dateJan 10, 2017
Grant dateJan 10, 2017

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A method and corresponding apparatus are described for recalibrating coordinate positioning apparatus after a disturbance, such as a stylus replacement. The coordinate positioning apparatus includes a platform, a measurement probe and a probe head for reorienting the measurement probe relative to the platform. A calibration data set is taken for the coordinate positioning apparatus that includes datum data for a plurality of orientations of the measurement probe. The datum data includes at least first datum data for a first nominal orientation of the measurement probe. After a disturbance to the coordinate positioning apparatus, the calibration data set is updated by acquiring one or more position measurements and calculating a first correction from the one or more position measurements. The first correction describes any change in the first datum data following the disturbance and is used to update the datum data for plurality of different orientations of the measurement probe. Corresponding apparatus is also described.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for measuring an object using a coordinate positioning apparatus comprising a platform, a measurement probe having a replaceable stylus, and a probe head for reorienting the measurement probe relative to the platform, the method comprising the steps of: (i) taking a first calibration data set for the coordinate positioning apparatus that comprises datum data for a plurality of orientations of the measurement probe, the first calibration data set defining a calibration of the coordinate positioning apparatus when the measurement probe comprises a first stylus, and the datum data including first datum data for a first nominal orientation of the measurement probe; (ii) replacing the first stylus of the measurement probe with a second stylus that is nominally identical to the first stylus; (iii) updating the first calibration data set to generate a second calibration data set that defines the calibration of the coordinate positioning apparatus when the measurement probe comprises the second stylus, the step (iii) comprising the steps of: (a) using the coordinate positioning apparatus to acquire one or more position measurements, (b) calculating a first correction from the one or more position measurements, the first correction describing any change in the first datum data following the replacement of the first stylus with the second stylus, and (c) updating the datum data for a plurality of different orientations of the measurement probe using the first correction to thereby generate the second calibration data set; and (iv) using the coordinate positioning apparatus, with the second calibration data set, to measure an object. 2. A method according to claim 1 , wherein: the platform is moveable in a machine coordinate system and the measurement probe has a reference measurement point; the first datum data comprises a vector describing the position of the reference measurement point of the measurement probe relative to a point in the machine coordinate system for the first nominal orientation of the measurement probe; and the first correction comprises a first offset vector describing a shift in the reference measurement point of the measurement probe relative to the point in the machine coordinate system for the first nominal orientation of the measurement probe. 3. A method according to claim 2 , wherein the measurement probe comprises a probe housing, the first and second styluses each have a substantially spherical stylus tip, each of the first and second styluses is deflectable from a neutral position, and the reference measurement point of the measurement probe comprises the centre of the spherical stylus tip when one of the first and second styluses is in the neutral position. 4. A method according to claim 1 , wherein: the coordinate positioning apparatus comprises a calibration artefact of known position; and the step (a) further comprises placing the measurement probe in the first nominal orientation and measuring a first apparent position of the calibration artefact, the first correction being calculated from the difference between the first apparent position of the calibration artefact and the known position of the calibration artefact. 5. A method according to claim 4 , wherein: the step (a) further, comprises placing the measurement probe in at least one further nominal orientation and measuring at least one further apparent position of the calibration artefact; at least one further correction is calculated from the difference between the at least one further apparent position of the calibration artefact and the known position of the calibration artefact; and an average correction is calculated from the first correction and the at least one further correction, the datum data for a plurality of different orientations of the measurement probe being updated using the average correction. 6. A method according to claim 4 , wherein: the step (a) further comprises placing the measurement probe in at least one further nominal orientation and measuring at least one further apparent position of the calibration artefact; at least one further correction is calculated from the difference between the at least one further apparent position of the calibration artefact and the known position of the calibration artefact; and the first correction and the at least one further correction are used to determine if there has been any rotation and/or translation of the probe head relative to the platform as a result of replacing the first stylus of the measurement probe with the second stylus. 7. A method according to claim 6 , comprising the step of calculating a head movement correction to account for any rotation and/or translation of the probe head relative to the platform, wherein the head movement correction is used to update the datum data for a plurality of different orientations. 8. A method according to claim 4 , wherein: the calibration artefact comprises a sphere; and the measurement of the first apparent position of the calibration artefact comprises measuring a plurality of points on the sphere surface and calculating therefrom the position of the sphere centre. 9. A method according to claim 4 , wherein the first calibration data set was previously established by measuring the calibration artefact, the calibration artefact having remained affixed to the coordinate positioning apparatus in the same location since calibration. 10. A method according to claim 1 , wherein: the coordinate positioning apparatus comprises a calibration artefact located in an unknown position; the step (a) comprises placing the measurement probe in at least three different nominal orientations and measuring an apparent position of the calibration artefact for each of the at least three different nominal orientations of the measurement probe; and the first correction is calculated from the at least three apparent positions of the calibration artefact. 11. A method according to claim 1 , wherein the probe head comprises an indexing probe head that permits the measurement probe to adopt a plurality of nominally repeatable indexed orientations relative to the platform. 12. A method according to claim 1 , wherein the probe head comprises a continuous probe head that allows the measurement probe to be freely rotated into different orientations, the continuous probe head comprising at least one encoder for measuring the orientation of the measurement probe. 13. A method according to claim 1 , wherein the step (c) comprises using a rotation function to apply the first correction to datum data for different orientations of the measurement probe. 14. A method according to claim 1 , wherein: the measurement probe comprises an analogue probe; the first and second calibration data sets each comprise at least one probe transformation matrix for converting measurements taken by the analogue probe in a local coordinate system into measurements in a machine coordinate system; and, the at least one probe transformation matrix remains unaltered during the step (c). 15. A method according to claim 1 , wherein the measurement probe comprises a touch trigger probe. 16. A method according to claim 1 , wherein the step (i) comprises retrieving a previously determined set of calibration data.

Assignees

Inventors

Classifications

  • G06F15/00Primary

    Digital computers in general (details G06F1/00 – G06F13/00); Data processing equipment in general · CPC title

  • G01B21/042Primary

    Calibration or calibration artifacts (G01B3/30, G01B9/02072 take precedence) · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9542355B2 cover?
A method and corresponding apparatus are described for recalibrating coordinate positioning apparatus after a disturbance, such as a stylus replacement. The coordinate positioning apparatus includes a platform, a measurement probe and a probe head for reorienting the measurement probe relative to the platform. A calibration data set is taken for the coordinate positioning apparatus that include…
Who is the assignee on this patent?
Somerville Leo Christopher, Renishaw Plc
What technology area does this patent fall under?
Primary CPC classification G06F15/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 10 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).