Screening method for electrolytic capacitors

Patent metadata

Field	Value
Publication number	US-9541607-B2
Application number	US-201313966316-A
Country	US
Kind code	B2
Filing date	Aug 14, 2013
Priority date	Aug 31, 2012
Publication date	Jan 10, 2017
Grant date	Jan 10, 2017

Abstract

A method of iteratively screening a sample of electrolytic capacitors having a predetermined rated voltage is provided. The method can include measuring a first leakage current of a first set of capacitors, calculating a first mean leakage current therefrom, and removing capacitors from the first set having a first leakage current equal to or above a first predetermined value, thereby forming a second set of capacitors. The second set can be subjected to a burn in heat treatment where a test voltage can be applied, then a second leakage current of the second set of capacitors can be measured and a second mean leakage current can be calculated. Capacitors having a second leakage current equal to or above a second predetermined value can be removed from the second set, forming a third set of capacitors. Because of such iterative screening, the capacitors in the third set have low failure rates.

First claim

What is claimed is:

1. A method of iteratively screening a lot of electrolytic capacitors having a predetermined rated voltage, the method comprising:
measuring a first leakage current of a first set of capacitors in the lot and calculating a first mean leakage current therefrom;
removing capacitors from the first set that have a measured first leakage current equal to or above a first predetermined value, thereby forming a second set of capacitors to be subjected to additional testing, the first predetermined value being equal to one or more standard deviations above the first mean leakage current;
subjecting the second set of capacitors to a burn in treatment, wherein the burn in treatment comprises applying a predetermined test voltage to the capacitors that is from about 0.8 to about 1.2 times the rated voltage;
after the burn in treatment, measuring a second leakage current of the second set of capacitors and calculating a second mean leakage current therefrom; and
removing capacitors from the second set that have a measured second leakage current equal to or above a second predetermined value, thereby forming a third set of capacitors to be subjected to additional testing, the second predetermined value being equal to one or more standard deviations above the second mean leakage current.

2. The method of claim 1 , wherein the first leakage current is determined at a temperature ranging from about 20° C. to about 150° C.

3. The method of claim 1 , wherein the first predetermined value is equal to three or more standard deviations above the first mean leakage current.

4. The method of claim 1 , wherein the burn in heat treatment occurs for a time period ranging from about 25 hours to about 75 hours.

5. The method of claim 1 , wherein the predetermined test voltage ranges from about 0.9 to about 1.1 times the predetermined rated voltage.

6. The method of claim 1 , wherein the burn in heat treatment is conducted at a temperature ranging from about 100° C. to about 150° C.

7. The method of claim 1 , wherein the second leakage current is determined at a temperature ranging from about 20° C. to about 150° C.

8. The method of claim 1 , wherein the second predetermined value is equal to three or more standard deviations above the second mean leakage current.

9. The method of claim 1 , further comprising soldering the first set, second set, and/or third set of capacitors via a reflow process.

10. The method of claim 9 , wherein the reflow process occurs in a convection oven at a peak temperature profile ranging from about 200° C. to about 280° C.

11. The method of claim 9 , wherein the second set of capacitors are soldered via the reflow process, wherein the soldering occurs between the burn in heat treatment and the second leakage current measurement.

12. The method of claim 9 , wherein the third set of capacitors are soldered via the reflow process.

13. The method of claim 1 , further comprising the steps of:
measuring a third leakage current of the third set of capacitors and calculating a third mean leakage current therefrom;
removing capacitors from the third set that have a measured third leakage current equal to or above a third predetermined value, the third predetermined value being equal to one or more standard deviations above the third mean leakage current.

14. The method of claim 13 , wherein the third leakage current is determined at a temperature ranging from about 15° C. to about 35° C.

15. The method of claim 13 , wherein the third predetermined value is equal to three or more standard deviations above the third mean leakage current.

16. The method of claim 1 , wherein the capacitors are solid electrolytic capacitors.

17. The method of claim 16 , wherein the solid electrolytic capacitors are hermetically sealed.

18. The method of claim 1 , wherein the capacitors are wet electrolytic capacitors.

19. The method of claim 1 , wherein the capacitors comprise an anode that contains tantalum or niobium oxide.

20. The method of claim 1 , wherein the first predetermined value is less than the product of 0.01 times the capacitance times the rated voltage of the capacitors.

21. The method of claim 1 , wherein the first set includes all of the capacitors in the lot.

22. The method of claim 1 , wherein multiple lots of capacitors are iteratively screened.

23. The method of claim 22 , further comprising using a mean leakage current for each of the multiple lots of capacitors to calculate a grand mean leakage current therefrom, wherein the mean leakage current for each of the multiple lots of capacitors is the mean leakage current for the second set, the third set, or any other subsequent set of iteratively screened capacitors in the lot; and removing any lots having a mean leakage current equal to or above a fourth predetermined value, the fourth predetermined value being equal to one or more standard deviations above the grand mean leakage current.

24. The method of claim 23 , wherein the fourth predetermined value is equal to three or more standard deviations above the grand mean leakage current.

25. The method of claim 1 , further comprising determining a predicted failure rate for the lot of capacitors, wherein a calculation to determine the predicted failure rate excludes capacitors removed from the first set.

26. The method of claim 25 , where the predicted failure rate calculation utilizes a voltage acceleration factor based on a voltage applied to the lot of capacitors during a life testing process and a temperature acceleration factor based on a temperature at which the life testing process occurs.

27. The method of claim 25 , where the predicted failure rate ranges from about 0.00001% failures per 1000 hours to about 0.008% failures per 1000 hours as determined at a confidence level of about 99.9%.

Assignees

• Avx Corp

Inventors

• Millman William A
• Beaulieu Marc V
• Miller Michael I
• Leinonen Mark W

Classifications

• H10P74/00

  Testing or measuring during manufacture or treatment of wafers, substrates or devices · CPC title

• G01R31/64 Primary

  Testing of capacitors · CPC title

• G01R31/2849

  Environmental or reliability testing, e.g. burn-in or validation tests (of individual semiconductors G01R31/2642; of printed circuits boards G01R31/2817; of IC's G01R31/2855) · CPC title

• H01G9/15

  Solid electrolytic capacitors (H01G11/00 takes precedence) · CPC title

• H01G9/008

  Terminals · CPC title