Resist underlayer film-forming composition containing copolymer resin having heterocyclic ring
US-9261790-B2 · Feb 16, 2016 · US
US9540476B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9540476-B2 |
| Application number | US-201414569610-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 12, 2014 |
| Priority date | Dec 12, 2013 |
| Publication date | Jan 10, 2017 |
| Grant date | Jan 10, 2017 |
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Polymeric reaction products of certain aromatic alcohols with certain aromatic aldehydes are useful as underlayers in semiconductor manufacturing processes.
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What is claimed is: 1. A reaction product formed from a combination comprising one or more first monomers of the formula wherein Y is selected from H, C 1 -C 30 alkyl, C 2 -C 30 alkenyl, C 7 -C 30 aralkyl, C 6 -C 30 aryl, substituted C 6 -C 30 aryl, —C 1 -C 30 alkylene-OR 1 , and —C 1 -C 30 alkylidene-OR 1 ; each R is independently selected from C 1 -C 30 alkyl, C 2 -C 30 alkenyl, C 7 -C 30 aralkyl, C 6 -C 30 aryl, substituted C 6 -C 30 aryl, —OR 1 , —C 1 -C 30 alkylene-OR 1 , and —C 1 -C 30 alkylidene-OR 1 ; R 1 is selected from H, C 1 -C 30 alkyl, C 6 -C 30 aryl, substituted C 6 -C 30 aryl, and C 7 -C 30 aralkyl; and n is an integer selected from 0 to 7; and one or more second monomers of the formula Ar—CHO, where Ar is a C 10 -C 30 aromatic moiety having at least 2 fused aromatic rings, which may optionally be substituted with one or more of C 1 -C 30 alkyl, C 2 -C 30 alkenyl, C 7 -C 30 aralkyl, C 6 -C 30 aryl, substituted C 6 -C 30 aryl, —OR 3 , —C 1 -C 30 alkylene-OR 3 and —C 1 -C 30 alkylidene-OR 3 ; R 3 is selected from H, C 1 -C 30 alkyl, and C 6 -C 30 aryl. 2. The reaction product of claim 1 wherein n=0 to 4. 3. The reaction product of claim 1 wherein each R is independently selected from C 1 -C 20 alkyl, C 2 -C 20 alkenyl, C 7 -C 30 aralkyl, C 6 -C 30 aryl, substituted C 6 -C 30 aryl, —OR 1 , —C 1 -C 12 alkylene-OR 1 , and —C 1 -C 20 alkylidene-OR 1 . 4. The reaction product of claim 1 wherein second monomer is substituted with one or more hydroxyls. 5. The reaction product of claim 1 wherein Ar is a C 10 -C 30 aromatic moiety having 2 to 5 fused aromatic rings. 6. A process for preparing a reaction product comprising reacting one or more first monomers of the formula wherein Y is selected from H, C 1 -C 30 alkyl, C 2 -C 30 alkenyl, C 7 -C 30 aralkyl, C 6 -C 30 aryl, substituted C 6 -C 30 aryl, —C 1 -C 30 alkylene-OR 1 , and —C 1 -C 30 alkylidene-OR 1 ; each R is independently selected from C 1 -C 30 alkyl, C 2 -C 30 alkenyl, C 7 -C 30 aralkyl, C 6 -C 30 aryl, substituted C 6 -C 30 aryl, —OR 1 , —C 1 -C 30 alkylene-OR 1 , and —C 1 -C 30 alkylidene-OR 1 ; R 1 is selected from H, C 1 -C 30 alkyl, C 6 -C 30 aryl, substituted C 6 -C 30 aryl, and C 7 -C 30 aralkyl; and n is an integer selected from 0 to 7; with one or more second monomers of the formula Ar—CHO, where Ar is a C 10 -C 30 aromatic moiety having at least 2 fused aromatic rings, which may optionally be substituted with one or more of C 1 -C 30 alkyl, C 2 -C 30 alkenyl, C 7 -C 30 aralkyl, C 6 -C 30 aryl, substituted C 6 -C 30 aryl, —OR 3 , —C 1 -C 30 alkylene-OR 3 and —C 1 -C 30 alkylidene-OR 3 ; R 3 is selected from H, C 1 -C 30 alkyl, and C 6 -C 30 aryl in the presence of an acid, and optionally in a solvent. 7. The process of claim 6 wherein the solvent is polar. 8. The process of claim 6 wherein the acid is selected from dicarboxylic acids, mineral acids and sulfonic acids. 9. A polymeric reaction product produced by the process of claim 6 . 10. A composition comprising the reaction product of claim 1 , organic solvent, and optionally one or more additives chosen from curing agents, crosslinking agents, and surfactants. 11. A process of forming a patterned layer comprising disposing a layer of the composition of claim 10 on a substrate; removing organic solvent to form a reaction product layer; disposing a layer of a photoresist on the reaction product layer; exposing the photoresist layer to actinic radiation through a mask; developing the exposed photoresist layer to form a resist pattern; and transferring the pattern to the reaction product layer to expose portions of the substrate. 12. The process of claim 11 further comprising the steps of patterning the substrate; and then removing the patterned reaction product layer. 13. The process of claim 11 further comprising the steps of disposing a conformal silicon-containing layer over the patterned reaction product layer and exposed portions of the substrate; partially etching the silicon-containing layer to expose a top surface of the patterned polymeric reaction product layer and a portion of the substrate.
by chemical means · CPC title
using masks for insulating materials · CPC title
Multilayer resist systems, e.g. planarising layers · CPC title
characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement · CPC title
of aldehydes · CPC title
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