Testing of a photovoltaic panel

Patent metadata

Field	Value
Publication number	US-9537445-B2
Application number	US-201514954209-A
Country	US
Kind code	B2
Filing date	Nov 30, 2015
Priority date	Dec 4, 2008
Publication date	Jan 3, 2017
Grant date	Jan 3, 2017

Abstract

A method for testing a photovoltaic panel connected to an electronic module. The electronic module includes an input attached to the photovoltaic panel and a power output. The method activates a bypass to the electronic module. The bypass provides a low impedance path between the input and the output of the electronic module. A current is injected into the electronic module thereby compensating for the presence of the electronic module during the testing. The current may be previously determined by measuring a circuit parameter of the electronic module. The circuit parameter may be impedance, inductance, resistance or capacitance.

First claim

The invention claimed is:

1. A method, comprising:
measuring a parameter of an electronic module, the electronic module comprising an input attached to an output of a photovoltaic panel;
activating a bypass link between the input of the electronic module and an output of the electronic module by applying an electromagnetic field or a magnetic field to the bypass link;
performing, while the bypass link is activated, a flash test on the photovoltaic panel based on the measured parameter; and
deactivating the bypass link between the input of the electronic module and the output of the electronic module.

2. The method of claim 1 , wherein the parameter is shunt impedance and wherein performing flash testing on the photovoltaic panel based on the measured parameter comprises injecting a current into the electronic module, the current based on a measured shunt impedance.

3. The method of claim 1 , wherein the bypass link comprises a fuse and wherein deactivating the bypass link comprises blowing the fuse.

4. The method of claim 1 , wherein activating the bypass link between the input of the electronic module and the output of the electronic module creates a low impedance path between the input of the electronic module and the output of the electronic module.

5. The method of claim 1 , wherein the bypass link compensates for a series equivalent impedance of the electronic module.

6. The method of claim 4 , further comprising creating the low impedance path with the bypass link with one of a reed switch, a reed relay switch, or a solid state switch.

7. The method of claim 6 , further comprising creating the low impedance path with the bypass link by externally applying the electromagnetic field or the magnetic field to one of the reed switch, the reed relay switch, or the solid state switch.

8. The method of claim 1 , further comprising: performing, with the electronic module, one of DC to DC conversion, DC to AC conversion or maximum power point tracking.

9. A device comprising:
an electronic module comprising at least one power output and at least one input configured to be attached to an output of a photovoltaic panel;
a bypass link operatively attached to the at least one input of the electronic module and the at least one power output of the electronic module, the bypass link configured to be deactivated subsequent to a completion of a flash test on the photovoltaic panel;
a processor configured to program a programmable current injector based on a measured circuit parameter; and
a flash test module configured to perform the flash test on the photovoltaic panel.

10. The device of claim 9 , wherein the electronic module performs maximum power point tracking.

11. The device of claim 9 , wherein the electronic module performs either DC to DC conversion or DC to AC inversion.

12. The device of claim 9 , wherein the programmable current injector is configured to inject a quantity of current into the electronic module based on the measured circuit parameter.

13. The device of claim 9 wherein the measured circuit parameter is selected from the group consisting of: impedance, inductance, resistance, and capacitance.

14. The device of claim 13 , wherein the bypass link is configured to be activated during the performing of the flash test by application of an electromagnetic field or a magnetic field.

15. The device of claim 9 , wherein the bypass link includes at least one switch and a fuse, wherein the bypass link is configured to be activated during the performing of the flash test by application of an electromagnetic field or a magnetic field, and wherein deactivation of the bypass link comprises blowing the fuse.

16. The device of claim 15 , wherein the bypass link, when activated, creates a low impedance path between the at least one input of the electronic module and the at least one power output of the electronic module, and when deactivated, creates a high impedance path between the at least one input of the electronic module and the at least one power output of the electronic module.

17. The device of claim 15 , wherein the at least one switch includes a magnetically activated reed switch, an electro-magnetically activated reed relay switch, or a solid state switch.

18. A method, comprising:
programming a current injector based on a measured circuit parameter;
activating a bypass link between an input of an electronic module and an output of the electronic module, wherein the electronic module comprises at least one input attached to an output of a photovoltaic panel;
performing, while the bypass link is activated, a flash test on the photovoltaic panel based on the measured circuit parameter; and
deactivating the bypass link between the input of the electronic module and the output of the electronic module.

19. The method of claim 18 , wherein the measured circuit parameter comprises a measured shunt impedance of the electronic module and wherein performing the flash test comprises injecting a current into the electronic module based on the measured shunt impedance.

20. The method of claim 18 , wherein the bypass link includes a fuse and at least one switch, wherein activating the bypass link comprises applying an electromagnetic field or a magnetic field to the bypass link, and wherein deactivation of the bypass link comprises blowing the fuse.

Assignees

• Solaredge Technologies Ltd
• Solaredge Technologies Ltd

Inventors

• Adest Meir
• Sella Guy
• Handelsman Lior
• Galin Yoav
• Fishelov Amir
• Gazit Meir
• Glovinsky Tzachi
• Binder Yaron

Classifications

• H02S50/10 Primary

  Testing of PV devices, e.g. of PV modules or single PV cells (testing of semiconductor devices during manufacturing {H10P74/00}) · CPC title

• Y02E10/50

  Photovoltaic [PV] energy · CPC title

• G01R31/40

  Testing power supplies (testing photovoltaic devices H02S50/10) · CPC title

• H02S50/15 Primary

  using optical means, e.g. using electroluminescence · CPC title

• H02M7/48

  using discharge tubes with control electrode or semiconductor devices with control electrode · CPC title