MALDI mass spectrometer with irradiation trace formation means and irradiation trace identifier for identifying a MALDI sample plate

Patent metadata

Field	Value
Publication number	US-9536716-B2
Application number	US-201113029040-A
Country	US
Kind code	B2
Filing date	Feb 16, 2011
Priority date	Feb 18, 2010
Publication date	Jan 3, 2017
Grant date	Jan 3, 2017

Abstract

When a sample plate 3 is set on a sample stage 2 , an irradiation trace formation controller 22 appropriately moves the sample stage 2 and throws a short pulse of high-power laser beam to create an irradiation trace at a predetermined position on the sample plate 3 . The irradiation trace has a unique shape. A microscopic image of the irradiation trace is captured and saved in an image storage section 32 . After the sample plate 3 is temporarily removed from the stage 2 to apply a matrix to a sample, the sample plate 3 is re-set on the same stage 2 . Then, the displacement of the sample plate 3 from its original position is calculated from the difference in the position of the irradiation trace between an image taken at that point in time and the image previously stored in the image storage section 32 . Based on the calculated result, an analysis position corrector 24 modifies the position information of an area selected by an operator. Thus, the displacement of the re-set sample plate can be accurately detected. There is no need to use a special sample plate previously processed for creating a marker for displacement detection.

First claim

What is claimed is:

1. A mass spectrometer comprising:
an apparatus body in which a removable sample plate can be set and an ion source for ionizing a sample by a matrix assisted laser desorption ionization method including successive steps of applying a matrix to a sample held on the sample plate removed from the apparatus body, setting the sample plate in the apparatus body, and throwing a laser beam from a laser irradiation unit onto the sample with the matrix applied thereto to ionize the sample;
an irradiation trace formation means for forming an irradiation trace on the sample plate by throwing a laser beam from the laser irradiation unit to a predetermined position on the sample plate when the sample plate is set in the apparatus body, the laser beam having a higher energy than in the process of ionizing the sample;
a reference image capture means for capturing a microscopic image including the irradiation trace on the sample plate when the sample plate carrying the sample with no matrix applied thereto and having the irradiation trace formed thereon is set in the apparatus body, and for saving the captured image as a reference image; and

an irradiation trace identifier for recognizing a visual feature of the irradiation trace and identifying the sample plate on the basis of the visual feature of the irradiation trace.

2. The mass spectrometer according to claim 1 , further comprising:
an information memory means for using, as an identifier, the visual feature of the irradiation trace formed on the sample plate by the irradiation trace formation means, for associating information relating to the sample plate, the measurement or the sample with the identifier, and for memorizing this information; and
an information retrieval means for recognizing the visual feature of the irradiation trace on a microscopic image of the sample plate taken when the sample plate is set in the apparatus body, and for referring to the information memory means to retrieve and output the information corresponding to the sample plate concerned.

3. The mass spectrometer according to claim 1 , wherein information relating to the sample plate or the measurement is associated with an arrangement or pattern of a plurality of irradiation traces formed on the sample plate by the irradiation trace formation means so that the sample plate itself can hold the aforementioned information.

4. The mass spectrometer according to claim 1 , further comprising:
an x-y plane displacement detection means for calculating magnitude and direction of an x-y plane displacement of the sample plate occurring when the sample plate is re-set in the apparatus body, based on a change in an x-y plane position of the irradiation trace observed on both the reference image and a microscopic image including the irradiation trace on the sample plate, the latter image being obtained when the sample plate carrying the sample with the matrix applied thereto is set in the apparatus body; and
an x-y plane displacement correction means for changing a relative x-y plane position between the laser beam from the laser irradiation unit and the sample so as to cancel the x-y plane displacement calculated by the x-y plane displacement detection means, before a mass analysis is performed on an area of analysis on the sample, the area of analysis being selected with reference to a microscopic image of the sample captured concurrently with the capturing of the reference image.

5. The mass spectrometer according to claim 4 , wherein the irradiation trace identifier shows an alert or prohibits an initiation of a mass analysis when a sample plate with a matrix applied thereto is set in the apparatus body and there is no reference image that shows an irradiation trace having a same visual feature as that of the irradiation trace on the sample plate.

6. The mass spectrometer according to claim 1 , wherein the irradiation trace is a deformation of the surface of the sample plate by application of laser heat.

7. The mass spectrometer according to claim 1 , wherein the irradiation trace is a pit or a hole.

8. A mass spectrometer comprising:
an apparatus body in which a removable sample plate can be set and an ion source for ionizing a sample by a matrix assisted laser desorption ionization method including successive steps of applying a matrix to a sample held on the sample plate removed from the apparatus body, setting the sample plate in the apparatus body, and throwing a laser beam from a laser irradiation unit onto the sample with the matrix applied thereto to ionize the sample;
a reference image capture means for capturing a microscopic image of the surface of the sample plate when the sample plate carrying the sample with no matrix applied thereto is set in the apparatus body, and for saving the captured image as a reference image;
a scratch pattern identifier for recognizing a visual feature of a scratch pattern inherently and uniquely formed thereon and identifying the sample plate on the basis of the visual feature of the scratch pattern;
an x-y plane displacement detection means for calculating magnitude and direction of an x-y plane displacement of the sample plate occurring when the sample plate is re-set in the apparatus body, based on a change in an x-y plane position of the scratch pattern recognized on both the reference image and a microscopic image of a surface of the sample plate, the latter image being obtained when the sample plate carrying the sample with the matrix applied thereto is set in the apparatus body, and the scratch pattern being formed on the surface of the sample plate in a process of producing the sample plate; and
an x-y plane displacement correction means for changing a relative x-y plane position between the laser beam from the laser irradiation unit and the sample so as to cancel the x-y plane displacement calculated by the x-y plane displacement detection means, before a mass analysis is performed on an area of analysis on the sample, the area of analysis being selected with reference to a microscopic image of the sample captured concurrently with the capturing of the reference image.

9. A mass spectrometer comprising:
an apparatus body in which a removable sample plate can be set and an ion source for ionizing a sample by a matrix assisted laser desorption ionization method including successive steps of applying a matrix to a sample held on the sample plate removed from the apparatus body, setting the sample plate in the apparatus body, and throwing a laser beam from a laser irradiation unit onto the sample with the matrix applied thereto to ionize the sample;
a reference image capture means for capturing a microscopic image including a corner of the sample plate when the sample plate carrying the sample with no matrix applied thereto is set in the apparatus body, and for saving the captured image as a reference image;
an identifier for recognizing a visual feature of a projection of a corner of the sample plate, the projection being inherently and uniquely formed, and identifying the sample plate on the basis of the visual feature of the projection of the corner of the sample plate;
an x-y plane displacement detection means for calculating magnitude and direction of an x-y plane displacement of the sample plate occurring when the sample plate is re-set in the apparatus body, based on a change in the x-y plane position of the corner recognized on both the reference image and a microscopic image including the corner of the sample plate, the latter image being obtained when the sample plate carrying the sample with the matrix applied thereto is set in the apparatus body; and
an x-y plane displacement correction means for changing a relative x-y plane position between the

Assignees

• Ikegami Masahiro
• Harada Takahiro
• Shimadzu Corp

Inventors

• Ikegami Masahiro
• Harada Takahiro

Classifications

• H01J49/0009

  Calibration of the apparatus · CPC title

• H01J49/0004 Primary

  Imaging particle spectrometry · CPC title