Method for calibrating a cable and respective measuring device

Patent metadata

Field	Value
Publication number	US-9535150-B1
Application number	US-201514791390-A
Country	US
Kind code	B1
Filing date	Jul 3, 2015
Priority date	Jun 12, 2015
Publication date	Jan 3, 2017
Grant date	Jan 3, 2017

Abstract

A measuring device comprises at least one port, an external cable connected to the at least one port, a transmitter connected to the at least one port through a switch, a receiver connected to the at least one port through the switch and a reference path connecting the transmitter with the receiver through the switch. The cable is connected to calibration elements, e.g., short and open. The switch alternately switch in a manner that in a first state the transmitter and the receiver are connected to the at least one port and that in a second state the transmitter and the receiver are connected via the reference path.

First claim

What is claimed is:

1. A method comprising:
providing a first signal, from a transmitter of a measuring device, to a first calibration element connected to a port of the measuring device via one or more cables;
receiving, by a receiver of the measuring device, a first return signal reflected by the first calibration element, and measuring the first return signal;
providing a second signal, from the transmitter to the receiver, through a reference path of the measuring device, and measuring a reference signal through the reference path; and
wherein the measurement of the reference signal is performed via a signal splitter arranged between a switch and the port of the measuring device, wherein the signal splitter comprises a resistive splitter of a star configuration, and wherein a first resistor is connected to the transmitter through the switch, a second resistor is connected to the receiver through the switch and a third resistor is connected to a one of the cables through the port.

2. The method of claim 1 , wherein the first calibration element is a short.

3. The method of claim 1 , further comprising:
providing a third signal, from the transmitter of the measuring device, to a second calibration element connected to the port of the measuring device;
receiving, by the receiver of the measuring device, a second return signal reflected by the second calibration element, and measuring the second return signal;
providing a fourth signal, from the transmitter to the receiver, through the reference path of the measuring device, and measuring the reference signal through the reference path.

4. The method of claim 3 , wherein the second calibration element is an open.

5. The method of claim 3 , wherein steps recited by claim 1 and the steps recited by claim 3 are alternately repeated a number of times.

6. The method of claim 3 , wherein the steps are repeated for at least one different frequency for one or more of the first signal, the second signal, the third signal and the fourth signal.

7. The method of claim 1 , wherein a magnitude and a phase of one or more of the first return signal and reference signal and the second return signal and reference signal are measured, and wherein the measurement of the phase is completed before the measurement of the magnitude.

8. A measuring device comprising a port;
an external cable connected to the port;
a transmitter connected to the port through a switch;
a receiver connected to the port through the switch;
a reference path connecting the transmitter to the receiver through the switch; and
a signal splitter arranged between the switch and the port, wherein the signal comprised a plurality of resistors in a star configuration, with a first resistor connected to the transmitter through the switch, a second resistor connected to the receiver through the switch and a third resistor connected to the external cable through the port; and
wherein the switch is configured to switch between states of the device, wherein in a first state the transmitter and the receiver are connected to the port and in a second state the transmitter and the receiver are connected via the reference path.

9. The measuring device of claim 8 , wherein the switch is configured to alternately between the first state and the second state a number of times.

10. The measuring device of claim 8 , further comprising:
a first calibration element and a second calibration element, wherein the cable is terminated with the first calibration element and the second calibration element.

11. The measuring device of claim 10 , wherein the first calibration element is a short and the second calibration element is an open.

12. The measuring device of claim 8 , wherein the receiver comprises a first selection device and first phase averaging device configured to evaluate an averaged phase of a return signal reflected by a calibration element connected to the external cable.

13. The measuring device of claim 12 , wherein the receiver further comprises a second selection device and a second phase averaging device configured to evaluate an averaged phase of a reference signal provided by the transmitter to the receiver via the reference path.

14. The measuring device of claim 13 , wherein the receiver further comprises a subtracting device configured to subtract an output of the second phase averaging device from an output of the first phase averaging device.

15. The measuring device of claim 14 , wherein the receiver further comprises a magnitude averaging device configured to evaluate an averaged magnitude of a measuring signal.

16. The measuring device of claim 15 , wherein the receiver further comprises a multiplier device configured to multiply an output of the magnitude averaging device with an imaginary exponential output of the subtracting device.

Assignees

• Rohde & Schwarz

Inventors

• Lutz Thomas
• Lutz Matthias
• VOLKMANN Jens
• Moser Albert
• Schmidt Kurt
• Plaumann Ralf
• Holzmann Gottfried

Classifications

• G01R31/00 Primary

  Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00}) · CPC title

• G01R35/005 Primary

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title

• H04B17/00

  Monitoring; Testing (of line transmission systems H04B3/46; arrangements for monitoring or testing transmission systems employing electromagnetic waves other than radio waves H04B10/07) · CPC title

• H04B3/462

  Testing group delay or phase shift, e.g. timing jitter · CPC title

• G01R27/32

  in circuits having distributed constants {, e.g. having very long conductors or involving high frequencies} · CPC title