Measuring module for remission photometric analysis and method for the production thereof

Patent metadata

Field	Value
Publication number	US-9534951-B2
Application number	US-201314426590-A
Country	US
Kind code	B2
Filing date	Sep 5, 2013
Priority date	Sep 6, 2012
Publication date	Jan 3, 2017
Grant date	Jan 3, 2017

Abstract

A measuring module for remission photometric analysis of one or a plurality of specimens is provided with the following features: a transmitter with a transmission channel for transmitting a measuring radiation to location of the specimen; a first focusing device for focusing the measuring radiation on the specimen; a receiver with a receiving channel to receive the radiation reflected by the specimen; a second focusing device made of plastic for focusing the measuring radiation reflected by the specimen onto the receiver, whereby the second focusing device further comprises a filter which is designed to filter a fluorescence radiation from the specimen excited by the measuring radiation.

First claim

What is claimed is:

1. A measuring module for the remission photometric analysis of at least one specimen, the measuring module comprising:
a transmitting device with a transmitting channel emitting a measuring radiation to a location of the specimen;
a first focusing device focusing the measuring radiation onto the specimen;
a receiving device with a receiving channel receiving the radiation reflected by the specimen;
a second focusing device made of plastic focusing the measuring radiation reflected by the specimen onto the receiving device,
wherein the second focusing device also comprises a filter, wherein the filter is formed as a filter layer, wherein the filter layer is formed as a multilayered system and has a thickness greater than 0.5 μm and less than 4.5 μm,
the filter removing a secondary radiation that is excited by the measuring radiation including autofluorescence of the specimen, secondary maxima of the transmitting device, or ambient light.

2. The measuring module as claimed in claim 1 , wherein the individual layers of the multilayered system have a thickness of greater than 10 nm and less than 300 nm and comprise the following materials in alternating sequence: silicon oxide, tantalum pentoxide and/or titanium oxide.

3. The measuring module as claimed in claim 1 , wherein the transmitting device, the receiving device, the first and second focusing devices are arranged in one and the same housing, in particular made of plastic.

4. The measuring module as claimed in claim 1 , wherein the transmitting device is formed as one or a plurality of light-emitting diodes and the receiving device is formed as one or a plurality of photodiodes.

5. The measuring module as claimed in claim 1 , wherein the transmitting device and the receiving device are arranged in a first plane.

6. The measuring module as claimed in claim 5 , wherein the first focusing device and the second focusing device are arranged in a second plane, wherein the specimen is arranged in a third plane, and wherein the first plane is parallel to the second plane and the third plane.

7. The measuring module as claimed in claim 1 , wherein the first focusing device is an aspheric lens.

8. The measuring module as claimed in claim 1 , wherein the specimen is disposed in a specimen holder.

9. A method for producing a measuring module as claimed in claim 1 , the method comprising:
a) producing the first and second focusing devices by means of plastic;
b) encapsulating the first and second focusing devices in such a way that a housing is formed; and
c) vapor depositing a filter onto the second focusing device.

10. The method according to claim 9 , wherein steps a) and b) are performed in the reverse sequence, to be precise in such a way that first a housing is produced by means of plastic and then the housing with the first and second focusing devices is encapsulated.

11. The method as claimed in claim 9 , wherein method steps a) and b) are performed by the two-component injection-molding process.

12. The method as claimed in claim 9 , wherein step c), vapour depositing, is performed by a PVD vapor-depositing process with an ion-beam-assisted plasma source.

Assignees

• Jenoptik Polymer Systems Gmbh
• Roche Diagnostics Operations Inc

Inventors

• Buchwald Jan
• Gaumitz Susanne
• Kalveram Stefan
• Trick Sebastian

Classifications

• H10W90/00

  Package configurations · CPC title

• G01N21/474 Primary

  Details of optical heads therefor, e.g. using optical fibres · CPC title

• G01N2201/0633

  Directed, collimated illumination · CPC title

• G02B5/20

  Filters (polarising elements G02B5/30) · CPC title

• H01L31/167

  Electricity · mapped topic