System and method for pattern correction in e-beam lithography

US9529959B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9529959-B2
Application numberUS-201414192523-A
CountryUS
Kind codeB2
Filing dateFeb 27, 2014
Priority dateFeb 27, 2014
Publication dateDec 27, 2016
Grant dateDec 27, 2016

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Abstract

Official abstract text for this publication.

The present disclosure provides a method for pattern correction for electron-beam (e-beam) lithography. In accordance with some embodiments, the method includes splitting a plurality of patterns into a plurality of pattern types; performing model fittings to determine a plurality of models for the plurality of pattern types respectively; and performing a pattern correction to an integrated circuit (IC) layout using the plurality of models.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for pattern correction for electron-beam (e-beam) lithography, comprising: receiving, by a processor, a computer file including an integrated circuit (IC) layout, the IC layout including a plurality of patterns; classifying, by the processor, each pattern of the plurality of patterns according to a plurality of pattern types; performing, by the processor, model fittings to determine a plurality of models for the plurality of pattern types respec…

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What does patent US9529959B2 cover?
The present disclosure provides a method for pattern correction for electron-beam (e-beam) lithography. In accordance with some embodiments, the method includes splitting a plurality of patterns into a plurality of pattern types; performing model fittings to determine a plurality of models for the plurality of pattern types respectively; and performing a pattern correction to an integrated circ…
Who is the assignee on this patent?
Taiwan Semiconductor Mfg Co Ltd
What technology area does this patent fall under?
Primary CPC classification H01J37/3174. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Dec 27 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).