Method of optimizing execution of test cases and a system thereof

US9529700B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9529700-B2
Application numberUS-201414300509-A
CountryUS
Kind codeB2
Filing dateJun 10, 2014
Priority dateApr 25, 2014
Publication dateDec 27, 2016
Grant dateDec 27, 2016

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Abstract

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The present subject matter relates to a computer implemented method and a computer system for optimizing execution of test cases. The method comprises calculating failure probability level of plurality of test cases based on plurality of test results associated to each of the plurality of test cases and determining dynamic risk profile level based on weights assigned to the failure probability level and risk impact parameter of the plurality of test cases. The method further comprises determining one or more set of optimal test cases to be executed based on the dynamic risk profile level of the plurality of test cases satisfying one or more test rule parameters. Upon determining, the method comprises identifying sequence of executing the one or more set of optimal test cases based on the one or more test sequence parameters and executing the one or more set of optimal test cases in the identified sequence.

First claim

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What is claimed is: 1. A method of optimizing execution of test cases, comprising: calculating, by a test case optimization computing device, a failure probability level of a plurality of test cases based on a plurality of test results associated with each of the plurality of test cases; determining, by the test case optimization computing device, a risk profile score for the plurality of test cases based on weights assigned to the failure probability level and assigned to a risk impact parameter of the plurality of test cases; comparing, by the test case optimization computing device, the risk profile score with one or more risk profile threshold scores, wherein the one or more risk profile threshold scores include a high risk profile threshold score, a medium risk profile threshold score, a low risk threshold score, and a very low risk profile threshold score; and determining, by the test case optimization computing device, a dynamic risk profile level of each of the plurality of test cases based on the comparison; determining, by the test case optimization computing device, one or more sets of optimal test cases to be executed from the plurality of test cases based on whether the dynamic risk profile level of the plurality of test cases is of lower risk than all previously executed failed test cases and the plurality of test cases satisfies one or more test rule parameters; and executing, by the test case optimization computing device, the one or more set of optimal test cases. 2. The method as set forth in claim 1 further comprising: identifying, by the test case optimization computing device, a sequence of execution of the one or more sets of optimal test cases based on one or more test sequence parameters; and executing, by the test case optimization computing device, the one or more sets of optimal test cases in the identified sequence. 3. The method as set forth in claim 1 further comprising: receiving, by the test case optimization computing device, the plurality of test results, the plurality of risk impact parameters associated with the plurality of test cases, and the weights of the failure probability level and the plurality of risk impact parameters of the plurality of test cases from a test management system over a communication network. 4. The method as set forth in claim 1 , wherein determining the one or more set of optimal test cases comprises: identifying, by the test case optimization computing device, one or more test cases of the plurality of test cases assigned with one or more risk profiles satisfying the one or more test rule parameters; and eliminating, by the test optimization computing device, one or more unidentified test cases of the plurality of test cases from executing. 5. The method as set forth in claim 1 , wherein the weights associated with the failure probability level and risk impact parameter are configurable by a user. 6. The method as set forth in claim 1 , wherein the dynamic risk profile level of each of the plurality of test cases and a corresponding sequence of execution are updated in the test management system by the test optimization system. 7. A test optimization computing device, comprising: a memory; and a processor coupled to the memory, the processor configured to execute programmed instructions stored in the memory comprising: calculating a failure probability level of a plurality of test cases based on a plurality of test results associated with each of the plurality of test cases; determining a risk profile score for the plurality of test cases based on weights assigned to the failure probability level and assigned to a risk impact parameter of the plurality of test cases; comparing the risk profile score with one or more risk profile threshold scores, wherein the one or more risk profile threshold scores include a high risk profile threshold score, a medium risk profile threshold score, a low risk threshold score, and a very low risk profile threshold score; and determining a dynamic risk profile level of each of the plurality of test cases based on the comparison; determining one or more sets of optimal test cases to be executed from the plurality of test cases based on whether the dynamic risk profile level of the plurality of test cases is of lower risk than all previously executed failed test cases and the plurality of test cases satisfies one or more test rule parameters; and executing the one or more set of optimal test cases. 8. The computing device as set forth in claim 7 , wherein the processor is further configured to execute programmed instructions stored in the memory further comprising: identifying a sequence of execution of the one or more sets of optimal test cases based on one or more test sequence parameters; and executing the one or more sets of optimal test cases in the identified sequence. 9. The computing device as set forth in claim 7 , wherein the processor is further configured to execute programmed instructions stored in the memory further comprising: receiving the plurality of test results, the plurality of risk impact parameters associated with the plurality of test cases, and the weights of the failure probability level and the plurality of risk impact parameters of the plurality of test cases from a test management system over a communication network. 10. The computing device as set forth in claim 7 , wherein the processor is further configured to execute programmed instructions stored in the memory further comprising: identifying one or more test cases of the plurality of test cases assigned with one or more risk profiles satisfying the one or more test rule parameters; and eliminating one or more unidentified test cases of the plurality of test cases from executing. 11. The computing device as set forth in claim 7 , wherein the processor is further configured to execute programmed instructions stored in the memory further comprising: transmitting the execution results and the plurality of dynamic risk profile levels assigned to the plurality of test cases to the test management system for updating. 12. A non-transitory computer readable medium having stored thereon instructions for optimizing execution of test cases comprising machine executable code which, when executed by a processor causes the processor to perform steps comprising: calculating a failure probability level of a plurality of test cases based on a plurality of test results associated with each of the plurality of test cases; determining a risk profile score for the plurality of test cases based on weights assigned to the failure probability level and assigned to a risk impact parameter of the plurality of test cases; comparing the risk profile score with one or more risk profile threshold scores, wherein the one or more risk profile threshold scores include a high risk profile threshold score, a medium risk profile threshold score, a low risk threshold score, and a very low risk profile threshold score; and determining a dynamic risk profile level of each of the plurality of test cases based on the comparison; determining one or more sets of optimal test cases to be executed from the plurality of test cases based on whether the dynamic risk profile level of the plurality of test cases is of lower risk than all previously executed failed test cases and the plurality of test cases satisfies one or more test rule parameters; and executing the one or more set of optimal test cases. 13. The medium as set forth in claim 12 wherein the medium further comprises machine executable code which, when executed by a processor causes the processor to perform steps further c

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  • for test execution, e.g. scheduling of test suites · CPC title

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What does patent US9529700B2 cover?
The present subject matter relates to a computer implemented method and a computer system for optimizing execution of test cases. The method comprises calculating failure probability level of plurality of test cases based on plurality of test results associated to each of the plurality of test cases and determining dynamic risk profile level based on weights assigned to the failure probability …
Who is the assignee on this patent?
Wipro Ltd
What technology area does this patent fall under?
Primary CPC classification G06F11/3688. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 27 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).