193nm laser and inspection system

US9529182B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9529182-B2
Application numberUS-201414170384-A
CountryUS
Kind codeB2
Filing dateJan 31, 2014
Priority dateFeb 13, 2013
Publication dateDec 27, 2016
Grant dateDec 27, 2016

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Abstract

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An improved solid-state laser for generating sub-200 nm light is described. This laser uses a fundamental wavelength between about 1030 nm and 1065 nm to generate the sub-200 nm light. The final frequency conversion stage of the laser creates the sub-200 nm light by mixing a wavelength of approximately 1109 nm with a wavelength of approximately 234 nm. By proper selection of non-linear media, such mixing can be achieved by nearly non-critical phase matching. This mixing results in high conversion efficiency, good stability, and high reliability.

First claim

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The invention claimed is: 1. An optical inspection system for inspecting a surface of a photomask, reticle, or semiconductor wafer for defects, the system comprising: a light source for emitting an incident light beam, the light source including a frequency mixing stage for combining light at a wavelength of approximately 1109 nm with light at a wavelength of approximately 234 nm to generate light at a wavelength between 190 nm and 200 nm; an optical system including a plurality…

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What does patent US9529182B2 cover?
An improved solid-state laser for generating sub-200 nm light is described. This laser uses a fundamental wavelength between about 1030 nm and 1065 nm to generate the sub-200 nm light. The final frequency conversion stage of the laser creates the sub-200 nm light by mixing a wavelength of approximately 1109 nm with a wavelength of approximately 234 nm. By proper selection of non-linear media, s…
Who is the assignee on this patent?
Kla Tencor Corp, Kla—Tencor Corp
What technology area does this patent fall under?
Primary CPC classification H01S3/0092. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Dec 27 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).