Robotic Microtool Control in an Intelligent Automated In Vitro Fertilization and Intracytoplasmic Sperm Injection Platform
US-2024426856-A1 · Dec 26, 2024 · US
US9529008B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9529008-B2 |
| Application number | US-201213411337-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 2, 2012 |
| Priority date | Mar 3, 2011 |
| Publication date | Dec 27, 2016 |
| Grant date | Dec 27, 2016 |
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Official abstract text for this publication.
A sampling system is provided. The sampling system includes a housing. Mounted to the housing is a Hall effect sensor. A probe configured to contact a sample is inserted into the housing. The probe includes an elongated portion and a restorative spring inserted onto the elongated portion of the probe. The restorative spring provides sufficient restorative force to return the probe to a relaxed position. The Hall effect sensor is configured to sense a field strength generated by the proximity of the restorative spring of the probe in the extended position.
Opening claim text (preview).
The invention claimed is: 1. A sampling probe comprising: a fitting; an elongated portion extending from the fitting; a restorative spring including at least one ring-shaped magnet and a metal spring inserted onto exterior of the elongated portion; and a Hall effect sensor wherein the properties of the Hall effect sensor and the at least one magnet are selected to allow the restorative spring to provide a restorative force allowing sensing of an obstacle and stopping without damaging a tip of the sampling probe. 2. The sampling probe of claim 1 , wherein the fitting includes a substantially cylindrical portion having an external teethed surface. 3. The sampling probe of claim 1 , wherein the elongated portion includes an interior channel. 4. The sampling probe of claim 1 , wherein the at least one magnet is a rare earth magnet. 5. The sampling probe of claim 1 , wherein the sampling probe does not comprise an optical sensor. 6. The sampling probe of claim 1 , wherein the sampling probe does not comprise a strain gage. 7. The sampling probe of claim 1 , wherein the sampling probe does not comprise electrical contacts. 8. The sampling probe of claim 1 , further comprising a processor configured to execute machine readable instructions to interpret a signal transmitted from the Hall effect sensor.
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