Multiheight electrically conductive via contacts for a multilevel interconnect structure

US9524901B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9524901-B2
Application numberUS-201414501389-A
CountryUS
Kind codeB2
Filing dateSep 30, 2014
Priority dateSep 30, 2014
Publication dateDec 20, 2016
Grant dateDec 20, 2016

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method of making multi-level contacts includes providing an in-process multilevel device having a device region and a contact region including a stack of alternating sacrificial layers and insulating layers located over a major surface of a substrate. A contact mask having contact mask openings is provided over the stack, and a first over mask having first over mask openings is provided over the contact mask. A subset of the contact mask openings is substantially aligned with the first over mask openings. Contact openings are formed through the stack, wherein each of the contact openings extends substantially perpendicular to the major surface of the substrate to a respective one of the sacrificial layers. A plurality of electrically conductive via contacts is formed in the plurality of the contact openings.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of making multi-level contacts, comprising: providing an in-process multilevel device comprising a device region and a contact region comprising a stack of plurality of alternating sacrificial layers and insulating layers located over a major surface of a substrate; providing a contact mask with a plurality of contact mask openings over the stack; providing a first over mask with a plurality of first over mask openings over the contact mask, whe…

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What does patent US9524901B2 cover?
A method of making multi-level contacts includes providing an in-process multilevel device having a device region and a contact region including a stack of alternating sacrificial layers and insulating layers located over a major surface of a substrate. A contact mask having contact mask openings is provided over the stack, and a first over mask having first over mask openings is provided over …
Who is the assignee on this patent?
Sandisk Technologies Inc, Sandisk Technologies Llc
What technology area does this patent fall under?
Primary CPC classification H10W20/083. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Dec 20 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).