Fuse arrangement and a method for manufacturing a fuse arrangement

Patent metadata

Field	Value
Publication number	US-9524844-B2
Application number	US-201313945945-A
Country	US
Kind code	B2
Filing date	Jul 19, 2013
Priority date	Jul 19, 2013
Publication date	Dec 20, 2016
Grant date	Dec 20, 2016

Abstract

A fuse arrangement, including: at least a first terminal, a second terminal, and a fuse, wherein the first terminal and the second terminal may be electrically connected via the fuse, and wherein the fuse may be configured to be under fuse internal mechanical stress to deform the fuse along its width direction in case it is broken.

First claim

What is claimed is:

1. A fuse arrangement, comprising:
at least a first terminal, a second terminal, and a fuse;
a carrier, wherein the first terminal, the second terminal, and the fuse are arranged over a surface of the carrier;
wherein in an intact state, the fuse extends along a first direction electrically connecting the first terminal to the second terminal, and wherein the fuse is under fuse internal mechanical stress, the fuse internal mechanical stress applying an internal force to cause the fuse to deform along a second direction in a case where the fuse is broken,
wherein in a broken state, the fuse comprises a first broken fuse part connected to the first terminal and a second broken fuse part connected to the second terminal,
wherein the first broken fuse part and the second broken fuse part are physically and electrically separated from each other, and
wherein the second direction is perpendicular to the first direction, and wherein the first and second directions are parallel to the surface of the carrier.

2. The fuse arrangement according to claim 1 ,
wherein the fuse comprises a fuse filament providing an electrical connection between the terminals, wherein a length of an extension of the fuse filament along the first direction is longer than a width of the extension of the fuse filament along the second direction.

3. The fuse arrangement according to claim 1 ,
wherein the length of the fuse is smaller than or equal to about 300 μm.

4. The fuse arrangement according to claim 1 ,
wherein the width of the fuse is smaller than or equal to about 10 μm.

5. The fuse arrangement according to claim 1 ,
wherein the carrier is a semiconductor wafer.

6. The fuse arrangement according to claim 1 ,
wherein the fuse comprises a predetermined breaking point.

7. The fuse arrangement according to claim 1 ,
wherein the fuse comprises a metal.

8. The fuse arrangement according to claim 1 ,
wherein the fuse comprises doped silicon.

9. The fuse arrangement according to claim 1 , further comprising:
a gap between a portion of the fuse and the carrier.

10. The fuse arrangement according to claim 1 ,
wherein at least a portion of the fuse has a low adhesion to the carrier such that the fuse is released from the carrier in case it is broken.

11. The fuse arrangement according to claim 1 ,
wherein the fuse is formed by a sidewall spacer.

12. The fuse arrangement of claim 1 , further comprising:
at least one contact structure providing an interface to an evaluation circuit to determine the state of the fuse.

13. The fuse arrangement according to claim 12 ,
wherein the at least one contact structure comprises a plurality of individual contacts.

14. The fuse arrangement according to claim 1 ,
wherein the first broken fuse part and the second broken fuse part are each deformed along a deformation vector, wherein a vector component of the deformation vector is parallel to the direction of the fuse.

15. The fuse arrangement according to claim 1 , further comprising:
a third terminal, a fourth terminal, and a second fuse;
wherein in an intact state,
the second fuse extends along a third direction to electrically connect the third terminal to the fourth terminal, and wherein the second fuse is under fuse internal mechanical stress, the fuse internal mechanical stress applying an internal force to cause the second to deform along a fourth direction in a case it where the second fuse is broken,

wherein in a broken state,
the second fuse comprises a first broken fuse part connected to the third terminal and a second broken fuse part connected to the fourth terminal, wherein the first broken fuse part and the second broken fuse part are physically and electrically separated from each other, and

wherein the third direction is perpendicular to the fourth direction.

16. The fuse arrangement according to claim 15 ,
wherein the first fuse and the second fuse are electrically isolated from each other when the first fuse and the second fuse are both in the intact state.

17. The fuse arrangement according to claim 15 ,
wherein the first fuse and the second fuse are arranged in such a way that the first fuse and the second fuse proximate each other due to the deformation of the fuses in case the first fuse and second fuses are each in the broken state.

18. The fuse arrangement according to claim 17 ,
wherein at least one of the first terminal and the second terminal is electrically connected to at least one of the third terminal and the fourth terminal due to the deformation of the fuses in case the first and second fuses are each in the broken state.

19. The fuse arrangement of claim 1 , wherein the first broken fuse part and the second broken fuse part are deformed parallel to the surface of the carrier away from the first direction.

20. A fuse testing arrangement comprising:
at least one fuse arrangement, the at least one fuse arrangement comprising:
at least a first terminal, a second terminal, and a fuse,
a carrier, wherein the first terminal, the second terminal, and the fuse are arranged over a surface of the carrier;
at least one contact structure providing an interface to at least one evaluation circuit to determine the state of the fuse;
wherein in an intact state the fuse extends along a first direction electrically connecting the first terminal to the second terminal, wherein the fuse is under fuse internal mechanical stress, the fuse internal mechanical stress applying an internal force to cause the fuse to deform along a second direction in a case where the fuse is broken,
wherein in a broken state, the fuse comprises a first broken fuse part connected to the first terminal and a second broken fuse part connected to the second terminal, wherein the first broken fuse part and the second broken fuse part are physically and electrically separated from each other, and;

wherein the at least one evaluation circuit measures the electrical resistance between at least one of the first terminal and the second terminal and the contact structure of the at least one fuse arrangement to determine the state of the fuse, and
wherein the second direction is perpendicular to the first direction, and wherein the first and second directions are parallel to the surface of the carrier.

21. A fuse array comprising:
a plurality of fuse arrangements, each fuse arrangement of the plurality of fuse arrangements comprising:
at least a first terminal, a second terminal, and a fuse;
a carrier, wherein the first terminal, the second terminal, and the fuse are arranged over a surface of the carrier,
wherein in an intact state the fuse extends along a first direction electrically connecting the first terminal to the second terminal, and
wherein the fuse is under fuse internal mechanical stress, the fuse internal mechanical stress applying an internal force to cause the fuse to deform along a second direction in a case where the fuse is broken,
wherein in a broken state, the fuse comprises a first broken fuse part connected to the first terminal and a second broken fuse part connected to the second terminal, wherein the first broken fuse part and the second broken fuse part are physically and electrically separated from each other, and
wherein the second direction is perpendicular to the first direction, and
wherein the first and second directions are parallel to the surface of the carrier.

22. The fuse array according to claim 21 , further com

Assignees

• Infineon Technologies Ag

Inventors

• Gratz Achim

Classifications

• H01H85/30

  Means for indicating condition of fuse structurally associated with the fuse · CPC title

• H01H85/0241

  Structural association of a fuse and another component or apparatus (switches with built-in fuses H01H9/10, spark-gap arresters H01H85/44, transformers and inductances H01F27/402, capacitors H01G2/14, lamps H01K1/66, semiconductors H10W20/493 or H10W42/80) · CPC title

• H01H85/54

  Protective devices wherein the fuse is carried, held, or retained by an intermediate or auxiliary part removable from the base, or used as sectionalisers · CPC title

• H01H85/36 Primary

  Means for applying mechanical tension to fusible member · CPC title

• H01H2085/0283

  Structural association with a semiconductor device · CPC title