Wavelength-swept light source apparatus and measuring apparatus

Patent metadata

Field	Value
Publication number	US-9523568-B2
Application number	US-201514636378-A
Country	US
Kind code	B2
Filing date	Mar 3, 2015
Priority date	Mar 4, 2014
Publication date	Dec 20, 2016
Grant date	Dec 20, 2016

Abstract

A wavelength-swept light source apparatus comprises a light source that emits a wavelength-swept light that varies in a predetermined cycle, a mode hop detector that detects a mode hop of the wavelength-swept light emitted from the light source; and a control unit that controls at least one of a parameter that defines a specified period having a predetermined fixed or variable time length provided in the predetermined cycle and a control parameter of the light source, thereby to set an occurrence timing of the mode hop detected by the mode hop detector outside of the specified period.

First claim

What is claimed is:

1. A wavelength-swept light source apparatus comprising:
a light source that emits a wavelength-swept light of which wavelength varies in a predetermined cycle;
a mode hop detector that detects a mode hop of the wavelength-swept light emitted from the light source; and
a control unit that controls at least one of a parameter that defines a specified period having a predetermined fixed or variable time length provided in the predetermined cycle and a control parameter of the light source, thereby to set an occurrence timing of the mode hop detected by the mode hop detector outside of the specified period.

2. The wavelength-swept light source apparatus according to claim 1 ,
wherein the light source comprises a light-emitting element that emits light,
the control unit controls an injection current supplied to the light-emitting element as the control parameter of the light source, thereby to set a timing of the mode hop detected by the mode hop detector outside of the specified period.

3. The wavelength-swept light source apparatus according to claim 1 ,
wherein the light source comprises a light-emitting element that emits light and a temperature controller that adjusts a temperature of the light emitting element, and
the control unit controls the temperature of the light emitting element by the temperature controller as the control parameter of the light source, thereby to set a timing of the mode hop detected by the mode hop detector outside of the specified period.

4. The wavelength-swept light source apparatus according to claim 1 ,
wherein the light source comprises a light-emitting element that emits light and a wavelength sweep unit that sweeps the wavelength of the light emitted from the light emitting element according to the predetermined cycle, and
the control unit controls wavelength sweep characteristics in the wavelength sweep unit as the control parameter of the light source, thereby to set a timing of the mode hop detected by the mode hop detector outside of the specified period.

5. The wavelength-swept light source apparatus according to claim 1 , wherein the control unit controls a relative position of the specified period to the predetermined cycle as a parameter that defines the specified period, thereby to set a timing of the mode hop detected by the mode hop detector outside of the specified period.

6. The wavelength-swept light source apparatus according to claim 1 , wherein the mode hop detector is a light intensity sensor that detects a light intensity of the wavelength-swept light emitted from the light source, and performs detection of the mode hop based on a change of the detected light intensity.

7. The wavelength-swept light source apparatus according to claim 1 , wherein the mode hop detector is a frequency detector that detects a frequency of the wavelength-swept light emitted from the light source, and performs the detection of the mode hop based on a relation between the detected frequency and a light intensity corresponding to the frequency.

8. The wavelength-swept light source apparatus according to claim 1 , further comprising:
a light splitting element that splits the wavelength-swept light emitted from the light source into two;
a first optical path that passes one of the split wavelength-swept light;
a second optical path that passes the other of the split wavelength-swept light;
a combining element that combines the one of the wavelength-swept light that has passed through the first optical path and the other of the wavelength-swept light that has passed through the second optical path thereby to generate an interference light; and
a light receiving element that detects an interference signal based on the interference light,
wherein the mode hop detector detects the mode hop based on a time change of a signal strength in the interference signal.

9. A measuring apparatus comprising:
the wavelength-swept light source apparatus according to claim 8 ; and
an analysis unit that acquires the interference signal in the specified period and obtains a position of each part of the object to be measured based on a peak in a relation between a frequency of the acquired interference signal and a signal strength corresponding to the frequency,
wherein the second optical path passes the other of the split wavelength-swept light toward to the object to be measured as well as the other of the wavelength-swept light reflected from the object to be measured, and
the combining element combines the one of the wavelength-swept light that has passed through the first optical path and the other of the wavelength-swept light that has been reflected from the object to be measured and has passed through the second optical path thereby to generate an interference light.

10. The wavelength-swept light source apparatus according to claim 1 , further comprising:
a light splitting element that splits the wavelength-swept light emitted from the light source into two;
a first optical path that passes one of the split wavelength-swept light;
a second optical path that passes the other of the split wavelength-swept light;
a combining element that combines the one of the wavelength-swept light that has passed through the first optical path and the other of the wavelength-swept light that has passed through the second optical path thereby to generate an interference light; and
a light receiving element that detects an interference signal based on the interference light,
wherein the mode hop detector detects the mode hop based on a shape of a peak in a relation between a frequency of the interference signal and a signal strength corresponding to the frequency.

11. A measuring apparatus comprising:
the wavelength-swept light source apparatus according to claim 1 ;
a light splitting element that splits the wavelength-swept light emitted from the wavelength-swept light source apparatus into two;
a first optical path that passes one of the split wavelength-swept light;
a second optical path that passes the other of the split wavelength-swept light towards an object to be measured and the other of the wavelength-swept light reflected from the object to be measured,
a combining element that combines the one of the wavelength-swept light that has passed through the first optical path and the other of the wavelength-swept light that has been reflected from the object to be measured and has passed through the second optical path thereby to generate an interference light;
a light receiving element that detects an interference signal based on the interference light; and
an analysis unit that acquires the interference signal in the specified period and obtains a position of each part of the object to be measured based on a peak in a relation between a frequency of the acquired interference signal and a signal strength corresponding to the frequency.

Assignees

• Tomey Corp

Inventors

• Kato Chihiro
• Nozawa Yuji

Classifications

• H01S5/06837

  Stabilising otherwise than by an applied electric field or current, e.g. by controlling the temperature · CPC title

• G01B9/02004 Primary

  using frequency scans · CPC title

• A61B3/102

  for optical coherence tomography [OCT] · CPC title

• G01B9/02091

  Tomographic interferometers, e.g. based on optical coherence · CPC title

• H01S5/06821

  Stabilising other output parameters than intensity or frequency, e.g. phase, polarisation or far-fields · CPC title