Particle detector and method for producing such a detector

Patent metadata

Field	Value
Publication number	US-9518909-B2
Application number	US-201414496072-A
Country	US
Kind code	B2
Filing date	Sep 25, 2014
Priority date	Jul 22, 2010
Publication date	Dec 13, 2016
Grant date	Dec 13, 2016

Abstract

The invention relates to a particle detector including a substrate made of a semiconductor material, in which at least one through-cavity is formed, defined by an input section and an output section, wherein the input section thereof is to be connected to an airflow source, the substrate supporting: an optical means including at least one laser source, and at least one waveguide connected to the at least one laser source and leading into the vicinity of the output section of the cavity; and a photodetector located near the output section of the cavity and offset relative to the optical axis of the optical means.

First claim

The invention claimed is:

1. A particle detector for detecting particles in the ambient air, the particle detector comprising:
a substrate in which at least one through-cavity, delimited by an entry cross section and an exit cross section, is formed, the entry cross section being further configured to be connected to a source of an air flow, said air flow comprising the particles to be detected and capable of being received and directed by the said at least one through-cavity, said substrate supporting:
an optical device comprising at least one laser source and at least one waveguide, which is connected to said at least one laser source and the end of which is located in proximity to the exit cross section of said cavity, and
at least one photodetector located in proximity to the exit cross section of said cavity and offset with respect to the optical axis of said optical means, in order to detect the scattered light,

wherein the optical device and the photodetector are located on the same face of the substrate, the optical device and the photodetector being produced simultaneously on the same substrate or being integral with the substrate.

2. The particle detector as claimed in claim 1 , wherein said at least one cavity has a variable cross section which decreases from the entry cross section to the exit cross section.

3. The particle detector as claimed in claim 1 , wherein the optical device includes at least one photonic device, at the opposite end of the waveguide from the laser source.

4. The particle detector as claimed in claim 1 , wherein the particle detector comprises a plurality of photodetectors associated with the through-cavity.

5. The particle detector as claimed in claim 1 , wherein the substrate comprises a plurality of through-cavities.

6. The particle detector as claimed in claim 1 , wherein the substrate comprises a semiconductor material.

7. The particle detector as claimed in claim 1 , wherein the photodetector is a photodiode.

8. The particle detector as claimed in claim 1 , wherein the opposite end of the waveguide from the laser source is nanostructured so as to produce a focusing function.

9. The particle detector as claimed in claim 1 , wherein the substrate comprises silicon.

10. The particle detector as claimed in claim 1 , wherein the waveguide comprises:
a first structure layer of a material having a first optical index n1,
a second layer of a material having a second optical index n2 on this first layer, n2 being greater than n1, and
a third structured layer of a material having a third optical index n3, wherein n3 is less than n2.

11. The particle detector as in claim 10 , wherein the photodetector is offset with respect to the optical axis.

12. The particle detector as claimed in claim 1 , wherein the through-cavity is formed on a surface of the substrate via etching.

13. The particle detector as claimed in claim 1 , wherein the optical device and the photodetector are formed on a same face of the substrate.

14. The particle detector as claimed in claim 1 , wherein the photodetector is selected from the group consisting of a pyrometer, bolometer, and photodiode.

15. The particle detector as claimed in claim 1 , wherein the waveguide is configured to generate at least 7 light beams that are in the same plane and coincide with a plane of the substrate.

16. The particle detector as claimed in claim 1 , wherein the laser source is configured to emit light in the infrared range, and wherein the photodetector includes an epitaxial germanium layer overlying a layer of silicon oxide.

17. The particle detector as claimed in claim 1 , wherein the through-cavity has a funnel shape.

18. The particle detector as claimed in claim 1 , wherein the particle detector comprises a plurality of photodetectors that are each associated with a plurality of said through cavities, and wherein said waveguide is configured to direct a light beam to each of said through cavities, said light beam being emitted from a single laser source.

19. The particle detector as claimed in claim 18 , wherein each photodetector is offset with respect to the axis of the light beam emitted from the laser source, and are positioned facing the end of the waveguide and separated therefrom by each corresponding through cavity.

20. The particle detector as claimed in claim 1 , wherein the particle detector is an optical particle counter.

Assignees

• Commissariat Energie Atomique

Inventors

• Nicoletti Sergio

Classifications

• G01N2015/0038

  Investigating nanoparticles · CPC title

• G01N15/06

  Investigating concentration of particle suspensions (by weighing G01N5/00; investigating sedimentation of particle suspensions G01N15/04; investigating individual particles G01N15/10) · CPC title

• G01N2021/4726

  Detecting scatter at 90° · CPC title

• G01N21/53

  within a flowing fluid, e.g. smoke · CPC title

• G01N15/1484 Primary

  microstructural devices · CPC title