Oxide material and semiconductor device
US-2024395942-A1 · Nov 28, 2024 · US
US9515189B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9515189-B2 |
| Application number | US-201514879423-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 9, 2015 |
| Priority date | Oct 25, 2012 |
| Publication date | Dec 6, 2016 |
| Grant date | Dec 6, 2016 |
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A method of manufacturing a semiconductor device using a metal oxide includes forming a metal oxide layer on a substrate, forming an amorphous semiconductor layer on the metal oxide layer, and forming a polycrystalline semiconductor layer by crystallizing the amorphous semiconductor layer using the metal oxide layer.
Opening claim text (preview).
What is claimed is: 1. A semiconductor device comprising: a polycrystalline semiconductor layer on a substrate, the polycrystalline semiconductor layer excluding a metal; a metal silicide on a surface of the polycrystalline semiconductor layer; and a metal oxide layer between the substrate and the polycrystalline semiconductor layer, wherein the polycrystalline semiconductor layer has a (111) crystallization orientation during crystallization using the metal oxide layer and the polycrystalline semiconductor layer. 2. The semiconductor device of claim 1 , further comprising: an insulating layer between the substrate and the polycrystalline semiconductor layer. 3. The semiconductor device of claim 1 , wherein the insulating layer is one of SiO 2 and SiN x , wherein 0<x<1.4. 4. The semiconductor device of claim 1 , wherein the substrate is one of a glass substrate and a silicon substrate. 5. The semiconductor device of claim 1 , wherein the metal oxide layer is one of NiO, CuO, ZnO, SnO, AlO x , TiO x , InO x , GaO x , PbO x , and CoO x . 6. The semiconductor device of claim 1 , wherein the polycrystalline semiconductor layer includes one of Si, Ge, and Si 1−x Ge x , wherein 0<x<1. 7. The semiconductor device of claim 1 , wherein the polycrystalline semiconductor layer excludes a metal silicide as part of the polycrystalline semiconductor layer.
using crystallisation-enhancing elements · CPC title
Polycrystalline · CPC title
Silicon, silicon germanium or germanium · CPC title
being insulating materials · CPC title
being non-crystalline insulating materials, e.g. glass or polymers · CPC title
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