Radiation detecting panel

Patent metadata

Field	Value
Publication number	US-9515118-B2
Application number	US-201214375574-A
Country	US
Kind code	B2
Filing date	Jul 30, 2012
Priority date	Jan 30, 2012
Publication date	Dec 6, 2016
Grant date	Dec 6, 2016

Abstract

A radiation detecting panel is provided. This panel includes a substrate including a pixel region and a pad region, a scintillating layer configured to convert radiation into visible rays, a photoelectric device configured to convert the visible rays into currents in each pixel, a switching device configured to control output of the currents in each pixel; a plurality of bias lines configured to apply a bias voltage to the scintillating layer and the photoelectric device, a data line configured to be coupled to the switching device to transfer the currents, and a common bias line configured to transfer the bias voltage to the bias lines, wherein the common bias line and the bias lines are located on different layers. The data line and the bias lines are located on the same layer.

First claim

The invention claimed is:

1. A radiation detecting panel, comprising:
a substrate including a pixel region and a pad region;
a scintillating layer configured to convert radiation into visible rays;
a photoelectric device configured to convert the visible rays into currents in each pixel;
a switching device configured to control output of the currents in each pixel;
a plurality of bias lines configured to apply a bias voltage to the scintillating layer and the photoelectric device;
a data line configured to be coupled to the switching device to transfer the currents; and
a common bias line configured to transfer the bias voltage to the bias lines, wherein the common bias line formed only in the pad region, the common bias line is formed in a layer lower than and different from a layer of the bias lines, and the bias lines are formed on the pixel region and extends to the pad region.

2. The radiation detecting panel of claim 1 , wherein the switching device includes a gate electrode, a source electrode, a drain electrode and a channel between the source electrode and the drain electrode, wherein source electrode, the drain electrode and the common bias line are located on the same layer.

3. The radiation detecting panel of claim 2 , wherein the data line includes a first data line connected to the source electrode in one body, and a second data line overlapped with the first data line, and the second data line and the bias lines are located on the same layer.

4. The radiation detecting panel of claim 2 , further comprising an active layer configured to provide a region for the channel and cover a whole structure under the active layer.

5. The radiation detecting panel of claim 2 , further comprising a light shielding pattern covering the channel, wherein the light shielding pattern and the bias lines are located on the same layer.

6. The radiation detecting panel of claim 1 , further comprising a common bias line pad coupled to the common bias line, wherein the common bias line pad and the bias lines are located on the same layer.

7. The radiation detecting panel of claim 1 , wherein the data line and the bias lines are located on the same layer.

8. The radiation detecting panel of claim 1 , further comprising:
a first pad configured to be coupled to the switching device to control the switching device;
a second pad configured to be coupled to the data line; and
a third pad coupled to the common bias line, wherein the first pad, the second pad, and the third pad are located on the same layer.

9. A radiation detecting panel, comprising:
a substrate including a pixel region and a pad region;
a scintillating layer configured to convert radiation into visible rays;
a photoelectric device configured to convert the visible rays into currents in each pixel;
a switching device configured to control output of the currents in each pixel;
a plurality of bias lines configured to apply a bias voltage to the scintillating layer and the photoelectric device;
a common bias line configured to transfer the bias voltage to the bias lines, wherein the common bias line formed only in the pad region, the common bias line is formed in a layer lower than and different from a layer of the bias lines, and the bias lines are formed on the pixel region and extends to the pad region; and
a data line configured to be coupled to the switching device to transfer the currents, wherein the data line and the bias lines are located on the same layer.

10. The radiation detecting panel of claim 9 , wherein the data line includes a first data line connected to the source electrode in one body, and a second data line overlapped with the first data line, and the second data line and the bias lines are located on the same layer.

11. The radiation detecting panel of claim 9 , further comprising an active layer configured to provide a region for the channel and cover a whole structure under the active layer.

12. The radiation detecting panel of claim 9 , further comprising a light shielding pattern covering the channel, wherein the light shielding pattern and the bias lines are located on the same layer.

13. The radiation detecting panel of claim 9 , wherein the switching device includes a gate electrode, a source electrode, a drain electrode and a channel between the source electrode and the drain electrode, wherein source electrode, the drain electrode and the common bias line are located on the same layer.

14. The radiation detecting panel of claim 9 , further comprising:
a common bias line pad coupled to the common bias line, wherein the common bias line pad and the bias lines are located on the same layer.

15. The radiation detecting panel of claim 14 , further comprising:
a first pad configured to be coupled to the switching device to control the switching device;
a second pad configured to be coupled to the data line; and
a third pad coupled to the common bias line, wherein the first pad, the second pad, and the third pad are located on the same layer.

Assignees

• Jun Seung Ik
• Rayence Co Ltd

Inventors

• Jun Seung Ik

Classifications

• H01L27/14623

  Electricity · mapped topic

• H01L27/14603

  Electricity · mapped topic

• H01L27/14663 Primary

  Electricity · mapped topic

• H01L27/14632

  Electricity · mapped topic

• H01L27/14692

  Electricity · mapped topic