Measuring system

Patent metadata

Field	Value
Publication number	US-9513343-B2
Application number	US-201414272837-A
Country	US
Kind code	B2
Filing date	May 8, 2014
Priority date	May 8, 2013
Publication date	Dec 6, 2016
Grant date	Dec 6, 2016

Abstract

A measuring system having a magnetic device for generating a magnetic field and having a magnetic field sensor for detecting a flux density of the magnetic field at least in a first spatial direction, whereby the magnetic field sensor is fixedly positioned relative to the magnetic device. The magnetic device has at least two main poles for generating a main magnetic field and at least two secondary poles for generating a secondary magnetic field. The magnetic field in the magnetic field sensor is formed by superposition of the main magnetic field and the secondary magnetic field. The magnetic field sensor is designed to measure the flux density of the superposition in the first spatial direction, and, in the magnetic field sensor, the secondary magnetic field compensates at least partially the main magnetic field in the first spatial direction.

First claim

What is claimed is:

1. A measuring system comprising:
a fixed magnetic device including a first permanent magnet for generating a magnetic field, the first permanent magnet having a main extension surface along a second spatial direction and at least two magnetic protrusions opposite the main extension surface, the at least two magnetic protrusions extending in a third spatial direction to a protrusion plane, the third spatial direction being perpendicular to the second spatial direction, and the protrusion plane being parallel to the main extension surface; and
a magnetic field sensor for detecting a flux density of the magnetic field at least in a first spatial direction, the magnetic field sensor being fixedly positioned further from the main extension surface than the protrusion plane, and offset by a distance from the protrusion plane of the magnetic device,
wherein the magnetic device has at least two main poles for generating a main magnetic field and at least two secondary poles for generating a secondary magnetic field,
wherein the magnetic field in the magnetic field sensor is formed by superposition of the main magnetic field and the secondary magnetic field,
wherein the magnetic field sensor is configured to measure the flux density of the superposition in the first spatial direction, and
wherein, in the magnetic field sensor, the secondary magnetic field compensates at least partially the main magnetic field in the first spatial direction.

2. The measuring system according to claim 1 , wherein the magnetic device has a first permanent magnet with two main poles for generating the main magnetic field, and wherein the two secondary poles for generating the secondary magnetic field disposed at lateral ends of the at least one recess.

3. The measuring system according to claim 1 , wherein pole surfaces of the secondary poles are formed parallel to the pole surfaces of the main poles.

4. The measuring system according to claim 1 , wherein pole surfaces of the secondary poles are formed at an angle to the pole surfaces of the main poles.

5. The measuring system according to claim 1 , further comprising an encoder for changing a flux density in the first spatial direction in an area of the magnetic field sensor.

6. The measuring system according to claim 1 , wherein the magnetic device and the magnetic field sensor are integrated in a component package, and wherein the component package is made for mounting on a circuit substrate.

7. The measuring system according to claim 1 , wherein the two main poles are disposed at opposite ends of the main extension surface.

8. The measuring system according to claim 1 , wherein the two magnetic protrusions are disposed at opposite ends of the first permanent magnet, wherein each magnetic protrusion includes a face parallel to the protrusion plane, and wherein the polarity of the face of each magnetic protrusion is opposite that of a nearest one of the at least two main poles.

9. The measuring system according to claim 1 , wherein the at least two secondary poles are disposed on the at least two protrusions, and wherein the at least two main poles are disposed at opposite ends of the extension surface.

10. The measuring system according to claim 1 , wherein the at least two main poles are disposed along the second spatial direction, and wherein the at least two secondary poles are disposed along the third spatial direction.

11. A measuring system comprising:
a magnetic device for generating a magnetic field; and
a magnetic field sensor for detecting a flux density of the magnetic field at least in a first spatial direction, the magnetic field sensor being fixedly positioned relative to the magnetic device,
wherein the magnetic device has at least two main poles for generating a main magnetic field and at least two secondary poles for generating a secondary magnetic field,
wherein the magnetic field in the magnetic field sensor is formed by superposition of the main magnetic field and the secondary magnetic field,
wherein the magnetic field sensor is configured to measure the flux density of the superposition in the first spatial direction,
wherein, in the magnetic field sensor, the secondary magnetic field compensates at least partially the main magnetic field in the first spatial direction,
wherein the magnetic device has a first permanent magnet with the two main poles for generating the main magnetic field and a second permanent magnet with the two secondary poles for generating the secondary magnetic field,
wherein the second permanent magnet has a polarity opposite to the first permanent magnet, and
wherein the second permanent magnet has smaller dimensions than the first permanent magnet.

12. The measuring system according to claim 11 , wherein a first extension direction of the first permanent magnet is along a first longitudinal axis of the first permanent magnet, wherein a second extension direction of the second permanent magnet is along a second longitudinal axis of the second permanent magnet, and wherein the first extension direction and second extension direction are parallel.

13. The measuring system according to claim 12 , wherein the second permanent magnet is disposed on the first permanent magnet, and wherein the second permanent magnet is arranged between the first permanent magnet and the magnetic field sensor.

Assignees

• Micronas Gmbh

Inventors

• Heberle Klaus
• Franke Joerg
• Breitwieser Oliver
• Kaufmann Timo

Classifications

• G01D5/145

  influenced by the relative movement between the Hall device and magnetic fields (see G01R33/06) · CPC title

• G01R33/1215

  Measuring magnetisation; Particular magnetometers therefor (G01R33/14 takes precedence; electrodynamic magnetometers G01R33/028) · CPC title

• G01N27/72

  by investigating magnetic variables · CPC title

• G01R33/0017 Primary

  Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields · CPC title

• G01V3/08

  operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices (with electromagnetic waves G01V3/12) · CPC title