Tunable laser with a cascaded filter and comb reflector

Patent metadata

Field	Value
Publication number	US-9509119-B2
Application number	US-201514962990-A
Country	US
Kind code	B2
Filing date	Dec 8, 2015
Priority date	Jan 13, 2015
Publication date	Nov 29, 2016
Grant date	Nov 29, 2016

Abstract

A laser comprises a gain medium, and a mirror coupled to the gain medium and comprising a coupler coupled to the gain medium, a phase section coupled to the coupler, a bandpass filter coupled to the phase section, and a comb reflector (CR) coupled to the bandpass filter. A laser chip package comprises a substrate, and a laser coupled to the substrate and comprising a filter comprising a first interferometer with a first transmittance, and a second interferometer with a second transmittance, wherein the filter is configured to provide a filter transmittance based on the first transmittance and the second transmittance, and a comb reflector (CR) coupled to the filter and comprising a ring with a circumference, and a refractive index, wherein the CR is configured to provide a CR reflectivity based on the circumference and the refractive index.

First claim

What is claimed is:

1. A laser comprising:
a gain medium comprising indium phosphide (InP);
a mirror coupled to the gain medium and comprising:
a coupler coupled to the gain medium;
a phase section coupled to the coupler;
a bandpass filter coupled to the phase section;
a comb reflector (CR) coupled to the bandpass filter; and
a silicon (Si) waveguide;

a suspended structure local heater; and
a suspended structure thermally coupled to the suspended structure local heater, wherein the Si waveguide is positioned between the suspended structure local heater and the suspended structure.

2. The laser of claim 1 , wherein the bandpass filter comprises:
a first Mach-Zehnder interferometer (MZI); and
a second MZI coupled to the first MZI and the CR.

3. The laser of claim 2 , wherein the first MZI comprises:
a first splitter;
a first local heater coupled to the first splitter; and
a second splitter coupled to the first splitter and the first local heater.

4. The laser of claim 3 , wherein the second MZI comprises:
a third splitter coupled to the second splitter;
a second local heater coupled to the third splitter; and
a fourth splitter coupled to the third splitter and the second local heater.

5. The laser of claim 1 , wherein the CR comprises:
a first splitter coupled to the bandpass filter; and
a ring comprising:
a second splitter coupled to the first splitter;
a local heater coupled to the second splitter; and
a third splitter coupled to the local heater and the second splitter.

6. The laser of claim 1 , wherein the gain medium comprises a facet that is a thin-film coating reflector.

7. The laser of claim 1 , wherein the phase section comprises a local heater and a p-n junction.

8. The laser of claim 1 , further comprising:
a first photodiode (PD) coupled to the bandpass filter;
a second PD coupled to the bandpass filter;
a local heater coupled to the CR;
a third PD coupled to the local heater; and
a fourth PD coupled to the CR.

9. The laser of claim 1 , wherein the gain medium is evanescently coupled to the mirror.

10. The laser of claim 1 , further comprising a waveguide structure comprising:
an n-doped rib;
a positive electrode coupled to the n-doped rib;
a p-doped rib;
a ground electrode coupled to the p-doped rib; and
the silicon (Si) waveguide, wherein the Si waveguide is positioned between the n-doped rib and the p-doped rib to form a PIN diode.

11. A laser chip package comprising:
a substrate;
a laser coupled to the substrate and comprising:
a filter comprising:
a first interferometer with a first transmittance; and
a second interferometer with a second transmittance, wherein the filter is configured to provide a filter transmittance based on the first transmittance and the second transmittance; and

a comb reflector (CR) coupled to the filter and comprising:
a ring with a circumference; and
a refractive index, wherein the CR is configured to provide a CR reflectivity based on the circumference and the refractive index; and

a waveguide structure comprising:
an n-doped rib;
a positive electrode coupled to the n-doped rib;
a p-doped rib;
a ground electrode coupled to the p-doped rib; and
a silicon (Si) waveguide positioned between the n-doped rib and the p-doped rib to form a PIN diode.

12. The laser chip package of claim 11 , wherein the laser further comprises a mirror configured to provide a mirror reflectivity based on the filter transmittance and the CR reflectivity.

13. The laser chip package of claim 12 , wherein the laser further comprises a gain section configured to provide a round-trip gain peak, wherein the mirror reflectivity has a mirror reflectivity peak, and wherein the laser is configured to lase at a wavelength based on the round-trip gain peak and the mirror reflectivity peak.

14. The laser chip package of claim 11 , further comprising a phase section coupled to the filter and comprising:
a local heater configured to provide slower phase tuning; and
a p-n junction coupled to the local heater and the filter and configured to provide faster phase tuning.

15. A method of tuning a laser, the method comprising:
tuning a bandpass filter to make a first wavelength corresponding to a transmittance peak of the bandpass filter the same as a target wavelength;
tuning a comb reflector (CR) to make a second wavelength corresponding to a reflectivity peak of the CR the same as the target wavelength;
determining that the first wavelength or the second wavelength is not the same as the target wavelength;
tuning a phase section of the laser so that a round-trip optical path length is an integer multiple of the target wavelength; and
tuning a local heater to minimize a ratio of a first photocurrent exiting an interferometer of the bandpass filter to a second photocurrent exiting the CR.

16. The method of claim 15 , wherein the tuning the bandpass filter and the tuning the CR provide coarse tuning, and wherein the determining, the tuning the phase section, and the tuning the local heater provide fine tuning.

17. The method of claim 16 , further comprising:
performing the coarse tuning based on a lookup table generated before regular data communication begins; and

performing the fine tuning based on a first photodiode (PD) measuring the first photocurrent and a second PD measuring the second photocurrent after regular data communications begin.

Assignees

• Futurewei Technologies Inc

Inventors

• Chen Hongmin

Classifications

• H01S5/0014

  Measuring characteristics or properties thereof (measuring techniques per se G01J, G01K, G01N, G01R) · CPC title

• H01S5/3013

  AIIIBV compounds · CPC title

• H01S3/1062

  using a controlled passive interferometer, e.g. a Fabry-Perot etalon · CPC title

• H01S5/0612 Primary

  controlled by temperature · CPC title

• H01S5/1032

  Coupling to elements comprising an optical axis that is not aligned with the optical axis of the active region · CPC title