Image sensor
US-12094907-B2 · Sep 17, 2024 · US
US9508773B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9508773-B2 |
| Application number | US-201514804764-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 21, 2015 |
| Priority date | Feb 4, 2004 |
| Publication date | Nov 29, 2016 |
| Grant date | Nov 29, 2016 |
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A solid-state image pickup device 1 according to the present invention includes a semiconductor substrate 2 on which a pixel 20 composed of a photodiode 3 and a transistor is formed. The transistor comprising the pixel 20 is formed on the surface of the semiconductor substrate, a pn junction portion formed between high concentration regions of the photodiode 3 is provided within the semiconductor substrate 2 and a part of the pn junction portion of the photodiode 3 is extended to a lower portion of the transistor formed on the surface of the semiconductor substrate 2 . According to the present invention, there is provided a solid-state image pickup device in which a pixel size can be microminiaturized without lowering a saturated electric charge amount (Qs) and sensitivity.
Opening claim text (preview).
What is claimed is: 1. A solid-state image pickup device comprising: a photodiode in a semiconductor substrate, a groove portion is an indentation in semiconductor substrate that extends from a surface of the semiconductor substrate to the photodiode; a floating diffusion region of the semiconductor substrate at the surface of the semiconductor substrate, a portion of the semiconductor substrate separates the photodiode from the floating diffusion region; a gate insulating fil…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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