Systems and methods for monitoring and controlling industrial processes
US-2024361756-A1 · Oct 31, 2024 · US
US9508020B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9508020-B2 |
| Application number | US-201414333393-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 16, 2014 |
| Priority date | Jul 16, 2014 |
| Publication date | Nov 29, 2016 |
| Grant date | Nov 29, 2016 |
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An image processing system, and a method of operation thereof, includes: a local patch ternarization module for receiving an input image, for calculating a mean value of a local patch of pixels in the input image, and for calculating ternary values for the pixels based on the mean value; and an artifact removal module, coupled to the local patch ternarization module, for removing a residue artifact based on the ternary values and for generating an output image with the residue artifact removed for sending to an image signal processing hardware.
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What is claimed is: 1. A method of operation of an image processing system comprising: receiving an input image; calculating a mean value of a local patch of pixels in the input image; calculating ternary values for the pixels based on the mean value; removing a residue artifact based on the ternary values; and generating an output image with the residue artifact removed for sending to an image signal processing hardware. 2. The method as claimed in…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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