Projection exposure apparatus including mechanism to reduce influence of pressure fluctuations
US-2015316854-A1 · Nov 5, 2015 · US
US9507277B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9507277-B2 |
| Application number | US-201113811894-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 4, 2011 |
| Priority date | Jul 30, 2010 |
| Publication date | Nov 29, 2016 |
| Grant date | Nov 29, 2016 |
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A lithographic apparatus includes a support constructed to support a patterning device, the patterning device being capable of imparting a radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; a sensor array positioned and arranged to detect an acoustic wave from a movable part of the lithographic apparatus, a controller, the controller having a controller input connected to the sensor array so as to receive a sensor array output signal, and a controller output connected to at least one actuator arranged to act on the movable part, the controller being arranged to: calculate a movement of the movable part from the sensor array output signal, and drive via the controller output the at least one actuator in response to the calculated movement.
Opening claim text (preview).
What is claimed is: 1. A lithographic apparatus comprising: a patterning device being capable of forming a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; a sensor array positioned and arranged to detect an acoustic wave from a movable part of the lithographic apparatus; and a controller including a controller input connected to the sensor array to receive a sensor array output signal, and a controller output connected to an actuator arranged to act on the movable part, the controller configured to: calculate a movement of the movable part from the sensor array output signal, wherein the movement includes a vibration, or a resonance or a deformation or any combination thereof of the movable part, and drive via the controller output the actuator in response to the calculated movement, wherein the movable part comprises a chuck, and wherein the chuck comprises at least one of the substrate table and a support for holding the patterning device capable of imparting a radiation beam with a pattern in its cross-section to form the patterned radiation beam. 2. The lithographic apparatus of claim 1 , wherein the sensor array is disposed on a metrology frame of the lithographic apparatus, the metrology frame configured to hold at least part of the projection system, the sensor array being disposed around the projection system. 3. The lithographic apparatus of claim 1 , wherein the sensor array comprises a Micro-Electro-Mechanical Systems microphone array. 4. The lithographic apparatus of claim 1 , wherein a plurality of actuators are provided, the actuators being divided over a surface of the movable part. 5. The lithographic apparatus of claim 1 , wherein the sensor array is disposed in contact with the movable part. 6. A lithographic apparatus comprising: a patterning device being capable of forming a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; a sensor array positioned and arranged to detect an acoustic wave from a movable part of the lithographic apparatus; and a controller including a controller input connected to the sensor array to receive a sensor array output signal, and a controller output connected to an actuator arranged to act on the movable part, the controller configured to: calculate a movement of the movable part from the sensor array output signal, and drive via the controller output the actuator in response to the calculated movement, wherein the sensor array is disposed at least partly under the substrate table. 7. The lithographic apparatus of claim 6 , wherein the sensor array is disposed on a long stroke actuator that is constructed to drive the substrate table. 8. A lithographic apparatus comprising: a patterning device being capable of forming a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; a sensor array positioned and arranged to detect an acoustic wave from a movable part of the lithographic apparatus; and a controller including a controller input connected to the sensor array to receive a sensor array output signal, and a controller output connected to an actuator arranged to act on the movable part, the controller configured to: calculate a movement of the movable part from the sensor array output signal, and drive via the controller output the actuator in response to the calculated movement, wherein calculating the movement of the movable part includes determining a transformation of the sensor output signal to a frequency domain, and performing a filtering in the frequency domain. 9. A lithographic apparatus comprising: a patterning device being capable of forming a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; a sensor array positioned and arranged to detect an acoustic wave from a movable part of the lithographic apparatus; and a controller including a controller input connected to the sensor array to receive a sensor array output signal, and a controller output connected to an actuator arranged to act on the movable part, the controller configured to: calculate a movement of the movable part from the sensor array output signal, and drive via the controller output the actuator in response to the calculated movement, wherein calculating the movement of the movable part includes: determining a wave frequency representation from the sensor output signal; filtering the wave frequency representation; determining a sound pressure image of the movable part from the filtered wave frequency representation; and determining the movement of the movable part from the sound pressure image. 10. The lithographic apparatus of claim 9 , wherein filtering the wave frequency representation comprises: compensating for environmental disturbances by taking into account in the spatial frequency domain a known dynamical behaviour of at least one part of the lithographic apparatus, and/or differentiating between vibrations of the sensor array and vibrations induced by the movable part by taking into account in the spatial frequency domain a known dynamical behaviour of the sensor array. 11. The lithographic apparatus of claim 10 , wherein the known dynamical behaviour is determined by finite element analysis and/or modal analysis. 12. A lithographic apparatus comprising: a patterning device being capable of forming a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; a sensor array positioned and arranged to detect an acoustic wave from a movable part of the lithographic apparatus; and a controller including a controller input connected to the sensor array to receive a sensor array output signal, and a controller output connected to an actuator arranged to act on the movable part, the controller configured to: calculate a movement of the movable part from the sensor array output signal, and drive via the controller output the actuator in response to the calculated movement, wherein calculating the movement of the movable part comprises converting the sensor output signal into velocity information and converting the velocity information into displacement information. 13. A lithographic apparatus comprising: a patterning device being capable of forming a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; a sensor array positioned and arranged to detect an acoustic wave from a movable part of the lithographic apparatus; a controller including a controller input connected to the sensor array to receive a sensor array output signal, and a controller output connected to an actuator arranged to act on the movable part, the controller configured to: calculate a movement of the movable part from the sensor array output signal, wherein the movement includes a vibration, or a resonance or a deformation or any combination thereof of the movable part, and drive via the controller output the actuator in response to the calculated movement, and a second sensor array, the se
of mask or workpiece · CPC title
Position control, e.g. interferometers or encoders for determining the stage position · CPC title
Vibration, e.g. vibration detection, compensation, suppression or isolation · CPC title
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