Eyeglass fitting parameter measurement device and storage medium storing eyeglass fitting parameter measurement program
US-2016202498-A1 · Jul 14, 2016 · US
Methods and devices for evaluating eyewear fit
US9507175B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9507175-B2 |
| Application number | US-201213652854-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 16, 2012 |
| Priority date | Oct 16, 2012 |
| Publication date | Nov 29, 2016 |
| Grant date | Nov 29, 2016 |
How to read this patent
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
- Title
What the patent document calls the invention.
- Abstract
A short plain-language summary of the technical disclosure.
- Assignees and inventors
Who owns or filed the patent and who is credited as inventor.
- Key dates
Filing, priority, publication, and grant dates set the timeline.
- First independent claim
The legal scope of protection — read this for what is actually claimed.
- CPC / IPC classifications
Technology tags used to group this patent with similar filings.
- Citations and related patents
Prior art links and similar publications in this corpus.
Abstract
Official abstract text for this publication.
Methods and tools for evaluating fit of eyewear are provided. In an exemplary embodiment, the method includes steps of evaluating coverage provided by an eyewear article on the face of the wearer and evaluating a gap formed between a peripheral edge of the eyewear article and the face of the wearer.
First claim
Opening claim text (preview).
What is claimed is: 1. A gauge for evaluating fit of an eyewear article, comprising: an elongate body having first and second major surfaces and first and second end portions; a first sphere having a diameter D 1 proximate the first end; and a second sphere having a diameter D 2 proximate the second end; wherein the first major surface is calibrated with a scale extending between the first and second end portions comprising a marked zero location and markings on each side…
Assignees
Inventors
Classifications
- G02C13/003Primary
Physics · mapped topic
Physics · mapped topic
Patent family
Related publications grouped by family.
External sources
Next steps
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Frequently asked questions
Answers are generated from the same data shown on this page.
- What does patent US9507175B2 cover?
- Methods and tools for evaluating fit of eyewear are provided. In an exemplary embodiment, the method includes steps of evaluating coverage provided by an eyewear article on the face of the wearer and evaluating a gap formed between a peripheral edge of the eyewear article and the face of the wearer.
- Who is the assignee on this patent?
- 3M Innovative Properties Co
- What technology area does this patent fall under?
- Primary CPC classification G02C13/003. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Nov 29 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).