Microscope illumination system, microscope and oblique incident illumination method
US-9250432-B2 · Feb 2, 2016 · US
US9507138B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9507138-B2 |
| Application number | US-201113276698-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 19, 2011 |
| Priority date | Oct 20, 2010 |
| Publication date | Nov 29, 2016 |
| Grant date | Nov 29, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A microscope system as an optical microscope system for observing a specimen includes: an imaging optical system that forms an image of transmitted light or reflected light from the specimen; an illumination light source that illuminates illumination light on the specimen; an illumination optical system that has a first spatial light modulation element, which changes intensity distribution of the illumination light at a conjugate position of a pupil of the imaging optical system, and illuminates light, which is originated from the illumination light source, on the specimen; an image sensor that detects light through the imaging optical system; and a calculation section that calculates the intensity distribution of the illumination light appropriate for observation of the specimen on the basis of the intensity distribution of the illumination light formed by the first spatial light modulation element and output data detected by the image sensor.
Opening claim text (preview).
What is claimed is: 1. A microscope system as an optical microscope system for observing a specimen, the microscope system comprising: an imaging optical system that forms an image of transmitted light or reflected light from the specimen; an illumination light source that illuminates illumination light to the specimen; an illumination optical system that has a first spatial light modulation element, which forms beams of illumination light and which changes the intensity distr…
Electricity · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.