Sensor chip

Patent metadata

Field	Value
Publication number	US-9506885-B2
Application number	US-201514850031-A
Country	US
Kind code	B2
Filing date	Sep 10, 2015
Priority date	Sep 26, 2014
Publication date	Nov 29, 2016
Grant date	Nov 29, 2016

Abstract

A sensor chip comprises a substrate ( 1 ) with a front side ( 11 ) and a back side ( 12 ), and an opening ( 13 ) in the substrate ( 1 ) reaching through from its back side ( 12 ) to its front side ( 11 ). A stack ( 2 ) of dielectric and conducting layers is arranged on the front side ( 11 ) of the substrate ( 1 ), a portion of which stack ( 2 ) spans the opening ( 13 ) of the substrate ( 1 ). Contact pads ( 32 ) are arranged at the front side ( 11 ) of the substrate ( 1 ) for electrically contacting the sensor chip. A sensing element ( 4 ) is arranged on the portion of the stack ( 2 ) spanning the opening ( 13 ) on a side of the portion facing the opening ( 13 ).

First claim

The invention claimed is:

1. A sensor chip, comprising
a substrate with a front side and a back side,
an opening in the substrate reaching through from its back side to its front side,
a stack of dielectric and conducting layers arranged on the front side of the substrate, a portion of which stack spans the opening in the substrate,
contact pads arranged at the front side of the substrate for electrically contacting the sensor chip, and
a sensing element arranged on the portion of the stack spanning the opening on a side of the portion facing the opening,
wherein electronic circuitry is integrated into the sensor chip at the front side of the substrate.

2. A sensor chip according to claim 1 further comprising contacting elements arranged at said contact pads and protruding over a front surface of said substrate.

3. A sensor chip according to claim 1 , comprising
electrodes for interacting with the sensing element, which electrodes are arranged on or in the portion of the stack spanning the opening,
wherein the stack comprises a bottom dielectric layer facing the opening in the portion of the stack spanning the opening, and
wherein the electrodes are arranged in or on the bottom dielectric layer of the stack.

4. A sensor chip according to claim 1 , comprising
a heating structure for heating the sensing element, which heating structure is arranged on or in the portion of the stack spanning the opening.

5. A sensor chip according to claim 4 ,
wherein the stack comprises a bottom dielectric layer facing the opening in the portion of the stack spanning the opening, and wherein the heating structure is arranged in or on the bottom dielectric layer of the stack.

6. A sensor chip according to claim 1 , comprising
the contact pads being processed from a conducting layer of the stack which conducting layer is partially exposed in order to allow contacting, or
the stack being covered by a redistribution layer comprising an insulating layer containing conducting structures, which redistribution layer connects to the contact pads of the stack and provides its own contact pads accessible from the outside.

7. A sensor chip according to claim 6 , comprising
the stack of dielectric and conducting layers being a stack of CMOS layers defined for applying CMOS manufacturing processes.

8. A sensor chip according to claim 1 , comprising
a membrane arranged at the backside of the substrate and spanning the opening, which membrane is permeable for a medium to be measured.

9. A sensor chip according to claim 1 ,
wherein the sensing element is sensitive to at least one measurand, and
a) wherein said at least one measurand comprises humidity or
b) wherein said at least one measurand comprises a substance other than humidity.

10. Sensor A sensor chip according to claim 1 , comprising
another opening in the substrate reaching through from its back side to its front side,
another portion of the stack spanning the other opening in the substrate, and
another sensing element arranged on the other portion of the stack spanning the other opening on a side of the other portion facing the other opening.

11. A sensor module, comprising
a circuit board comprising contact pads, and
a sensor chip according to claim 1 arranged on the circuit board with the stack facing the circuit board and the sensing element facing away from the circuit board, and
wherein the contact pads of the sensor chip are electrically connected to the contact pads of the circuit board.

12. A sensor chip, comprising
a substrate with a front side and a back side,
an opening in the substrate reaching through from its back side to its front side,
a stack of dielectric and conducting layers arranged on the front side of the substrate, a portion of which stack spans the opening in the substrate,
contact pads arranged at the front side of the substrate for electrically contacting the sensor chip,
a sensing element arranged on the portion of the stack spanning the opening on a side of the portion facing the opening, and
a heating structure for heating the sensing element, which heating structure is arranged on or in the portion of the stack spanning the opening
wherein electronic circuitry is integrated into the sensor chip at the front side of the substrate.

13. A method for manufacturing a sensor chip, comprising the steps of
providing a substrate with a front side and a back side, and a stack of dielectric and conducting layers arranged on the front side of the substrate,
generating an opening in the substrate from its backside for uncovering a portion of the stack, and
applying a sensing element on the uncovered portion of the stack through the opening.

14. A method according to claim 13 ,
wherein the sensing element is applied by contactless dispensing sensitive material through the opening of the substrate from its backside.

15. A method according to claim 13 ,
wherein the opening in the substrate is generated by etching the substrate from its backside.

16. A method according to claim 13 ,
wherein prior to applying the sensing element through the opening, electrodes for interacting with the sensing element are manufactured through the opening on or in the uncovered portion of the stack.

17. A method according to claim 16 ,
wherein prior to applying the sensing element and after having manufactured the electrodes, a protective coating is applied on top of the electrodes, and wherein the sensing element is applied onto the protective coating.

18. A method according to claim 13 ,
wherein prior to applying the sensing element through the opening, a heating structure for heating the sensing element is manufactured through the opening on or in the uncovered portion of the stack.

19. A method according to claim 18 ,
wherein prior to applying the sensing element and after having manufactured the heating structure, a protective coating is applied on top of the heating structure, and
wherein the sensing element is applied onto the protective coating.

20. A method according to claim 13 ,
wherein the substrate is provided in form of a wafer for building multiple sensor chips from,
wherein openings for multiple sensing elements are generated in the wafer from its backside,
wherein a sensing element is applied in each opening of the wafer, and
wherein the wafer is diced into the multiple sensor chips after having applied the sensing elements.

Assignees

• Sensirion Ag

Inventors

• Mayer Felix
• Bartsch Ulrich
• Winger Martin
• Graf Markus
• Gerner Pascal

Classifications

• H10W70/60

  Insulating or insulated package substrates; Interposers; Redistribution layers (leadframes H10W70/40) · CPC title

• G01N33/0036

  specially adapted to detect a particular component (physical analysis of gaseous biological material G01N33/497) · CPC title

• G01N27/225 Primary

  by using hygroscopic materials · CPC title

• G01N27/14

  of an electrically-heated body in dependence upon change of temperature · CPC title

• G01N27/048 Primary

  for determining moisture content of the material · CPC title