Measurement system

US9506736B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9506736-B2
Application numberUS-201514643076-A
CountryUS
Kind codeB2
Filing dateMar 10, 2015
Priority dateApr 10, 2014
Publication dateNov 29, 2016
Grant dateNov 29, 2016

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A measurement system identifies geometric errors by using an initial position measurement step for specifying coordinates and dimensions of a target sphere, and an indexing measurement step for positioning rotary axes according to a plurality of indexing conditions and identifying geometric errors from sensor measured coordinate values corresponding to coordinate values obtained by measuring the target sphere with a sensor of a touch probe. Then, in the indexing measurement step, coordinates of the target sphere can be obtained by simply measuring the target sphere with the sensor only three times, using dimensions of the target sphere obtained in the initial position measurement step.

First claim

Opening claim text (preview).

What is claimed is: 1. A measurement system for measuring geometric errors of a multi-axis machine tool having three linear axes and two rotary axes, the multi-axis machine tool having a sensor provided in one of a main spindle and a table and a target provided in the other one, using an initial position measurement step for specifying coordinates of the target or the sensor and dimensions of the target, and an indexing measurement step for positioning the rotary axes according to a plurality of indexing conditions and identifying geometric errors from sensor measured coordinate values corresponding to coordinate values obtained by measuring the target with the sensor, wherein in the indexing measurement step, the target is measured with the sensor only three times to obtain center coordinates of the target, using the dimensions of the target obtained in the initial position measurement step. 2. The measurement system according to claim 1 , wherein: the target is a sphere; the dimensions of the target obtained in the initial position measurement step correspond to a diameter value or a radius value; and in the indexing measurement step, the diameter value or the radius value is referenced to obtain the sensor measured coordinate values so as to obtain center coordinates of the target. 3. The measurement system according to claim 2 , wherein the sensor performs a uniaxial operation along each of the three linear axes to approach the target, and center coordinates of the target are obtained by subtracting the diameter value or the radius value of the sphere serving as the target in the case of making the sensor approach the target from a plus direction of any of the linear axes, or center coordinates of the target are obtained by adding the diameter value or the radius value of the sphere serving as the target in the case of making the sensor approach the target from a minus direction of any of the linear axes.

Assignees

Inventors

Classifications

  • G01B5/008Primary

    using coordinate measuring machines · CPC title

  • Calibration or calibration artifacts (G01B3/30, G01B9/02072 take precedence) · CPC title

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What does patent US9506736B2 cover?
A measurement system identifies geometric errors by using an initial position measurement step for specifying coordinates and dimensions of a target sphere, and an indexing measurement step for positioning rotary axes according to a plurality of indexing conditions and identifying geometric errors from sensor measured coordinate values corresponding to coordinate values obtained by measuring th…
Who is the assignee on this patent?
Okuma Machinery Works Ltd
What technology area does this patent fall under?
Primary CPC classification G01B5/008. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 29 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).