Method of semiconductor manufacture utilizing layer arrangement to improve autofocus

US9502282B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9502282-B2
Application numberUS-201414586915-A
CountryUS
Kind codeB2
Filing dateDec 30, 2014
Priority dateJan 7, 2014
Publication dateNov 22, 2016
Grant dateNov 22, 2016

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Abstract

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In a method of manufacturing a semiconductor device using high-NA ArF liquid immersion exposure of a photoresist, a layer arrangement is provided capable of increasing reflection of a reference beam in an oblique incidence autofocus optical system, thereby enhancing autofocus and making it possible to reduce variation in the diameter of a contact hole.

First claim

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What is claimed is: 1. A method of manufacturing a semiconductor integrated circuit device comprising the steps of: (a) forming a first silicon nitride-based insulating film over a first main surface of a semiconductor wafer; (b) forming a first silicon oxide-based insulating film over the first silicon nitride-based insulating film; (c) forming a second silicon nitride-based insulating film over the first silicon oxide-based insulating film; d) applying a carbon-rich film d…

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What does patent US9502282B2 cover?
In a method of manufacturing a semiconductor device using high-NA ArF liquid immersion exposure of a photoresist, a layer arrangement is provided capable of increasing reflection of a reference beam in an oblique incidence autofocus optical system, thereby enhancing autofocus and making it possible to reduce variation in the diameter of a contact hole.
Who is the assignee on this patent?
Renesas Electronics Corp
What technology area does this patent fall under?
Primary CPC classification H10P76/2043. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Nov 22 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).