Ion trap analyzer and ion trap mass spectrometry analysis method

Patent metadata

Field	Value
Publication number	US-9502228-B2
Application number	US-201314389516-A
Country	US
Kind code	B2
Filing date	Mar 26, 2013
Priority date	Mar 31, 2012
Publication date	Nov 22, 2016
Grant date	Nov 22, 2016

Abstract

An ion trap analyzer, an ion trap mass spectrometry analysis method, and an ion fragmentation method are provided. The ion trap analyzer includes an ion trapping space enclosed by multiple electrodes ( 101, 102, 103, 11, 12, 214 ), where a high-frequency voltage is applied on at least a part of the electrodes, so as to generate, within the trapping space, a trapping electric field dominated by a quadratic field. The apparatus is provided with an ion ejection outlet ( 200 ) in at least one direction away from the center of the trap; an alternating voltage signal used for resonant excitation of ion motions is overlaid on an electrode part that is on a side of the ion ejection outlet and closest to the ejection outlet, while no voltage signal that is identical in range and phase with the alternating voltage is applied on at least one remaining electrode part in said direction. With the method, or by further applying, to the remaining electrode part in said direction, a voltage signal that is inverted to the alternating voltage, the orientation of an alternating electric field induced by the excitation alternating voltage signal can be limited, thereby improving the resonance ejection efficiency of the ion trap, reducing, in ion motions, motion coupling between an ejection direction and a non-ejection direction, and improving the viability of selecting the ion trap as a mass analyzer.

First claim

What is claimed is:

1. An ion trap analyzer, comprising:
multiple confining electrodes,
an ion trapping space enclosed by the multiple confining electrodes,
a voltage source configured to apply a trapping voltage to at least one confining electrode of the multiple confining electrodes, so as to generate a trapping electric field in the ion trapping space,
at least one ion ejection outlet provided on a side of the ion trapping space, the ion ejection outlet defining an ion ejection direction, and
an excitation voltage source,
wherein confining electrodes on the same side of the ion trapping space as the ion ejection outlet are divided into multiple electrode parts in a direction perpendicular to the ion ejection direction,
wherein the voltage source is further configured to overlay at least one of in-phase alternating trapping voltages or DC trapping voltages on the multiple electrode parts so as to form a substantially quadratic trapping electric field in the ion ejection direction, and
wherein the excitation voltage source is configured to overlay an alternating voltage signal whose amplitude is less than or equal to a maximum absolute value of the trapping voltage on a first electrode part of the multiple electrode parts, the first electrode part being adjacent to the ion ejection outlet, so as to select a motion range of ions by means of resonant excitation, and such that no voltage signal having the same phase as said alternating voltage signal is applied on a second electrode part of the multiple electrode parts except the first electrode part, and
wherein the excitation voltage source is further configured to overlay an alternating voltage signal inverted to the alternating voltage signal on the second electrode part.

2. The ion trap analyzer according to claim 1 , wherein the voltage source is further configured to overlay the in-phase alternating trapping voltages on the first electrode part and the second electrode part, respectively.

3. The ion trap analyzer according to claim 1 , further comprising a power supply, wherein the power supply is configured to apply, on another confining electrode which is in a direction substantially opposite the first electrode part and is located on a side different from the ion ejection outlet, an alternating voltage signal inverted to said alternating voltage signal, so as to generate a dipole alternating excitation electric field in a positive direction and a negative direction of the ion ejection outlet.

4. The ion trap analyzer according to claim 1 , further comprising a power supply, wherein the power supply is configured to apply, on another confining electrode which is in a direction substantially opposite the first electrode part and is located on a side different from the ion ejection outlet, an alternating voltage signal having the same phase as said alternating voltage signal, so as to generate a quadrupole alternating excitation electric field in a positive direction and a negative direction of the ion ejection outlet.

5. The ion trap analyzer according to claim 1 , wherein the ion trap analyzer is a linear ion trap of which the trapping electric field is a two-dimensional quadrupole trapping electric field.

6. The ion trap analyzer according to claim 5 , wherein the ion ejection outlet comprises an ejection slot perpendicular to an axial direction of the two-dimensional quadrupole trapping electric field.

7. The ion trap analyzer according to claim 5 , wherein the ion ejection outlet comprises an ion ejection outlet on at least one side of an axial direction of the two-dimensional quadrupole trapping electric field.

8. The ion trap analyzer according to claim 1 , wherein the ion trap analyzer is a static ion trap of which the trapping electric field is a one-dimensional quadratic trapping electric field.

9. The ion trap analyzer according to claim 1 , wherein the ion trap analyzer is a three-dimensional ion trap of which the trapping electric field is a rotating quadrupole electric field.

10. The ion trap analyzer according to claim 1 , further comprising a common power supply unit, wherein the common power supply unit is configured to apply a common voltage signal on the first electrode part and the second electrode part.

11. The ion trap analyzer according to claim 10 , wherein the common power supply unit further comprises a voltage attenuator, and the voltage attenuator is configured to attenuate the common voltage signal applied on the second electrode part relative to a DC reference potential.

12. The ion trap analyzer according to claim 1 , wherein the trapping voltage is a digital voltage having a frequency of 1 Hz to 100 MHz.

13. The ion trap analyzer according to claim 1 , wherein the alternating voltage signal is a combined voltage signal of non-single-frequency discrete voltage signals or voltage signals of continuous frequencies.

14. The ion trap analyzer according to claim 1 , further comprising a field adjustment electrode inserted in the ion ejection outlet, wherein the field adjustment electrode is located in the ion ejection direction, and is outside of the trapping space;
and in the multiple electrode parts, the alternating voltage signal is only applied on the field adjustment electrode.

Assignees

• Shimadzu Corp

Inventors

• Jiang Gongyu
• Sun Wenjian

Classifications

• H01J49/4245

  Electrostatic ion traps (H01J49/422 takes precedence) · CPC title

• H01J49/423

  with radial ejection · CPC title

• H01J49/4225 Primary

  Multipole linear ion traps, e.g. quadrupoles, hexapoles · CPC title

• H01J49/4285 Primary

  Applying a resonant signal, e.g. selective resonant ejection matching the secular frequency of ions (H01J49/429, H01J49/428 take precedence) · CPC title

• H01J49/424

  Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes · CPC title