Apparatus and method for acquiring optimal multi-energy X-ray image

Patent metadata

Field	Value
Publication number	US-9492133-B2
Application number	US-201313845742-A
Country	US
Kind code	B2
Filing date	Mar 18, 2013
Priority date	Oct 25, 2012
Publication date	Nov 15, 2016
Grant date	Nov 15, 2016

Abstract

An apparatus and method for acquiring an optimal MEX image may include an X-ray source to generate an X-ray and to irradiate the X-ray, an energy identification detector to acquire a MEX image that is generated when the irradiated X-ray penetrates an object, and an optimal MEX processor to generate an optimal MEX parameter based on a characteristic of the object and to control at least one of the X-ray source and the energy identification detector based on the generated optimal MEX parameter.

First claim

What is claimed is:

1. An apparatus for acquiring an X-ray image, the apparatus comprising:
an X-ray source which generates X-rays and irradiates the X-rays onto an object;
a detector which acquires the X-ray image being generated when the X-rays penetrate the object; and
a processor which generates a source optimal parameter and a detector optimal parameter based on a characteristic of the object, and controls the X-ray source and the detector based on the generated source optimal parameter and the generated detector optimal parameter, respectively,
wherein the processor generates the source optimal parameter and the detector optimal parameter by:
simulating a plurality of parameters related to the X-ray source and the detector, and
selecting the source optimal parameter and the detector optimal parameter from the plurality of parameters.

2. The apparatus of claim 1 , wherein the characteristic of the object comprises at least one of a thickness of the object, a type of a contrast medium to be injected into the object, a dose of the contrast medium, and a density of the object.

3. The apparatus of claim 1 , wherein the processor comprises:
an information collector which collects information for generating the source optimal parameter and the detector optimal parameter; and
a parameter selector which selects the source optimal parameter and the detector optimal parameter, based on the collected information.

4. The apparatus of claim 1 , wherein the processor comprises:
an X-ray source controller which controls the X-ray source based on the selected source optimal parameter.

5. The apparatus of claim 1 , wherein the source optimal parameter comprises at least one of a type of a material of an anode target, a tube voltage, a tube current, and an exposure time.

6. The apparatus of claim 1 , wherein the processor comprises:
a detector controller which controls the detector based on the selected detector optimal parameter.

7. The apparatus of claim 1 , wherein the detector optimal parameter comprises at least one of an energy threshold and an energy threshold offset table.

8. An apparatus for acquiring an X-ray image, the apparatus comprising:
an X-ray source which generates X-rays and irradiates the X-rays onto an object;
a detector which acquires the X-ray image being generated when the X-rays penetrate the object; and
a processor which generates an optimal parameter based on a characteristic of the object, and controls at least one of the X-ray source and the detector based on the generated optimal parameter,
wherein the processor comprises:
a system simulator which determines a quality of a final image based on a plurality of parameters by performing modeling and simulation and selects the optimal parameter, from the plurality of parameters.

9. The apparatus of claim 8 , wherein the system simulator defines information regarding at least one of the X-ray source, the detector and a phantom, and performs modeling.

10. The apparatus of claim 9 , wherein the system simulator calculates a spectrum shape changed based on an anode target, a filter and a tube voltage, calculates a dose obtained by multiplying a tube current and an exposure time, and performs modeling of the X-ray source.

11. The apparatus of claim 9 , wherein the system simulator estimates a detector response by performing a detector threshold scan, and performs modeling of the detector.

12. The apparatus of claim 9 , wherein the system simulator performs modeling of the phantom based on a tissue-equivalent material having the same X-ray absorption characteristic as that of a tissue to be imaged.

13. A method of acquiring an X-ray image, the method comprising:
generating a source optimal parameter and a detector optimal parameter, based on a characteristic of an object to be imaged; and
controlling an X-ray source and a detector based on the generated source optimal parameter and the generated detector optimal parameter, respectively,
wherein the generating the source optimal parameter and the detector optimal parameter comprises:
simulating a plurality of parameters related to the X-ray source and the detector, and
selecting the source optimal parameter and the detector optimal parameter from the plurality of parameters.

14. The method of claim 13 , wherein the source optimal parameter is associated with a control condition of the X-ray source, and
the detector optimal parameter is associated with a control condition of the detector.

15. The method of claim 13 , wherein the source optimal parameter comprises at least one of a type of a material of an anode target, a tube voltage, a tube current, and an exposure time.

16. The method of claim 13 , wherein the detector optimal parameter comprises at least one of an energy threshold and an energy threshold offset table.

17. A non-transitory computer-readable recording medium storing a program which, when executed by a computer, causes the computer to execute the method of claim 13 .

18. An X-ray imaging apparatus comprising:
an X-ray source which generates X-rays and irradiates the X-rays onto an object;
a detector which acquires an image being generated when the X-rays penetrate the object; and
a processor which controls at least one of the X-ray source and the detector based on an optimal parameter which is generated by:
determining an object parameter peculiar to the object,
modeling the X-ray source based on the object parameter to obtain source parameters,
modeling the detector based on the source parameters, and
selecting an optimal source parameter and an optimal detector parameter.

19. The apparatus of claim 18 , wherein the optimal parameter is further generated by:
iteratively simulating the X-ray source and the detector based on a phantom which possesses the same X-ray absorption characteristics as that of a tissue to be imaged in the object,
determining whether an image generated as a result of a simulation is within a range of set quality parameters, and
selecting the optimal source parameter and the optimal detector parameter, from simulation results, when the image is determined to be within the range of the set quality parameters.

20. The apparatus of claim 18 , wherein the object parameter comprises at least one of a thickness of the object, a type of a contrast medium to be injected into the object, a dose of the contrast medium, and a density of the object, and is determined during a pre-examination proceeding.

Assignees

• Samsung Electronics Co Ltd

Inventors

• Kang Dong Goo
• Kang Sung Hoon
• Kim Sung Su
• Sung Young Hun
• Oh Hyun Hwa
• Han Seok Min

Classifications

• A61B6/405

  Source units specially adapted to modify characteristics of the beam during the data acquisition process (A61B6/4021, A61B6/4035 take precedence) · CPC title

• A61B6/482

  involving multiple energy imaging · CPC title

• A61B6/544

  dependent on patient size · CPC title

• A61B6/583

  using calibration phantoms · CPC title

• A61B6/0414

  with compression means · CPC title