Method of manufacturing EUV photo masks
US-12085843-B2 · Sep 10, 2024 · US
US9488917B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9488917-B2 |
| Application number | US-201514769713-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 16, 2015 |
| Priority date | Oct 28, 2014 |
| Publication date | Nov 8, 2016 |
| Grant date | Nov 8, 2016 |
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Embodiments of the present disclosure provide a mask and a fabrication method thereof, and a method of patterning by using a mask. The mask comprises: a first substrate and a second substrate disposed oppositely; a liquid crystal layer located between the first substrate and the second substrate; a transparent conductive layer formed on the first substrate, the transparent conductive layer and the liquid crystal layer being located on a same side of the first substrate; and a mask pattern made of a non-transparent conductive material formed on the second substrate, wherein the mask pattern and the transparent electrode are configured to be capable of generating an electric field therebetween, so as to drive liquid crystal molecules in the liquid crystal layer to deflect.
Opening claim text (preview).
The invention claimed is: 1. A mask, comprising: a first substrate and a second substrate disposed oppositely; a liquid crystal layer located between the first substrate and the second substrate; a transparent conductive layer formed on the first substrate, the transparent conductive layer and the liquid crystal layer being located on a same side of the first substrate; and a mask pattern of a non-transparent conductive material formed on the second substrate, wherein the…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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