Device and method for measuring plant growth conditions
US-2015369786-A1 · Dec 24, 2015 · US
US9488609B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9488609-B2 |
| Application number | US-201414174768-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 6, 2014 |
| Priority date | Feb 6, 2014 |
| Publication date | Nov 8, 2016 |
| Grant date | Nov 8, 2016 |
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A method includes applying a current to a specimen to deposit a material on the specimen. The method also includes determining a quantity of the material deposited at multiple locations of the specimen and determining anisotropic conductive characteristics of the specimen based on the quantity of the material deposited at the multiple locations on the specimen.
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What is claimed is: 1. A method for determining anisotropic conductive characteristics of a specimen, comprising: applying a first current to a specimen to deposit a material on the specimen, the specimen including a first composite material; determining a quantity of the material deposited at a first set of multiple locations on an edge of the specimen, wherein determining the quantity at a particular location of the first set of multiple locations includes measuring a height of a layer of the material deposited at the particular location; determining anisotropic conductive characteristics of the specimen based on the quantity of the material deposited at the first set of multiple locations on the specimen, wherein determining the conductive characteristics includes estimating a current density distribution of a portion of the specimen responsive to the first current; applying a second current to a second specimen to deposit the material on the second specimen, wherein the second specimen includes a second composite material, and wherein the second composite material is different from the first composite material; determining a second quantity of the material deposited at a second set of multiple locations of the second specimen; performing a comparison of the anisotropic conductive characteristics of the specimen and second anisotropic conductive characteristics of the second specimen; and based on the anisotropic conductive characteristics of the specimen, predicting performance of a component formed of the first composite material and the second composite material. 2. The method of claim 1 , wherein the specimen includes a carbon-fiber composite. 3. The method of claim 1 , wherein the material includes copper. 4. The method of claim 1 , wherein determining the quantity of the material deposited at the particular location of the first set of multiple locations includes using an optical measurement device to measure the height of the layer of the material deposited at the particular location. 5. The method of claim 1 , further comprising contacting a first portion of the specimen with a plating solution before applying the first current, wherein the first current is applied at a second portion of the specimen, and wherein the specimen anisotropically conducts the first current from the first portion of the specimen to the second portion of the specimen. 6. The method of claim 5 , wherein the first portion of the specimen includes a first edge of the specimen and the second portion of the specimen is proximate a center of the specimen. 7. The method of claim 6 , further comprising, after determining the quantity of the material deposited at multiple locations of the specimen: removing at least a section of the first edge of the specimen to form a second edge of the specimen; contacting a portion of the specimen with the plating solution; applying a third current to the specimen to deposit the material on the specimen at the second edge; determining a third quantity of the material deposited at a third set of multiple locations of the second edge of the specimen; and determining third anisotropic conductive characteristics of the specimen based on the quantity of the material deposited at the third set of multiple locations on the second edge. 8. The method of claim 7 , further comprising generating a 3-dimensional map of a current density distribution of the specimen based on the anisotropic conductive characteristics and the third anisotropic conductive characteristics. 9. The method of claim 1 , wherein applying the first current comprises applying a first voltage to the specimen, wherein applying the second current to the second specimen comprises applying a second voltage to the second specimen, and wherein the first voltage is different from the second voltage. 10. The method of claim 1 , wherein determining the anisotropic conductive characteristics includes generating a two dimensional map of a current density distribution associated with the specimen, and further comprising: selecting a material for use in forming a component based on at least partially on the comparison. 11. The method of claim 1 , wherein the first current is applied to the specimen via a first connector coupled to the specimen, wherein the second current is applied to the second specimen via a second connector coupled to the second specimen, wherein the first connector is different from the second connector, and further comprising selecting a connector for use with a component based at least partially on the comparison. 12. The method of claim 1 , wherein the first current is applied to the specimen via a first connector that is coupled to the specimen using a first assembly process, wherein the second current is applied to the second specimen via a second connector coupled to the second specimen using a second assembly process, wherein the first assembly process is different from the second assembly process, and further comprising selecting an assembly process for coupling the first connector or the second connector to a component based at least partially on the comparison, the component including the first composite material. 13. The method of claim 12 , wherein the first connector is different from the second connector. 14. The method of claim 12 , wherein the first assembly process includes using a first interface material between the first connector and the specimen and the second assembly process includes using a second interface material between the second connector and the second specimen, wherein the first interface material is different from the second interface material. 15. A method for determining anisotropic conductive characteristics of a specimen, comprising: after contacting a first portion of a first edge of a specimen with a plating solution, applying a first current to a portion of the specimen to deposit a material on the specimen; determining a first quantity of the material deposited at a first location of the first portion of the specimen; determining first anisotropic conductive characteristics of the specimen based on the first quantity of the material; after determining the first quantity: removing at least a section of the first edge of the specimen to form a second edge of the specimen; after contacting a second portion of the second edge with the plating solution, applying a second current to the specimen to deposit the material on the specimen at the second edge; determining a second quantity of the material deposited at a second location of the second edge of the specimen; and determining second anisotropic conductive characteristics of the specimen based on the second quantity of the material; and outputting information related to performance of a component formed of the material, the information based on at least one of the first anisotropic conductive characteristics of the specimen and the second anisotropic conductive characteristics of the specimen. 16. The method of claim 15 , wherein the second portion of the specimen is proximate to a center of the specimen, wherein determining the quantity at the first location includes measuring a first height of a layer of the material deposited at the first location, and wherein the specimen anisotropically conducts the first current from the first portion of the specimen to the second portion of the specimen. 17. The method of claim 15 , wherein determining the first anisotropic conductive characteristics includes generating a two dimensional map of a current density distribution of the first ed
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