Magnetic random access memory with multilayered seed structure
US-2015340598-A1 · Nov 26, 2015 · US
US9484529B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9484529-B2 |
| Application number | US-201615098503-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 14, 2016 |
| Priority date | Apr 21, 2010 |
| Publication date | Nov 1, 2016 |
| Grant date | Nov 1, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A magnetic memory device is provided. The magnetic memory device includes a first vertical magnetic layer and a second vertical magnetic layer on a substrate, a tunnel barrier layer between the first vertical magnetic layer and the second vertical magnetic layer, and an exchange-coupling layer between a first sub-layer of the first vertical magnetic layer and a second sub-layer of the first vertical magnetic layer.
Opening claim text (preview).
What is claimed is: 1. A memory device comprising: a free layer including Co; a reference layer comprising; a first contact magnetic layer including CoFeB; a vertical magnetic layer including a first sub-layer layer and a second sub-layer; and an exchange coupling layer disposed between the first sub-layer and the second sub-layer; and a tunnel barrier layer disposed between the free layer and the reference layer. 2. The memory device of claim 1 , wherein the free layer further comprises Fe. 3. The memory device of claim 2 , wherein the free layer further comprises B. 4. The memory device of claim 3 , wherein the free layer further comprises Ni. 5. The memory device of claim 1 , further comprising a capping layer on the free layer. 6. The memory device of claim 5 , wherein the capping layer includes at least one of Ta, TaN or TiN. 7. The memory device of claim 1 , wherein the first sub-layer includes Co. 8. The memory device of claim 7 , wherein the first sub-layer further comprises Ir. 9. The memory device of claim 7 , wherein the second sub-layer includes Co. 10. The memory device of claim 9 , wherein the second sub-layer further comprises Pt. 11. The memory device of claim 1 , wherein the exchange coupling layer includes at least one of Ru, Rh, Cr or Ir. 12. A memory device comprising: a first magnetic layer; a non-magnetic layer on the first magnetic layer; a second magnetic layer on the non-magnetic layer, the non-magnetic layer disposed between the first magnetic layer and the second magnetic layer; a junction magnetic layer on second magnetic layer; a tunnel barrier on the junction magnetic layer, the junction magnetic layer disposed between the first magnetic layer and the tunnel barrier; a free layer on the tunnel barrier, the tunnel barrier disposed between the free layer and the junction magnetic layers; and a capping layer. 13. The memory device of claim 12 , wherein magnetization directions of the first and second magnetic layers are perpendicular with respect to a plane of the tunnel barrier. 14. The memory device of claim 12 , wherein the junction magnetic layer comprises at least one of cobalt (Co), iron (Fe), or nickel (Ni). 15. The memory device of claim 12 , wherein the first magnetic layer comprise at least one of cobalt (Co) or platinum (Pt). 16. The memory device of claim 12 , wherein the first magnetic layer comprise at least one of Ta, Al, Cu, Au, Ag, TaN, or TiN. 17. The memory device of claim 12 , wherein the non-magnetic layer comprises an exchange coupling layer. 18. The memory device of claim 17 , wherein the exchange coupling layer comprise at least one of Ru, Rh, Cr or Ir. 19. The memory device of claim 12 , wherein the first magnetic layer, the non-magnetic layer and the second magnetic layer comprises a reference layer. 20. The memory device of claim 12 , wherein the first magnetic layer includes at least one of Co or Pt.
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Materials of the active region · CPC title
Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.