Debug configuration tool with layered graphical user interface

US9483373B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9483373-B2
Application numberUS-201414253427-A
CountryUS
Kind codeB2
Filing dateApr 15, 2014
Priority dateFeb 14, 2014
Publication dateNov 1, 2016
Grant dateNov 1, 2016

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A debug configuration tool for configuration of on-chip debug features comprises a database comprising predefined analysis points, each relating to a configurable chip entity, and comprising a configurable condition and a configurable action for the chip entity, a plurality of predefined analysis groups, each relating to a group of configurable chip entities, and comprising a configurable condition and a configurable action for the group of chip entities. The tool comprises a graphical user interface module arranged to display representations of at least some of the analysis points and the analysis groups on different levels of detail, and to receive input from a user to set the configurable conditions and/or actions for the displayed analysis points and the analysis groups. An application program interface module processes data received from the graphical user interface module to obtain debug settings and to communicate the debug settings to a debug target system configuration module.

First claim

Opening claim text (preview).

The invention claimed is: 1. A debug configuration tool embodied on a non-transitory machine-readable storage medium on a computer for configuration of on-chip debug features of a system-on-a-chip (SoC), the debug configuration tool comprising: a database comprising: a plurality of predefined analysis points, each of the analysis points relating to a configurable chip entity, and comprising a configurable condition and a configurable action for the chip entity; a plurality of predefined analysis groups, each of the analysis groups relating to a group of configurable chip entities, and comprising a configurable condition and a configurable action for the group of chip entities; a graphical user interface module arranged to: display representations of at least some of the analysis points and the analysis groups on different levels of detail; receive input from a user to set the configurable conditions and/or actions for the displayed analysis points and the analysis groups; an application program interface module arranged to process data received from the graphical user interface module to obtain debug settings and to communicate the debug settings to a debug target system configuration module. 2. The debug configuration tool according to claim 1 , wherein the graphical user interface module is arranged to display the representations of the analysis points and/or analysis groups on different graphical layers reflecting the levels of detail. 3. The debug configuration tool according to claim 2 , wherein each of the analysis groups relates to a chip module and is associated with one or more analysis points that relate to sub-modules of the chip module. 4. The debug configuration tool according claim 3 , wherein the graphical user interface module is arranged to receive input from the user to define a cross triggering event between the analysis points and/or the analysis groups. 5. The debug configuration tool according to claim 4 , wherein the graphical user interface module is arranged to set a specified action of a first analysis point and set a specified condition of a second analysis point, the specified condition being dependent on the specified action. 6. The debug configuration tool according to claim 5 , wherein the application program interface module is arranged to: set a condition for an analysis group related to a chip module, to obtain a condition setting; propagate the condition setting top-down to analysis groups and or analysis points of lower level sub-modules of the chip module. 7. The debug configuration tool according to claim 6 , wherein the application program interface module comprises a set of API functions containing subsets of API functions for each of the different levels of detail. 8. The debug configuration tool according to claim 7 , wherein the application program interface module comprises an API function that sets a module condition for an analysis group at a module level for a frame manager of a Data Path Acceleration Architecture block, the module condition being defined by the matching of those frames conforming to a 3-tuple criteria, the 3-tuple comprising a protocol type, a source address and destination address of a frame. 9. The debug configuration tool according to claim 1 , wherein each of the analysis groups relates to a chip module and is associated with one or more analysis points that relate to sub-modules of the chip module. 10. The debug configuration tool according claim 1 , wherein the graphical user interface module is arranged to receive input from the user to define a cross triggering event between the analysis points and/or the analysis groups. 11. The debug configuration tool according to claim 1 , wherein the application program interface module is arranged to: set a condition for an analysis group related to a chip module, to obtain a condition setting; propagate the condition setting top-down to analysis groups and or analysis points of lower level sub-modules of the chip module. 12. The debug configuration tool according to claim 1 , wherein the application program interface module comprises a set of API functions containing subsets of API functions for each of the different levels of detail. 13. A method for configuration of on-chip debug features, the method comprising: defining analysis points, each of the analysis points relating to a configurable chip entity, and comprising a configurable condition and a configurable action for the chip entity; defining analysis groups, each of the analysis groups relating to a group of configurable chip entities, and comprising a configurable condition and a configurable action for the group of chip entities; storing the predefined analysis points and predefined analysis groups; displaying, by means of a graphical user interface, representations of at least some of the analysis points and the analysis groups on different levels of detail; receiving, by means of the graphical user interface, input from a user to set the configurable conditions and/or actions for the displayed analysis points and the analysis groups; processing data received from the graphical user interface module to obtain debug settings and communicating the debug settings to a debug target system configuration module. 14. The method according to claim 13 , wherein the representations of the analysis points and/or analysis groups are displayed on different graphical layers reflecting the levels of detail. 15. The method according to claim 14 , wherein each of the analysis groups relates to a chip module and is associated with one or more analysis points that relate to sub-modules of the chip module. 16. The method according to claim 15 , wherein the graphical user interface is arranged to receive input from the user to define a cross triggering event between the analysis points and/or the analysis groups. 17. The method according to claim 16 , wherein the graphical user interface is arranged to set a specified action of a first analysis point and set a specified condition of a second analysis point, the specified condition being dependent on the specified action. 18. The method according to claim 17 , wherein the method comprises: setting a condition for an analysis group related to a chip module, to obtain a condition setting; propagating the condition setting top-down to analysis groups and or analysis points of lower level sub-modules of the chip module.

Assignees

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Classifications

  • G06F11/26Primary

    Functional testing · CPC title

  • Environments for analysis, debugging or testing of software · CPC title

  • Physics · mapped topic

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What does patent US9483373B2 cover?
A debug configuration tool for configuration of on-chip debug features comprises a database comprising predefined analysis points, each relating to a configurable chip entity, and comprising a configurable condition and a configurable action for the chip entity, a plurality of predefined analysis groups, each relating to a group of configurable chip entities, and comprising a configurable condi…
Who is the assignee on this patent?
Badea Dragos Adrian, Lauric Petru, Freescale Semiconductor Inc
What technology area does this patent fall under?
Primary CPC classification G06F11/26. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 01 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).