Semiconductor device
US-2015380400-A1 · Dec 31, 2015 · US
US9478672B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9478672-B2 |
| Application number | US-201313959904-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 6, 2013 |
| Priority date | Aug 6, 2012 |
| Publication date | Oct 25, 2016 |
| Grant date | Oct 25, 2016 |
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A diode is provided which includes at least one diode element which has a plurality of N-type regions and a plurality of P-type regions, the N-type regions and the P-type regions being alternately arranged in series to form PN junctions, and an insulated substrate which has electric insulation. The N-type regions and the P-type regions are formed on the insulated substrate.
Opening claim text (preview).
What is claimed is: 1. A diode, comprising: at least one diode element which has a plurality of N-type regions and a plurality of P-type regions, the N-type regions and the P-type regions being alternately arranged in series to form PN junctions; and an insulated substrate which has electric insulation and includes quartz glass, sapphire, or alumina ceramics, wherein the N-type regions and the P-type regions are formed on the insulated substrate, the N-type regions and the P-type regions are formed in polycrystalline silicon carbide or single-crystal silicon carbide, a Zener voltage of a unit diode including a set of the N-type region and the P-type region is between 20 V and, 28 V, the diode is connected to a secondary side of an ignition coil installed in an internal-combustion engine, and is a constant voltage diode which functions so as to prevent applying a discharge voltage exceeding the Zener voltage to a spark plug, and the discharge voltage applied to the spark plug is 32 to 38 kV in a range of operating temperature between −30° C. and 120° C. 2. The diode according to claim 1 , wherein the at least one diode element has a thin-film shape, and the at least one diode element is laminated on the insulated substrate. 3. The diode according to claim 1 , wherein the at least one diode element is arranged so as to be meandering, the at least one diode element being in a state where the P-type regions and the N-type regions are in a line by forming PN junctions in series. 4. The diode according to claim 1 , wherein the at least one diode element is formed so that the P-type regions and the N-type regions are arranged in a predetermined direction and in a line, and the at least one diode element comprises a plurality of diode elements which are electrically connected in series by wire bonding, and are arranged so that the P-type regions and the N-type regions are meandering. 5. The diode according to claim 1 , wherein the at least one diode element is arranged so that the P-type regions and the N-type regions are arranged in a straight line on the insulated substrate. 6. The diode according to claim 1 , wherein the at least one diode element comprises a plurality of diode elements, and the diode further comprising: a lead frame in which the diode elements are mounted via the insulated substrate; a positive terminal which is electrically connected to one end of a first diode element of the diode elements; and a negative terminal which is electrically connected to one end of a second diode element of the diode elements, wherein the other end of the first diode element and the other end of the second diode element are connected via the lead frame. 7. The diode according to claim 1 , wherein when a Zener voltage temperature coefficient is expressed as K in an equation: Vz=V0×(1+K×T), where Vz is a Zener voltage of the at least one diode element, T is a temperature of the at least one diode element, and V 0 is the Zener voltage Vz obtained when the temperature is 0° C., the Zener voltage temperature coefficient K is 700 ppm/° C. or less.
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